DLA SMD-5962-87503 REV F-2013 MICROCIRCUIT DIGITAL ECL QUAD OR NOR GATE MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add VCCto 1.4. Add 3/ to Table I. Add figure 4. Change 4/ in Table I. Change terminal connections. Add subgroup 8 to Table II. Change VSPN for case 2. Change IIL. Editorial changes throughout. mlp 89-02-23 Michael A. Frye B Changes to Table I and

2、 Table II and other changes per NOR 5962-R028-92. tvn 91-11-27 Monica L. Poelking C Add case outline F-5A. Change document to current electronic format. Editorial changes throughout. les 98-02-04 Raymond Monnin D Figure 4 modified to be consistent with Table I ljs 98-08-11 Raymond Monnin E Update to

3、 current requirements. Editorial changes throughout. gap 06-03-03 Raymond Monnin F Update drawing to current MIL-PRF-38535 requirements. - jt 13-06-24 C. SAFFLE The original first page of this drawing has been replaced. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F F F OF SHEETS SHEET 1 2

4、 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L Poelking DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Raymond Monnin A

5、PPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, QUAD OR/NOR GATE, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-11-24 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-87503 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E371-13 Provided by IHSNot for ResaleNo reproduction or networking permitted

6、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits i

7、n accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87503 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device types. The device types identify the circui

8、t function as follows: Device type Generic number Circuit function 01 10H501 Quad OR/NOR gate 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or

9、 CDFP3-F16 16 Flat package X CDFP4-F16 16 Flat package 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) . -8.0 V dc to 0.0 V dc Input voltage range . -5.2 V dc to 0.0 V dc Stor

10、age temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 218 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum

11、to -4.94 V dc maximum Supply voltage range (VCC . -0.02 V dc to 0.02 V dc or 1.98 V dc to 2.02 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) -1.950 V

12、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, stan

13、dards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integ

14、rated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL

15、-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the te

16、xt of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be

17、 in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to

18、MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modific

19、ations shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensio

20、ns. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth ta

21、bles. The truth tables shall be as specified on figure 2. 3.2.4 Logic diagrams. The logic diagrams shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless

22、 otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

23、A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. M

24、arking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the

25、option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordanc

26、e with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA L

27、and and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A sha

28、ll be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and t

29、he acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accord

30、ance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test co

31、ndition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in

32、accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provide

33、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Condi

34、tions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, 2 and X Quiescent tests 1/ VIHVILHigh level output voltage VOHOutputs terminated through 100 to -2 V -0.780 -1.950 1 -1.010 -0.780 V -0.650 -1.950 2 -0.860 -0.650 -0.840 -1.950 3 -1.060 -0.840 Low level

35、output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.780 -1.950 1 -1.950 -1.580 V -0.650 -1.950 2 -1.950 -1.565 -0.840 -1.950 3 -1.950 -1.610 High level threshold output voltage VOHA-1.110 -1.480 1 -1.010 -0.780 V -0.960 -1.465 2 -0.860 -0.650 -1.160 -1.510 3 -1.060 -0.840 Low level threshold output volt

36、age VOLA-1.110 -1.480 1 -1.950 -1.580 V -0.960 -1.465 2 -1.950 -1.565 -1.160 -1.510 3 -1.950 -1.610 Power supply drain current 3/ IEEVEE= -5.46 V, VCC= 0.0 V, 1 -26 mA 2, 3 -29 High level input current IIHVIH= -0.780 V at +25C -0.650 V at +125C A,B,C,D 1 265 A 2, 3 425 -0.840 V at -55C Strobe 1 535

37、A 2, 3 850 Low level input current IILVEE= -4.94 V, 3/ VIL= -1.950 V, VCC= 0.0 V 1, 3 0.5 A 2 0.3 Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

38、A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F and X Rapid tests

39、4/ VIHVILHigh level output voltage VOHOutputs terminated through 100 to -2 V -0.790 -1.950 1 -1.019 -0.790 V -0.661 -1.950 2 -0.870 -0.661 -0.851 -1.950 3 -1.070 -0.851 Low level output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.790 -1.950 1 -1.950 -1.583 V -0.661 -1.950 2 -1.950 -1.568 -0.851 -1.950

40、3 -1.950 -1.613 High level threshold output voltage VOHA-1.119 -1.483 1 -1.019 -0.790 V -0.970 -1.468 2 -0.870 -0.661 -1.170 -1.513 3 -1.070 -0.851 Low level threshold output voltage VOLA-1.119 -1.483 1 -1.950 -1.583 V -0.970 -1.468 2 -1.950 -1.568 -1.170 -1.513 3 -1.950 -1.613 Power supply drain cu

41、rrent 3/ IEEVEE= -5.46 V, VCC= 0.0 V, 1 -25 mA 2, 3 -28 High level input current IIHVIH= -0.790 V at +25C -0.661 V at +125C A,B,C,D 1 250 A 2, 3 410 -0.851 V at -55C Strobe 1 520 A 2, 3 835 Low level input current IILVEE= -4.94 V, 3/ VIL= -1.950 V, VCC= 0.0 V 1, 3 0.5 A 2 0.3 Functional tests See 4.

42、3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Elec

43、trical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Case 2 Rapid tests 4/ VIHVILHigh level output voltage VOHOutputs terminated through 100 to -2 V -0.796 -1.950 1 -1.025 -0.796 V -0.668 -1.950 2 -0.876

44、 -0.668 -0.858 -1.950 3 -1.076 -0.858 Low level output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.796 -1.950 1 -1.950 -1.585 V -0.668 -1.950 2 -1.950 -1.570 -0.858 -1.950 3 -1.950 -1.615 High level threshold output voltage VOHA-1.125 -1.485 1 -1.025 -0.796 V -0.976 -1.470 2 -0.876 -0.668 -1.176 -1.515

45、 3 -1.076 -0.858 Low level threshold output voltage VOLA-1.125 -1.485 1 -1.950 -1.585 V -0.976 -1.470 2 -1.950 -1.570 -1.176 -1.515 3 -1.950 -1.615 Power supply drain current 3/ IEEVEE= -5.46 V, VCC= 0.0 V, 1 -25 mA 2, 3 -28 High level input current IIHVIH= -0.796 V at +25C -0.668 V at +125C A,B,C,D

46、 1 250 A 2, 3 410 -0.858 V at -55C Strobe 1 520 A 2, 3 835 Low level input current IILVEE= -4.94 V, 3/ VIL= -1.950 V, VCC= 0.0 V 1, 3 0.5 A 2 0.3 Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

47、from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups L

48、imits Unit Min Max Cases E, F, 2 and X AC tests Transition time tTLH, tTHLVEE= -2.94 V VCC= 2.0 V CL 5 pF 9 0.40 1.65 ns 10 0.40 1.70 11 0.40 1.65 Propagation delay time, A, B, C, D input to output tPLH1, tPHL1, tPLL1, tPHH1Load all outputs through 100 to ground See figure 4 9 0.30 1.50 ns 10 0.30 1.70 11 0.30 1.50 Propagation delay time, STROBE to any output tPLH2, tPHL2, tPLL2, tPHH29 0.50 1.60 ns 10 0.50 1.