DLA SMD-5962-86862 REV B-1989 MICROCIRCUITS DIGITAL FAST CMOS UNIVERSAL SHIFT REGISTER MONOLITHIC SILICON《硅单块 万能移位寄存器 快速互补金属氧化物半导体 数字微型电路》.pdf

1、z DESC-DWG-bb2 REV B 57 7779775 0037275 E REVISIONS - LTR A - - B - DESCRIPTION Electrical changes, VOH, Ioz, and Icc to table I. Changes to note 4 of table I. Changes to case out1 ine dimensions specifying decimal fractional values. Add case outline S for vendor CAGE number 61772. Editorial chanqes

2、 throuqhout. Add device type O2 for case outlines R, S, and 2. Add vendor CAGE 61772 to device type 02, case outlines R, S, and 2. Changes to table I for device type 02. Editorial changes throughout. Changes to figures 2 and 3. DATE (YR-MO-DA) 1988 JUL 28 1989 NOL! 28 APPROVED AMSC NIA I I SHEEI 1 O

3、F 17 DESC FORM 193 SEP 87 DISTRIBUTION STATEMENT A. Approved lor publla release; distribution Is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-7- R I 7- I I I -I- I I I Lead finish per I I Case outline I I 6962-85862 , 1 l I brawing numb

4、er bsvice type (1.2.1) (1.2.2) MIL-M-38510 4 I J.2,l Device typec, The device types shall fdentify the circuit function as follows: Device type Generic number Circuit function O1 MFCT299 8-input universal shift register, TTL cmpatibl 02 54FCT299A 8-fnput universal shift register, TTL csmpatibl with

5、three-state outputs wl th three-state outputs i, SCOPE 1.1 Sco e, This drawing describes device requirements for class B microcircuits fn accordance with l, VIN = 3.4 V; all other inputs at Vcc or GND. !/ This parameter is not directly testable, but is derived for use in total power supply calculati

6、ons. i/ Ic = ICCQ + (AICC X D X N IC D(fP/2 fI X NI) w ere DH = Duty cycle for TfL inputs high NT = Number of TTL inputs at DH fI = Input frequency in MHt Number of inputs at fI i/ The mi!jkn limits for the propagation delay times, are guaranteed if not tested, to the limits specified in table I. 4.

7、3 Quality conformance ins ection. Quality conformance inspection shall be in accordance with nethod 500s Of MIL - S1D Y i ncyudlng groups A, B, C, and D inspections. The following additional :ri teria shall apply. 4.3.1 Group A inspection. a: Tests shall be as specified in table II herein. b. Subgro

8、ups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CIN and COUT measurements) shall be measured only for the initial test and afer process or design changes which may affect capacitance. Test all applicable pins on five devices with zero failures. d. Subgroups 7 and

9、8 tests shall verify the truth table. As specified on figure 2 herein. -. DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET I DAYK)N, OHIO 45444 B 7 IESC FORM 193A U.S. QOVERNMEM PRINTINQ OFFICE 1888-550-547 SEP a7 l i Provided by IHSNot for ResaleNo reproduction or networking permitted without

10、 license from IHS-,-,-DESC-DWG-%b62 REV B 59 1 9499995 0017282 5-1 SIZE A STANDARDIZED - Caces R and S 5962-86862 Case 2 MILITARY DRAWING DEFE.NsL1 ELECTRONICS CUPPLY CENTER cMyTON,oHK)(15444 TOP VIEW _I REVISION LEVEL SHEET 8 B TOP VIEW FIGURE 1. Terminal connections, - Provided by IHSNot for Resal

11、eNo reproduction or networking permitted without license from IHS-,-,-9 DESC-DWG-bb2 REV B 57 m 7777775 0017283 7 m I t O 1 m B 7 - (u STANDARDIZED MILITARY DRAWING I 5962-86862 DEFENSE ELECTRONICS SUPPLY CENTER REVISON LEVEL SHEET g I DAYTON, OHIO 45444 B DESC FORM 193A fi U S. GOVERNMENT PRHWG OWk

12、X 1987-Ypo96 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-h . . ._ .- . . FIGURE 3, Truth table. -. SUE A 5962-86062 STAN DARDIZ E MILITARY DRAWING L. _. I REVISION LEVEL i“, WO 45444 B REFEtHICSSUYCENTE n- . . . . . _CI. . .- . .- DESC FOR

13、M 193A t U. 8. OOVEWMEHT PRINTIM WE: 1W48Q-547 SEP 87 I I Inputs ! Response 1 t I I I I I -I I I I IL IH IH I X IX IX I I IL IX IL I X IL !L 1 Asychronous reset; Il IL IX I X IL IL I 90 - Q7 es LOW II I I- I I I I fX I Parallel load; I/Q - Qn - 4n l fl IH IH IL i /- IL IL I Shift left; DS7 - Q7, Q7

14、- 96, ect I I i Shift right; DSQ - 00, Qo - 91, eci I II I I- I I I l u I ,i- I I I -. I H a High voltage level. L low voltage level X a Dont care. Z8 Low to hight transiton. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9 DESC-DWG-BbBb2 REV B 59 9

15、797775 0017285 O M SAME PHASE I NPUT TRANSITION OUTPUT OPPOSITE PHASE INPUT TRANSITION FIGURE 4. Switching waveforms and test circuits. .I SIZE 5962-86862 A STANDARDIZED REVISION LEVEL SHEET 11 MILITARY DRAWING B DEFENSE ELECTRONICS SUPPLY CENTER DAYlN, OHIO 45444 )ESC FORM 193A ri U. S. QOVERNMWT P

16、RINTiNQ OFFNE: IBB8-549-9w SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I- * I ENABLE 7 3Y PISABLE 7 CQNTROL - f NQTEG 1, Riagram shwon for Input control enable-low and Input control disable-hlgh, Z1 Input: tr tf = 2.5 ns (10% to -90%) unle

17、ss otherwise spec.IMed, F1GURE 4. Switchjng Haveforais and &st clccuits - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-R DESC-DWG-BbBb2 REV B 57 W 7777775 0017287 SIZE A STANDARDIZED I . 5962-86862 3v 1.5 V DATA INPU ov TIMING INPUT 1.5

18、 V m 3v 1.5 V ov DATA IN PUT Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-x LOW HIGH- LOW PULSE L LB Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-e DESC-DWG-bb2 REV B 57 7979775 OOL727 8.- “c c

19、? Swi tch posi ti on - 1 Test I Switch I I I I I tpLZ I Closed I I I - tpZL I Closed I I I I All other I Open 1 I I I Defini tions: RL = Load resistor. CL = Load capacitance includes jig and probe capacitance. RT = Termination resistance = 50n. FIGURE 4. Switching waveforms and test circuits - Conti

20、nued. SIZE 5962-86862 A STANDARDIZED MILITARY DRAWING REVISION LEVEL SHEET DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 B 15 vi U. 5. QOVERNMEW PRIMINQ OFFCE 1BBB-J50-547 IESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

21、_ - - - DESC-DWG-bb2 REV B 59 99q7995 0037290 4 U P . M 4,3,2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b, Steady-state life test conditions, method 1005 of MIL-STD-883. (11 Test condition A, 6, C, or D using the circuit submitted with t

22、he certificate of compliance (see 3.6 herein). (2) TA i: +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of ML-STD-883. TABLE II. Electrical test requirements. 1 i Subgroups I I MIL-STD-883 test requirmnts I (per method I 1 I 5005. table I) I I I I I i I (method 50

23、04) I I IFinal electrical test parameters Il*, 2, 3, 7, I I (method 5004) I 8, 9, 10, 11 1 I I (method 50051 I 8, 9, 10, 11 I interim electrical parameters i - IGroup A test requirements IGroups C and D end-point I 1, 2, 3 I I electrical parameters I I I (method 5005) I I I 1, 2, 3, 4, 7, I * PDA ap

24、plies to subgroup 1. 5. PACKAGING I 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-3B510, I 1 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military device

25、s that will perform the required function are not avafable for OE# application. When a military speciffcation exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be Inactivated and will not be used for new design. The QPL-38510

26、 product shall be the preferred item for al 1 appl lcations. 6.2 Re laceabilit Microcircuits covered by this drawing will replace the same generic device covered y a contractor-prepared specification or drawing. 6,3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordin

27、ated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-481 using DD Form 1693, Engineering Change Proposal (Short Form). I .- SIZE A 5962-86862 STANDARDIZED MILITARY DRAWING RMtsIoNLEvEL 8HEEt DEFENS ELEcTRop#cs SUPPLY CENTER tMy

28、tON,oNK) 45444 8 16 y UESC FORM 193A rtu8ERNLIuRoFfmwd-wo617 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply :enter when a system application requires

29、configuration control and the applicable SMD. DESC will iaintain a record of users and this list will be used for coordination and distribution of chanses SIZE A STANDARDIZED .o the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact- IESC-ECS, telephone (513) 296

30、-6022. 5962-86862 6.5 Comnents. Comnents on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or ,el ep hoiiXGZ96-5375. 6.6 Approved source of supply. An approved source of supply is listed in MIL-BUL-103. rdditional sources will be added to MIL-BUL-103 as they become available. The v

31、endor listed in IIL-BUL-103 has agreed to this drawing and a certificate of compliance (see 3.6 herein) has been ,ubmitted to and accepted by DESC-ECS. The approved sources of supply listed below is for nfotmation purposes only and is current only to the date of the last action of this document. I I

32、 Vendor I Vendor I l l I I l I 5962-86862018 I 61772 I lDT54FCT299EB I I I I I 1 5962-86862012X I 61772 I lDT54FCT299LB 1 I I I I I 5962-8686202RX I 61772 I lDT54FCT299ADB I I I I I I I I 5962-8686202SX I 61772 I lDT54FCT299AE8 I I I I I 1 5962-86862022X I 61772 I lDT54FCT299ALB I I I I I - i/ Cauti

33、on. Do not use this number for item I Military drawing I CAGE I similar part I I part number I number I number L/ I I I I I 5962-8686201RX I 61772 I lDT54FCT299DB I I I I c acquisTtion. may not sati sfy the perf ormance requirements of this drawing. Items acquired to this number Vendor CAGE Vendor n

34、ame number and address 61772 Integrated Device Technology 1566 Moffett Boulevard Salinas CA 93905 Point of contact: 3236 Scott Boulevard Santa Clara, CA 95054 I DE.% FORM 193A SEP 87 ri U?. QOVERHMEM PRINTINGOFFlCEigBB-5-547 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-