DLA SMD-5962-87572 REV E-2010 MICROCIRCUIT LINEAR DIFFERENTIAL VOLTAGE COMPARATORS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change CAGE code to 67268. Add cases B and I. Change to 1.3, V1+ and V1-. Changes to table I: VCM, tPLH, tPHL, and delay time between output A and B. 89-03-09 M. A. FRYE B Add CAGE code 0C7V7. Make changes to paragraphs 3.1 and 3.5.1. - ro 00-02-

2、15 R. MONNIN C Drawing updated to reflect current requirements. - rrp 03-11-18 R. MONNIN D Make correction under the conditions column for IIHand IILtests as specified in table I. Make changes to figure 2 waveform limits.- ro 05-08-15 R. MONNIN E Update drawing as part of 5 year review. - jt 10-11-0

3、1 C. SAFFLE CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY DONALD R. OSBORNE DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDAR

4、D MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D.A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, DIFFERENTIAL VOLTAGE COMPARATORS, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-05-04 AMSC N/A REVISION LEVEL E SI

5、ZE A CAGE CODE 14933 5962-87572 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E008-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 D

6、SCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87572 01

7、C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 527 High speed voltage comparator with emitter-follower input 02 529 High spee

8、d voltage comparator 03 LM161 High speed voltage comparator 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style B 1/ GDFP4-F14 14 Flat pack C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2

9、-F14 14 Flat pack I MACY1-X10 10 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (V1+): Device types 01 and 02 . +15 V dc Device type 03 +16 V dc Negative supply voltage (V1-): Device types 01 and 02 . -15 V d

10、c Device type 03 -16 V dc Gate supply voltage (V2+) . +7 V dc Output voltage . +7 V dc Differential input voltage (VIN) . 5 V dc Input common mode voltage . 6 V dc Lead temperature (soldering, 10 seconds) +300C DC input current . 10 mA Power dissipation (PD). 600 mW 2/ Junction temperature (TJ) +175

11、C Storage temperature range -65C to +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 _ 1/ Inactive for new design. Acceptable only for use in equipment designed or redesigned on or before 29 November 1986. 2/ Must withstand the added PDdue to short circuit test; e.g., IOS. Provided b

12、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage: V1+ +5 V dc to

13、+10 V dc V1- -6 V dc to -10 V dc V2+ +4.5 V dc to +5.5 V dc Ambient operating temperature (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herei

14、n. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcir

15、cuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch

16、/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document,

17、 however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built t

18、o this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying

19、activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described

20、herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2

21、.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as speci

22、fied in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reprodu

23、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless ot

24、herwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIO1 01,02 4 mV 2,3 6 1 03 3 2,3 5 Input bias current IBVIN= 0 V 1 01 2 A 2,3 4 1 02 12 2,3 36 1,2,3 03 20 Input offset current IOFFSETVIN= 0 V 1 01 0.5 A 2,3 1 1 02 3 2,3 9 1 03 4 2,3 8 Common mode voltage rang

25、e VCM1,2,3 01,02 5 V High level output voltage (LOGIC) VOHV2+ = 4.5 V, ISOURCE= -1 mA 1,2,3 All 2.4 V Low level output voltage (LOGIC) VOLV2+ = 4.5 V, ISINK= 10 mA 1,2,3 All 0.5 V High level input voltage (STROBE) VIHV2+ = 4.5 V 1 All 2 V 2,3 2.4 Low level input voltage (STROBE) VILV2+ = 4.5 V 1,2,3

26、 All 0.8 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electric

27、al performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level input current (STROBE) IIHV2+ = 5.5 V, VSTROBE= 2.7 V 1,2,3 All 200 A Low level input current (STROBE) IILV2+ = 5.5 V, VSTROBE= 0.

28、4 V 1,2,3 All -2 mA Output short circuit current IOSV2+ = 5.5 V, VOUT= 0 V 1,2,3 All -70 mA Supply current I1+ V1+ = 10 V, V1- = -10 V, 1,2,3 All 5 mA I1- V2+ = 5.5 V -10 I2+ 20 Input clamp voltage (STROBE) VICV2+ = 5.5 V, IIN= -18 mA 1,2,3 All -1.5 V Propagation delay time tPLHVIN= 100 mV step, 2/

29、9 01 26 ns CL= 15 pF, TA= +25C, 02 22 see figure 2 03 20 tPHL01 24 02 20 03 20 Delay time between output A and B VIN= 100 mV step, 2/ CL= 15 pF, TA= +25C, see figure 2 9 All 5 ns 1/ V1+ = +10 V, V1- = 10 V, V2+ = +5 V, unless otherwise specified. 2/ For device types 01 and 02, R4= 390 . For device t

30、ype 03, R4= 2.43 k. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limi

31、tations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QM

32、L“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificat

33、e of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. Provided by IHSNot for ResaleNo reproduction or networking permitted wi

34、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Device types 01 and 02 03 Case outlines C and D B and C I Terminal number Terminal symbol 1 V1+ V1+ INPUT A 2 NC NC INPUT B 3 INPU

35、T A INPUT A V1- 4 INPUT B INPUT B STROBE B 5 NC NC OUTPUT B 6 V1- V1- GND 7 NC NC OUTPUT A 8 STROBE B STROBE B STROBE A 9 OUTPUT B OUTPUT B V2+ 10 GND GND V1+ 11 OUTPUT A OUTPUT A - 12 NC NC - 13 STROBE A STROBE A - 14 V2+ V2+ - NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot f

36、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Switching time test circuit and waveforms. Provided by IHSNot for Res

37、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-3

38、8535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Ma

39、ritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedur

40、es shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL

41、-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipatio

42、n, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the

43、manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1* , 2, 3, 9 Group A test requirements (method 5005) 1, 2,

44、 3, 9 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria s

45、hall apply. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87572 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 4.3.1 Group A inspection. a. Tests shall be as

46、specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-88

47、3. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as a

48、pplicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics