1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Page 5, IILcorrected. TABLE I, page 7. Correct prop delay limits. Change drawing CAGE number to 67268. Revise table I and footnote to table I. mlp 87-11-27 Michael A. Frye B Add figure 4. Change 4/ in table I. Change footnote notation on page 5.
2、Change terminal connections. Add subgroup 8 to table II. Change vendor similar part number for case outline 2. Editorial changes throughout. Change in IL. Technical changes to 1.4 and table I. mlp 89-02-24 Michael A. Frye C Changes in accordance with NOR 5962-R051-92. tvn 91-12-05 Monica L. Poelking
3、 D Add package CDFP4-F16. Use new boilerplate. ljs 98-02-04 Raymond Monnin E Figure 4 modified to be consistent with Table I. ljs 98-08-13 Raymond Monnin F Update to current requirements. Editorial changes throughout. gap 06-04-06 Raymond Monnin The original first page of this drawing has been repla
4、ced. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING I
5、S AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, DUAL D-TYPE MASTER-SLAVE FLIP-FLOP, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-11-24 SILICON AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-87561 SHEET 1 OF 13 DSC
6、C FORM 2233 APR 97 5962-E192-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope
7、. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87561 01 E X Drawing number Device type (see 1.2
8、.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H531 Dual D-type master slave flip-flop 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 a
9、nd as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package X CDFP4-F16 16 Flat package 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix
10、A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) . -8.0 V dc to 0.0 V dc Input voltage range . -5.2 V dc to 0.0 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 370 mW Thermal resis
11、tance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Supply voltage range (VCC . -0.02 V dc to 0.02 V dc or 1.98 V dc to 2.02 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum hig
12、h level input voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) . -1.950 V Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENT
13、ER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise spec
14、ified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - In
15、terface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil
16、or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, h
17、owever, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to
18、this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying ac
19、tivity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described he
20、rein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1
21、 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 2. 3.2.4 Logic diagram(s). The logic diagram(s) shall be as
22、 specified on figure 3. 3.2.5 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall
23、apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234
24、APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN l
25、isted in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance in
26、dicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A c
27、ertificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets
28、 the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of ch
29、ange to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore
30、at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to qualit
31、y conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acqui
32、ring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table
33、II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS C
34、OLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C Group A subgroups Limits Unit unless otherwise specified Min Max Cases E, F, 2 and X Quiescent tests 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780 -0
35、.650 -1.950 2 -0.860 -0.650 High level output voltage VOHOutputs terminated through 100 to -2 V -0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOLVCC1= 0.0 V, VCC2= 0.0 V, VEE= -5.2 V 2/ -0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.4
36、80 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLA-1.160 -1.510 3 -1.950 -1.610 V 1 -56 Power supply drain current 3/ IEEVEE= -5.4
37、6 V, VCC1= 0.0 V, 2, 3 -62 mA 1 285 High level input current IIH1VCC2= 0.0 V, D1, D2 2, 3 485 A 1 310 IIH2VIH= -0.780 V at +25C CE1, CE22, 3 530 A 1 390 IH3VIH= -0.650 V at +125C CC2, 3 660 A 1 465 IIH4VIH= -0.840 V at -55C R1, R2, S1, S22, 3 790 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, V
38、CC= 0.0 V VIL= -1.950 V 3/ 2 0.3 A Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321
39、8-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C Group A subgroups Limits Unit unless otherwise specified Min Max Cases E, F and X DC rapid test conditions 4/ VIHVIL-0.795 -1.950 1 -1.024 -0.795 -0
40、.667 -1.950 2 -0.876 -0.667 High level output voltage VOHOutputs terminated through 100 to -2 V -0.857 -1.950 3 -1.076 -0.857 V -0.795 -1.950 1 -1.950 -1.585 -0.667 -1.950 2 -1.950 -1.570 Low level output voltage VOLVCC1= 0.0 V, VCC2= 0.0 V, VEE= -5.2 V 2/ -0.857 -1.950 3 -1.950 -1.615 V -1.124 -1.4
41、85 1 -1.024 -0.795 -0.976 -1.470 2 -0.876 -0.667 High level threshold output voltage VOHA-1.176 -1.515 3 -1.076 -0.857 V -1.124 -1.485 1 -1.950 -1.585 -0.976 -1.470 2 -1.950 -1.570 Low level threshold output voltage VOLA-1.176 -1.515 3 -1.950 -1.615 V 1 -56 Power supply drain current 3/ IEEVEE= -5.4
42、6 V, VCC1= 0.0 V, 2, 3 -61 mA 1 270 High level input current IIH1VCC2= 0.0 V, D1, D2 2, 3 470 A 1 295 IIH2VIH= -0.795 V at +25C CE1, CE22, 3 515 A 1 375 IH3VIH= -0.667 V at +125C CC2, 3 645 A 1 450 IIH4VIH= -0.857 V at -55C R1, R2, S1, S22, 3 775 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, V
43、CC= 0.0 V VIL= -1.950 V 3/ 2 0.3 A Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321
44、8-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C Group A subgroups Limits Unit unless otherwise specified Min Max Case 2 Rapid tests 4/ VIHVIL-0.800 -1.950 1 -1.029 -0.800 -0.672 -1.950 2 -0.881 -0
45、.672 High level output voltage VOHOutputs terminated through 100 to -2 V -0.862 -1.950 3 -1.081 -0.862 V -0.800 -1.950 1 -1.950 -1.586 -0.672 -1.950 2 -1.950 -1.572 Low level output voltage VOLVCC1= 0.0 V, VCC2= 0.0 V, VEE= -5.2 V 2/ -0.862 -1.950 3 -1.950 -1.617 V -1.129 -1.486 1 -1.029 -0.800 -0.9
46、81 -1.472 2 -0.881 -0.672 High level threshold output voltage VOHA-1.181 -1.517 3 -1.081 -0.862 V -1.129 -1.486 1 -1.950 -1.586 -0.981 -1.472 2 -1.950 -1.572 Low level threshold output voltage VOLA-1.181 -1.517 3 -1.950 -1.617 V 1 -56 Power supply drain current 3/ IEEVEE= -5.46 V, VCC1= 0.0 V, 2, 3
47、-61 mA 1 270 High level input current IIH1VCC2= 0.0 V D1, D2 2, 3 470 A 1 295 IIH2VIH= -0.800 V at +25C CE1, CE22, 3 515 A 1 375 IH3VIH= -0.672 V at +125C CC2, 3 645 A 1 450 IIH4VIH= -0.862 V at -55C R1, R2, S1, S22, 3 775 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VCC= 0.0 V VIL= -1.950 V
48、3/ 2 0.3 A Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C
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