DLA SMD-5962-87558 REV E-2013 MICROCIRCUIT DIGITAL ECL QUAD EXCLUSIVE-OR GATE MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Terminal connections changed to table form. Change drawing CAGE code to 67268. Add figure 4. Technical change to 1.4. Technical changes to tables I and II. Editorial changes throughout document. 89-03-20 M. A. Frye B Changes in accordance with NO

2、R 5962-R047-92 91-12-02 M. A. Frye C Revise for “QD” certification. New boilerplate. Editorial changes throughout. -ljs 00-02-16 Raymond Monnin D Update to current requirements. Editorial changes throughout. gap 06-04-06 Raymond Monnin E Update drawing to current MIL-PRF-38535 requirement. - jt 13-0

3、8-05 C.SAFFLE The original first page of this drawing has been replaced. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MI

4、CROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Wm. J. Johnson APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL,ECL, QUAD EXCLUSIVE-OR GATE, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-04-10 AMSC N/A REVISION LEVEL E SIZE

5、A CAGE CODE 67268 5962-87558 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E375-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87558 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSC

6、C FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87558 01 E

7、A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 10H513 Quad EXCLUSIVE-OR gate 1.2.2 Case outlines. The case outlines are as designat

8、ed in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1T-16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or GDFP3-F16 16 flat package 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 A

9、bsolute maximum ratings. Supply voltage range (VEE) . -8.0 V dc minimum to 0.0 V dc Input voltage range -5.2 V to 0.0 V dc Storage temperature range -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) . 275 mW Thermal resistance

10、, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) -5.46 V minimum to -4.94 V maximum Supply voltge range (VCC) -0.02 V to 0.02 V or 1.98 V to 2.02 V Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH)

11、: TA= +25C . -0.780 V dc TA= +125C . -0.650 V dc TA= -55C -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87558 DLA LAND AND MARITIME COLUMBUS,

12、OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of t

13、hese documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Elect

14、ronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbi

15、ns Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

16、a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer

17、Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML

18、 flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with

19、 MIL-PRF-38535 is required to identify when the QML flow option is used. This drawing has been modified to allow the manufacturer to use the alternate die/fabrication requirements of paragraph A.3.2.2 of MIL-PRF-38535 or other alternative approved by the qualifying activity. 3.2 Design, construction

20、, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on f

21、igure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagrams. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance

22、 characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI

23、CROCIRCUIT DRAWING SIZE A 5962-87558 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in

24、 table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number

25、is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” sh

26、all be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. For product built in accordance with A.3.2.2 of MIL-PRF-38535, or as modified in the manufacturers QM plan, the “QD” certification mark shall be used in place of the

27、“Q“ or “QML“ certification mark. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to list

28、ing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of mi

29、crocircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the o

30、ption to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix

31、A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D. The test cir

32、cuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifie

33、d in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproducti

34、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87558 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C Group A subgroup

35、s Limits Unit unless otherwise specified Min Max Quiescent conditions 1/ VIH VIL High level output voltage VOH Outputs terminated through 100 to -2.0 V -0.780 -1.950 1 -1.010 -0.780 V -0.650 -1.950 2 -0.860 -0.650 -0.840 -1.950 3 -1.060 -0.840 Low level output voltage VOL VEE= -5.2 V VCC= 0.0 V -0.7

36、80 -1.950 1 -1.950 -1.580 V -0.650 -1.950 2 -1.950 -1.565 -0.840 -1.950 3 -1.950 -1.610 High level threshold output voltage VOHA 2/ -1.110 -1.480 1 -1.010 -0.780 V -0.960 -1.465 2 -0.860 -0.650 -1.160 -1.510 3 -1.060 -0.840 Low level threshold output voltage VOLA -1.110 -1.480 1 -1.950 -1.580 V -0.9

37、60 -1.465 2 -1.950 -1.565 -1.160 -1.510 3 -1.950 -1.610 Power supply drain current 3/ IEE VEE= -5.46 V, 1 -42 mA VCC= 0.0 V, 2, 3 -46 High level input current IIH1 VIH = -0.780 V at +25C = -0.650 V at +125C B inputs 1 270 A 2, 3 430 IIH2 = -0.840 V at -55C A inputs 1 320 A 2, 3 510 IIH3 E 1 740 A 2,

