DLA SMD-5962-87511 REV B-2007 MICROCIRCUIT DIGITAL ECL SHIFT REGISTER MONOLITHIC SILICON《硅单块 移位寄存器发射极耦合逻辑数字微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R105-93. 93-03-29 Monica L. Poelking B Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - gap 07-05-10 Robert M. Heber The original first sheet of this drawing has bee

2、n replaced. REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWI

3、NG IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, SHIFT REGISTER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-02-04 MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-87511 SHEET 1 OF 13 DSCC FORM 2233 APR

4、97 5962-E221-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing d

5、escribes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87511 01 E X Drawing number Device type (see 1.2.1) Case outline

6、(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H541 4-bit universal shift register 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outli

7、ne letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply vo

8、ltage range -8.0 V dc to 0.0 V dc Input voltage range . 0.0 V dc to -5.2 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 642 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4

9、Recommended operating conditions. Supply voltage (VEE) -5.46 V dc minimum to -4.94 V dc maximum Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.650 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -

10、1.950 V dc Minimum data setup time (ts) 1.50 ns Minimum select setup time (ts) 3.00 ns Minimum data hold time (th) 1.00 ns Minimum select hold time (th) 1.00 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962

11、-87511 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified her

12、ein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microc

13、ircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearc

14、h/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precede

15、nce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spe

16、cified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approve

17、d program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall no

18、t affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-385

19、35, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic dia

20、gram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified i

21、n table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction

22、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be m

23、arked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance m

24、ark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificat

25、e of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufac

26、turers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change

27、. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be mad

28、e available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all dev

29、ices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to th

30、e preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as

31、 specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPP

32、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent tests 1/ VIHVIL-0.780 -1.950

33、1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level th

34、reshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V, VEE= -5.2 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -102 Power supply drain current IEE4/ 2

35、, 3 -112 mA 1 255 IIH1Clock input 2, 3 405 A 1 260 IIH2Select inputs 2, 3 415 A 1 320 High level input current IIH3VEE= -5.46 V, VCC= 0.0 V, VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -55C Data inputs 2, 3 510 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0

36、.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Elect

37、rical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E and F Rapid tests 3/ VIHVIL-0.807 -1.950 1 -1.035 -0.807 -0.679 -1.950 2 -0.887 -0.679 High level output voltage VOH-0.869 -1.950 3 -1.087 -0.8

38、69 V -0.807 -1.950 1 -1.950 -1.588 -0.679 -1.950 2 -1.950 -1.574 Low level output voltage VOL-0.869 -1.950 3 -1.950 -1.619 V -1.135 -1.488 1 -1.035 -0.807 -0.987 -1.474 2 -0.887 -0.679 High level threshold output voltage VOHA-1.187 -1.519 3 -1.087 -0.869 V -1.135 -1.488 1 -1.950 -1.588 -0.987 -1.474

39、 2 -1.950 -1.574 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V, VEE= -5.2 V 2/ -1.187 -1.519 3 -1.950 -1.619 V 1 -101 Power supply drain current IEE 4/ 2, 3 -111 mA 1 240 IIH1Clock input 2, 3 390 A 1 245 IIH2Select inputs 2, 3 400 A 1 305 High level inpu

40、t current IIH3VEE= -5.46 V, VCC= 0.0 V, VIH= -0.798 V at +25C -0.670 V at +125C -0.860 V at -55C Data inputs 2, 3 495 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950, VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitte

41、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless other

42、wise specified Group A subgroups Min Max Unit Case 2 Rapid tests 3/ VIHVIL-0.809 -1.950 1 -1.037 -0.809 -0.682 -1.950 2 -0.889 -0.682 High level output voltage VOH-0.872 -1.950 3 -1.089 -0.872 V -0.809 -1.950 1 -1.950 -1.589 -0.682 -1.950 2 -1.950 -1.575 Low level output voltage VOL-0.872 -1.950 3 -

43、1.950 -1.620 V -1.137 -1.489 1 -1.037 -0.809 -0.989 -1.475 2 -0.889 -0.682 High level threshold output voltage VOHA-1.189 -1.520 3 -1.089 -0.872 V -1.137 -1.489 1 -1.950 -1.589 -0.989 -1.475 2 -1.950 -1.575 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V, VCC= 0.0 V,

44、VEE= -5.2 V 2/ -1.189 -1.520 3 -1.950 -1.620 V 1 -101 Power supply drain current IEE4/ 2, 3 -111 mA 1 240 IIH1Clock input 2, 3 390 A 1 245 IIH2Select inputs 2, 3 400 A 1 305 High level input current IIH3VEE= -5.46 V, VCC= 0.0 V, VIH= -0.807 V at +25C -0.679 V at +125C -0.869 V at -55C Data inputs 2,

45、 3 495 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87511 DEFENSE SUPPLY CENTER COLUMBUS

46、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 AC tests 9 0.70 2.00 10 0.70 2.20 Transition

47、time tTLH, tTHL11 0.70 1.70 ns 9 1.00 1.90 10 1.10 2.10 Propagation delay time, all inputs to all outputs tPHH11 1.00 2.00 ns 9 1.00 1.90 10 1.10 2.10 tPHLVEE= -2.94 V, VCC= 2.0 V, CL 5 pF, RL= 100 See figure 4 11 1.00 1.90 ns 1/ The quiescent limits are determined after a device has reached thermal

48、 equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level output current varies with