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本文(DLA SMD-5962-87534 REV D-2011 MICROCIRCUITS DIGITAL BIPOLAR QUAD BUS TRANSCEIVER MONOLITHIC SILICON.pdf)为本站会员(terrorscript155)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-87534 REV D-2011 MICROCIRCUITS DIGITAL BIPOLAR QUAD BUS TRANSCEIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Corrections to figure 1. 87-05-28 N. A. Hauck B Pages 10 and 11; correct tpdsymbols. Change drawing CAGE code to 67268. Editorial changes throughout. 87-10-19 R. P. Evans C Update to reflect latest changes in format and requirements. Editorial ch

2、anges throughout. -les 05-02-17 Raymond Monnin D Update drawing as part of 5 year review. - jt 11-08-25 C. SAFFLE THE ORGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Monica Gro

3、sel DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, BIPOLAR, QUAD BUS

4、 TRANSCEIVER,MONOLITHIC SILICON DRAWING APPROVAL DATE 87-03-31 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-87534 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E233-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

5、SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Ide

6、ntifying Number (PIN). The complete PIN is as shown in the following example: 5962-87534 01 E X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit fu

7、nction 01 26S12 Quad bus transceiver 02 26S12A Quad bus transceiver 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 2 CQCC1

8、-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc to +7.0 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD)

9、 1/ 700 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) +150C DC input current -30 mA to +5.0 mA DC output current into output receiver . +30 mA DC output current into bus 200 mA _ 1/ Maximum power dissipation is

10、defined as VCCx ICC, and must withstand the added PDdue to short-circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D

11、 SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage (VCC) . +4.5 V dc to 5.5 V dc Driver characteristics: High level input voltage (VIH) 2.0 V dc minimum Low level input voltage (VIL) 0.8 V dc maximum Receiver characteristics: Device type 01 High level input voltage (

12、VIH) 1.8 V dc minimum Low level input voltage (VIL) 1.6 V dc maximum Device type 02 High level input voltage (VIH) 2.05 V dc minimum Low level input voltage (VIL) 1.4 V dc maximum Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards,

13、and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated C

14、ircuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-7

15、80 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between

16、the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements sh

17、all be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certificati

18、on to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These m

19、odifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduct

20、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions

21、 shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure

22、2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching circuits and waveforms. The switching circuits and waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance chara

23、cteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Mar

24、king shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the op

25、tion of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance

26、with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Lan

27、d and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall

28、 be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the

29、 acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

30、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min

31、Max Power supply current ICCVCC= 5.5 V 1, 2, 3 All 70 mA Bus leakage current IBUSVCC= 5.5 V or 0 V 1, 2, 3 All 100 A DRIVER CHARACTERISTICS Low level output voltage VOLVCC= 4.5 V IOL= 60 mA, VIN= 2.0 V 1, 2, 3 All 0.7 V 1/ IOL= 100 mA, VIN= 2.2 V 0.85 High level input voltage VIH2/ 1, 2, 3 All 2.0 V

32、 Low level input voltage VIL2/ 1, 2, 3 All 0.8 V Input clamp voltage VI CVCC= 4.5 V, IIN= -18 mA 1, 2, 3 All -1.2 V High level input current IIH1VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 1.0 mA IIH2VCC= 5.5 V, VIN= 2.4 V 40 A Low level input current IILVCC= 5.5 V, VIN= 0.4 V 1, 2, 3 All -1.6 mA See footnot

33、es at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact

34、eristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max RECEIVER CHARACTERISTICS High level output voltage VOHVCC= 4.5 V, VIN= VIL, IOH= -800 A (receiver) 1, 2, 3 All 2.4 V Low level output voltage VOLVCC= 4.5 V, VIN= VIH, IOL= 20 m

35、A (receiver) 1, 2, 3 All 0.5 V High level input voltage VIHE = 0.0 V 1, 2, 3 01 1.8 2.2 V Ii= 0.0 mA 02 2.05 2.45 V Low level input voltage VIL01 1.2 1.6 V 02 1.0 1.4 V Input threshold margin VTMAll 0.4 V Short circuit output current IOSVCC= 5.5 V, VOUT= 0.0 V 3/ 1, 2, 3 All -20 -55 mA Turn off dela

36、y input to bus tPLH1 RL= 100 , CL= 15 pF, See figure 4 4/ 9 All 11 ns 5/ 9, 10, 11 20 Turn on delay input tPHL1RL= 500 , CL= 300 pF, See figure 4 4/ 9 21 to bus 5/ 9, 10, 11 32 Turn off delay enable tPLH2RL= 50 , CL= 15 pF, See figure 4 4/ 9 01 17 ns to bus 02 15 5/ 9, 10, 11 01 28 02 25 Turn on del

37、ay enable tPHL24/ 9 All 15 to bus 5/ 9, 10, 11 25 Turn off delay bus tPLH3CL= 15 pF, See figure 4 4/ 9 All 26 ns to output 5/ 9, 10, 11 30 Turn on delay bus tPHL34/ 9 26 to output 5/ 9, 10, 11 30 1/ For case F, the output current must be limited to 60 mA or the maximum ambient temperature limited to

38、 +125C for correct operation. 2/ Input thresholds are tested during dc tests and may be done in combination with testing of other dc parameters. 3/ Not more than one output should be shorted at a time and the duration of the short circuit condition should not exceed one second. 4/ VCC= 5.0 V dc. 5/

39、VCC= 4.5 V to 5.5 V dc. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and

40、F 2 Terminal number Terminal symbol Terminal symbol 1 B 0 NC 2 I0B 0 3 Z0I04 B 1 Z05 I1B 1 6 Z1NC 7 E I18 GND Z19 E E 10 Z2GND 11 I2NC 12 B 2 E 13 Z3Z214 I3I215 B 3 B 2 16 VCCNC 17 - - - Z318 - - - I319 - - - B 3 20 - - - VCCFIGURE 1. Terminal connections. Inputs Outputs E I B Z L L H L L H L H H X

41、Y Y H = HIGH voltage level L = LOW voltage level X = Dont care Y = Voltage level of bus FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-

42、3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagrams. FIGURE 4. Switch circuits and waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHI

43、O 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 FIGURE 4. Switch circuits and waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87534 DLA LAND AND MARITIME COLUMBUS, OHIO 4321

44、8-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all

45、 devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available t

46、o the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall b

47、e as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical

48、parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 * Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance wit

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