ImageVerifierCode 换一换
格式:PDF , 页数:13 ,大小:113.35KB ,
资源ID:699076      下载积分:10000 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
注意:如需开发票,请勿充值!
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【http://www.mydoc123.com/d-699076.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: 微信登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(DLA SMD-5962-87662 REV C-2013 MICROCIRCUIT DIGITAL SCHOTTKY DUAL RETRIGGERABLE RESETTABLE MONOSTABLE MULTIVIBRATOR MONOLITHIC SILICON.pdf)为本站会员(李朗)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-87662 REV C-2013 MICROCIRCUIT DIGITAL SCHOTTKY DUAL RETRIGGERABLE RESETTABLE MONOSTABLE MULTIVIBRATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate. Editorial changes throughout. -les 00-08-16 Raymond L. Monnin B Update to current requirements. Editorial changes throughout. -gap 06-04-25 Raymond L. Monnin C Update drawing to current MIL-PRF-38535 requirements. -jt 13-11-13

2、 C. SAFFLE The original first page of this drawing has been replaced. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Monica L. Grosel DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD

3、 MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Hauch MICROCIRCUIT, DIGITAL, SCHOTTKY, DUAL RETRIGGERABLE, RESETTABLE, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 87

4、-07-13 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87662 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E588-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 4

5、3218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in t

6、he following example: 5962-87663 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 26S02 Schottky dual retriggerable, resettable, m

7、onostable multivibrator 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 1.2.3 Lead finish. The lead finish is as speci

8、fied in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -1.2 V dc to +5.5 V dc DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc Storage temperature range (TSTG) -65C to +150C Maximum power dissipation (P

9、D) 1/ . 700 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C DC input current . -30 mA to +5.0 mA DC output current, into output +30 mA 1.4 Recommended operating conditions. Supply voltage range (VCC) . +

10、4.5 V dc to +5.5 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum high-level input voltage (VIH) 2.0 V dc Maximum low-level input voltage (VIL) 0.8 V dc 1/ Must withstand the added PDdue to short circuit test (e.g., IOS). Provided by IHSNot for ResaleNo reproduction or networkin

11、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standar

12、ds, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

13、DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of the

14、se documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the te

15、xt of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN

16、class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordanc

17、e with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the devi

18、ce. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shal

19、l be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2.

20、3.2.4 Logic diagrams. The logic diagrams shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The waveforms and test circuit diagram shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

21、characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-

22、3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, append

23、ix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 C

24、ertification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow optio

25、n is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved sou

26、rce of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered

27、to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the ma

28、nufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Scre

29、ening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintai

30、ned by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of M

31、IL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking perm

32、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Test Symbol Conditions -55C TA +125C Group A subgroups Limits Unit Unless

33、otherwise specified Min Max High-level output voltage VOH VCC= 4.5 V, IOH= -2.0 mA, VIN= 2.0 V or 0.8 V 1, 2, 3 2.5 V Low-level output voltage VOL VCC= 4.5 V, IOH= 20 mA, VIN= 2.0 V or 0.8 V 1, 2, 3 0.5 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA 1/ 1, 2, 3 -1.2 V High-level input current IIH1

34、 VCC= 5.5 V, VIN= 2.7 V 1/ 1, 2, 3 20 A IIH2 VCC= 5.5 V, VIN= 5.5 V 1/ 1, 2, 3 1.0 mA Low-level input current IILVCC= 5.5 V, VIN= 0.5 V 1, 2, 3 -0.4 mA Short circuit input current IOSVCC= 5.5 V, VOUT= 1.0 V 2/ 1, 2, 3 -8 -35 mA Supply current ICCVCC= 5.5 V, IO= GND IIX= 0.33 mA 3/ 1, 2, 3 69 mA Func

35、tional tests See 4.3.1c 7, 8 Timing resistor RX4/ 5 50 k Propagation delay from I 0to Q tPLH1CL= 15pF RL= 280 RX= 5 k CX= 0 pF (See figure 4) 5/ 9 20 ns 6/ 9, 10, 11 30 ns Propagation delay from I 0to Q tPHL15/ 9 23 ns 6/ 9, 10, 11 30 ns Propagation delay from I1to Q tPLH25/ 9 20 ns 6/ 9, 10, 11 30

36、ns Propagation delay from I1to Q tPHL25/ 9 20 ns 6/ 9, 10, 11 26 ns Propagation delay from, clear to Q tPLH3CL= 15pF RL= 280 RX= 10 k CX= 1000 pF (See figure 4) 7/ 5/ 9 25 ns 6/ 9, 10, 11 33 ns Propagation delay from, clear to Q tPHL35/ 9 13 ns 6/ 9, 10, 11 17 ns See footnotes at end of table I. Pro

37、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Test Symbol Co

38、nditions -55C TA +125C Group A subgroups Limits Unit Unless otherwise specified Min Max Pulse width tPWCL= 15pF RL= 280 RX= 5 k CX= 0 pF (See figure 4) 5/ I 0high or I1low 9 20 ns I 0low or I1high 9 16 ns 6/ I 0high or I1low 9, 10, 11 26 ns I 0low or I1high 9, 10, 11 20 ns RX= 10 k CX= 1000 pF (See

39、figure 4) 7/ 5/ Clear low 9 24 ns 6/ Clear low 9, 10, 11 31 ns Setup time, clear recovery inactive to trigger tSCL= 15pF RL= 280 RX= 5 k CX= 0 pF (See figure 4) 5/ 9 -10 ns 6/ 9, 10, 11 -8 ns Minimum pulse width Q output tPWQ(min) RL= 1 k RX= 10 k CX= 200 pF (See figure 4) 8/ 5/ 9 740 870 ns 6/ 9, 1

40、0, 11 710 920 ns Pulse width Q output tPWQ CL= 15pF RL= 280 RX= 10 k CX= 1000 pF (See figure 4) 7/ 5/ 9 3.23 3.61 s 6/ 9, 10, 11 3.07 3.83 s 1/ Input test do not apply to CX, RX/CXpins. 2/ Not more than one output should be shorted at a time and the duration of the short circuit condition should not

41、 exceed 1 second. 3/ IIXis the current into the RXCXnode to simulate RX: RX/CX= IIX. 4/ Timing resistor range for which timing resistor equation applies. 5/ VCC= +5.0 V 6/ VCC= +4.5 V to +5.5 V 7/ CXis a silver mica type capacitor. 8/ CX= 200 pF test is not performed but correlated to 1000 pF test.

42、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device Type 01 Case outline E and F Terminal Connection Ter

43、minal Symbol 1 CX 2 RX/CX3 C D 4 I15 I 06 Q 7 Q 8 GND 9 Q 10 Q 11 I 0 12 I113 C D 14 RX/CX15 CX16 VCCFIGURE 1. Terminal connections. Inputs Outputs C D I1I 0 Q QL X X L H H H X L H H L H X L L H H H H = High L = Low = Low-to-high transition = High-to-low transition = Low-high-low pulse = High-low-hi

44、gh pulse X = Dont care FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Log

45、ic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. Pulse generator for all pulses: Rate

46、1.0 MHz; ZO50 ; tr 15 ns; tf 6.0 ns. 2. CLincludes probe and jig capacitance. 3. All diodes are 1N916 or 1N3064. FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962

47、-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 FIGURE 4. Switching waveforms and test circuit - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59

48、62-87662 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 11 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10*, 11* Group A test requirements (method 5005) 1, 2,

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1