DLA SMD-5962-86889 REV C-2002 MICROCIRCUIT LINEAR QUAD LINE DRIVER MONOLITHIC SILICON《硅单块 四列行驱动线 直线式微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 34333. Editorial changes throughout. 87-11-25 M. A. FRYE B Add a F-2 package. Make changes to 1.2.2, figure 1, and editorial changes throughout. Remove vendor CAGE 34333. 90-05-25 M. A. FRYE C Drawing updated to reflect current re

2、quirements. - ro 02-06-27 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY DONALD R. OSBORNE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING

3、 CHECKED BY D. A. DiCENZO COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, QUAD LINE DRIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-07-31 AMSC N/A REVISION LEV

4、EL C SIZE A CAGE CODE 67268 5962-86889 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E425-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

5、E A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part

6、or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86889 01 C X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number

7、Circuit function 01 1488, 55188 Quad line driver 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Sq

8、uare leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) . +15 V Supply voltage (VEE) -15 V Input voltage range . -15 V to +7.0 V Power dissipation (PD) . 1000 mW 1/ 2/ Junction temperature (TJ) +15

9、0C Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) . +7.5 V to +15.0 V 3/ Supply voltage range (VEE) -7.5 V to -15.0 V 3/ Minimum high le

10、vel output voltage (VIH) 1.9 V Maximum low level output voltage (VIL) . 0.8 V Ambient operating temperature range (TA) -55C to +125C _ 1/ Must withstand the added PDdue to short circuit test; e.g., IOS. 2/ Derate linearly above TA= +25C at the rate of 6.7 mW/C for cases C and 2 and 8.0 mW/C for case

11、 D. 3/ Derate supply voltage linearly from 15 V at 30C to 9 V at +125C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 3

12、DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the is

13、sue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Met

14、hod Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards,

15、 and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. N

16、othing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

17、 herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved prog

18、ram plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affe

19、ct the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, ap

20、pendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Schematic diagram. The schematic d

21、iagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduct

22、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C VC

23、C= +9 V, VEE= -9 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Output high voltage VOHVCC= 9 V, VEE= -9 V, VIL= 0.8 V, RL= 3 k 1,2,3 All 6 V VCC= 13.2 V, VEE= -13.2 V, VIL= 0.8 V, RL= 3 k 9 Output low voltage VOLVCC= 9 V, VEE= -9 V, VIH= 1.9 V, RL= 3 k 1,2,3 All -6 V

24、 VCC= 13.2 V, VEE= -13.2 V, VIH= 1.9 V, RL= 3 k -9 Input high current IIHVI= 5 V 1,2,3 All 10 A Input low current IILVI= 0 V 1,2,3 All -1.6 mA Output short circuit 2/ current high level IOS(H)VI= 0.8 V, VO= 0 V 1,2,3 All -4.6 -13.5 mA Output short circuit 2/ current low level IOS(L)VI= 1.9 V, VO= 0

25、V 1,2,3 All 4.6 13.5 mA Output resistance, power off ROVCC= 0 V, VEE= 0 V, -2 V VO +2 V 1,2,3 All 300 Supply current from VCCICCAll VI= 1.9 V, VCC= 9 V, outputs open 1,2,3 All 20 mA All VI= 0.8 V, VCC= 9 V, outputs open 6 All VI= 1.9 V, VCC= 12 V, outputs open 25 All VI= 0.8 V, VCC= 12 V, outputs op

26、en 7 All VI= 1.9 V, TA= +25C, VCC= 15 V, outputs open 1 34 All VI= 0.8 V, TA= +25C, VCC= 15 V, outputs open 12 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPP

27、LY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C VCC= +9 V, VEE= -9 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Supply curr

28、ent from VEEIEEAll VI= 1.9 V, VEE= -9 V, outputs open 1,2,3 All -17 mA All VI= 0.8 V, VEE= -9 V, outputs open -0.5 All VI= 1.9 V, outputs open, VEE= -12 V -23 All VI= 0.8 V, outputs open, VEE= -12 V -0.5 All VI= 1.9 V, outputs open, VEE= -15 V, TA= +25C 1 -34 All VI= 0.8 V, outputs open, VEE= -15 V,

29、 TA= +25C -2.5 Propagation delay input to output tPLHSee figures 4 and 5, 9 All 350 ns RL= 3.0 k, CL= 15 pF 10,11 525 tPHLSee figures 4 and 5, 9 175 RL= 3.0 k, CL= 15 pF 10,11 262 Transition time tTLHSee figures 4 and 5, 9 All 100 ns RL= 3.0 k, CL= 15 pF 10,11 150 tTHLSee figures 4 and 5, 9 75 RL= 3

30、.0 k, CL= 15 pF 10,11 112 1/ All voltage values are with respect to network ground terminal. 2/ Test each pin one at a time. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBU

31、S COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines C and D 2 Terminal number Terminal symbol 1 VEENC 2 1A VEE3 1Y 1A 4 2A 1Y 5 2B NC 6 2Y 2A 7 GND NC 8 3Y 2B 9 3A 2Y 10 3B GND 11 4Y NC 12 4A 3Y 13 4B 3A 14 VCC3B 15 - NC 16 - 4Y 17 - NC 18 - 4A 19

32、- 4B 20 - VCCNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 7 DSCC FOR

33、M 2234 APR 97 Inputs Output A B Y H H LL X H X L HNOTES: X = Dont care L = Low level H = High Level FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS

34、COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 ( 1 / 4 of circuit shown ) FIGURE 3. Schematic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COL

35、UMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. The pulse generator has the following characteristics: tW= 0.5 s, PRR = 1 MHZ, ZO= 50 . 2. CLincludes probe and jig capacitance. 3. AC switching characteristics are measured using single pulse techniques ( PRR =

36、 0 ). FIGURE 4. Test load circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 FIGURE 4. Volt

37、age waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 11 DSCC FORM 2234 APR 97 3.4 Electrical test requirements.

38、The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the man

39、ufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance

40、indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A

41、 certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product mee

42、ts the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of

43、change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available on

44、shore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all d

45、evices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to

46、the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shal

47、l be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and

48、 D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86889 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 12 DSCC FORM 2234 APR 97 TABLE II.