DLA SMD-5962-87543 REV C-2009 MICROCIRCUIT DIGITAL BIPOLAR NINE-INPUT PARITY CHECKER GENERATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Page 10, figure 4 dimension tfand trare measured from 10% point Drawing code ident. number changed to 67268. Page 2, correct generic part number. Editorial changes throughout. 87-10-6 R. P. Evans B Update to reflect latest changes in format and r

2、equirements. Editorial changes throughout. -les 01-10-04 Raymond Monnin C Update drawing to current requirements. Editorial changes throughout. - gap 09-01-28 Robert M. Heber CURRENT CAGE CODE IS 67268 The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C

3、 C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Monica Grosel DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Ha

4、uck MICROCIRCUIT, DIGITAL, BIPOLAR, NINE-INPUT PARITY CHECKER/GENERATOR, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-04-01 MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 14933 5962-87543 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E365-08 Provided by IHSNot for Res

5、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-8

6、83 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87543 01 C X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 De

7、vice type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 82S62 Nine-input parity checker/generator 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Termi

8、nals Package style C GDIP1-T14 or GDIP2-T14 14 Dual-in-line package D GDFP1-F14 or GDFP2-F14 14 Flat package 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc to +

9、7.0 V dc Storage temperature range . -65C to +150C Maximum power dissipation (PD) 1/ . 918.5 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) +175C DC input current -30 mA to +5.0 mA DC output current, into output

10、. +30 mA 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5 V dc to 5.5 V dc maximum Minimum high level input voltage (VIH) 2.0 V Maximum low level input voltage (VIL) . 0.8 V Ambient operating temperature range (TA) . -55C to +125C _ 1/ Must withstand the added PDdue to short c

11、ircuit test (e.g. IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.

12、1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPE

13、CIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Sta

14、ndard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedenc

15、e. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirement

16、s. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has

17、 been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modificatio

18、ns to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2

19、 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall

20、 be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 El

21、ectrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups

22、 specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION

23、 LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasibl

24、e due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replace

25、d with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 here

26、in). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as requir

27、ed in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring acti

28、vity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF

29、-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C or D. T

30、he test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the inte

31、nt specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo

32、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+1

33、25C Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage VOHVCC= +4.5 V, IOH= -1 mA, VIN= 0.8 V or 2.0 V 1, 2, 3 2.5 V Low level output voltage VOLVCC= +4.5 V, IOL= 20 mA, VIN= 0.8 V or 2.0 V 1, 2, 3 0.50 V Input clamp voltage VI CVCC= +4.5 V, IIH= -18 mA 1, 2,

34、3 -1.2 V High level input current II H1 VCC= +5.5 V, VIN= 4.5 V 1, 2, 3 10 A II H2 VCC= +5.5 V, VIN= 5.5 V 1, 2, 3 1.0 mA Low level input current IILVCC= +5.5 V, VIN= 0.5 V P9input 1, 2, 3 -0.4 mA All other inputs 1, 2, 3 -0.8 mA Output short circuit current IOSVCC= +5.5 V, VOUT= 0 V 1/ 1, 2, 3 -40

35、-100 mA Supply current ICC VCC= +5.5 V, Both outputs open, All inputs = GND, Inhibit = 4.5 V 1, 2, 3 67 mA Functional tests See 4.3.1c 7, 8 tPLH1 2/ 9 23 ns 3/ 9, 10, 11 28 ns tPHL1 2/ 9 23 ns Propagation delay time, from P1thru P8to even output CL= 15 pF RL= 280 (See figure 4) 3/ 9, 10, 11 28 ns tP

36、LH2 2/ 9 28 ns 3/ 9, 10, 11 35 ns tPHL2 / 9 28 ns Propagation delay time, from P1thru P8to odd output / 9, 10, 11 35 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEF

37、ENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max tPLH3 2/ 9 12 ns 3/ 9, 10, 11 15 ns t

38、PHL3 2/ 9 12 ns Propagation delay time, from P9to even output CL= 15 pF RL= 280 (See figure 4) 3/ 9, 10, 11 15 ns tPLH4 2/ 9 18 ns 3/ 9, 10, 11 22 ns tPHL4 / 9 18 ns Propagation delay time, from P9to odd output / 9, 10, 11 22 ns tPLH5 2/ 9 9 ns 3/ 9, 10, 11 11 ns tPHL5 / 9 9 ns Propagation delay tim

39、e, from inhibit to even output 3/ 9, 10, 11 11 ns tPLH6 2/ 9 9 ns 3/ 9, 10, 11 11 ns tPHL6 / 9 9 ns Propagation delay time, from inhibit to odd output / 9, 10, 11 11 ns 1/ Not more than one output should be shorted at a time, and the duration of the short circuit condition should not exceed one seco

40、nd. 2/ VCC= 5.0 V. 3/ VCC= +4.5 V to + 5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Devi

41、ce type 01 Case outlines C and D Terminal number Terminal symbol 1 P1 2 P2 3 P3 4 P4 5 P9 6 ODD OUTPUT 7 GND 8 INHIBIT9 EVEN OUTPUT10 P5 11 P612 P7 13 P8 14 VCC FIGURE 1. Terminal connections. Number of P inputs Output Inhibit High Low Odd Even L 0 9 H L L 1 8 L H L 2 7 H L L 3 6 L H L 4 5 H L L 5 4

42、 L H L 6 3 H L L 7 2 L H L 8 1 H L L 9 0 L H H X X L LH = High voltage level L = Low voltage level X = Irelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CEN

43、TER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OH

44、IO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. Pulse generator for all pulses: Rate 1 MHz, ZO= 50 , tr 15 ns, tf 6 ns. 2. CLincludes probe and jig capacitance. 3. All diodes are 1N3064. FIGURE 4. Test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleN

45、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87543 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups

46、 (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10*, 11* Groups C and D end-point electrical parameters (method

47、 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested shall be guaranteed to the limits specified in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspectio

48、ns. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C or D. The test circui