38、 3 1100 Low level input current IIL VEE= -4.94 V, VCC= 0.0 V VIL= -1.950 V 3/ 1, 3 0.5 A 2 0.3 Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8

39、7558 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. - continued Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max Cases E and F DC rapid test conditions

40、 4/ VIH VIL High level output voltage VOH Outputs terminated through 100 to -2.0 V -0.792 -1.950 1 -1.021 -0.792 V -0.663 -1.950 2 -0.872 -0.663 -0.853 -1.950 3 -1.072 -0.853 Low level output voltage VOL VEE= -5.2 V VCC= 0.0 V -0.792 -1.950 1 -1.950 -1.584 V -0.663 -1.950 2 -1.950 -1.569 -0.853 -1.9

41、50 3 -1.950 -1.614 High level threshold output voltage VOHA 2/ -1.121 -1.484 1 -1.021 -0.792 V -0.972 -1.469 2 -0.872 -0.633 -1.172 -1.514 3 -1.072 -0.853 Low level threshold output voltage VOLA -1.121 -1.484 1 -1.950 -1.584 V -0.972 -1.469 2 -1.950 -1.569 -1.172 -1.514 3 -1.950 -1.614 Power supply

42、drain current 3/ IEE VEE= -5.46 V, 1 -41 mA VCC= 0.0 V, 2, 3 -45 High level input current IIH1 VIH= -0.792 V at +25C = -0.663 V at +125C B inputs 1 255 A 2, 3 415 IIH2 = -0.853 V at -55C A inputs 1 305 A 2, 3 495 IIH3 E 1 725 A 2, 3 1085 Low level input current IIL VEE= -4.94 V, VCC= 0.0 V VIL= -1.9

43、50 V 3/ 1, 3 0.5 A 2 0.3 Functional tests See 4.3.1c 7, 8 Case 2 DC rapid test conditions 4/ High level output voltage VOH Outputs terminated through 100 to -2.0 V -0.797 -1.950 1 -1.026 -0.797 V -0.669 -1.950 2 -0.877 -0.669 -0.859 -1.950 3 -1.077 -0.859 Low level output voltage VOL VEE= -5.2 V VCC

44、= 0.0 V -0.797 -1.950 1 -1.950 -1.585 V -0.669 -1.950 2 -1.950 -1.571 -0.859 -1.950 3 -1.950 -1.616 High level threshold output voltage VOHA 2/ -1.126 -1.485 1 -1.026 -0.797 V -0.977 -1.471 2 -0.877 -0.669 -1.177 -1.516 3 -1.077 -0.859 Low level threshold output voltage VOLA -1.126 -1.485 1 -1.950 -

45、1.585 V -0.977 -1.471 2 -1.950 -1.571 -1.177 -1.516 3 -1.950 -1.616 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87558 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISIO

46、N LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. - continued Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max Power supply drain current 3/ IEE VEE= -5.46 V 1 -41 mA VCC= 0.0 V 2, 3 -45 IIH1 VIH = -0.797 V at

47、 +25C = -0.669 V at +125C B inputs 1 255 A 2, 3 415 High level input current IIH2 = -0.859 V at -55C A inputs 1 305 A 2, 3 495 IIH3 E 1 725 A 2, 3 1085 Low level input current IIL VEE= -4.94 V, VCC= 0.0 V VIL= -1.950 V 3/ 1, 3 0.5 A 2 0.3 Functional tests See 4.3.1c 7, 8 Cases E, F, and 2 AC test co

48、nditions tTLH VEE= -2.94 V 9 0.60 1.90 ns Transition time tTHL VCC= 2.0 V 10 0.60 2.00 ns CL 5 pF 11 0.50 1.80 ns Propagation delay time, tPHH, tPLL Load all outputs through 100 to GND 9 0.40 2.40 ns Any input to Y tPHL, tPLH 10 0.50 2.50 ns See figure 4 11 0.40 2.30 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse