DLA SMD-5962-87740 REV E-2013 MICROCIRCUIT LINEAR POWER SUPPLY SUPERVISORY CIRCUIT MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Sheet 4: TABLE I. Short circuit current test. Under the min limits column, delete “-12 mA” and substitute “-10 mA”. Changes in accordance with N.O.R. 5962-R343-97. 97-06-23 R. MONNIN B Add CAGE U3158 and update to reflect current requirements. -

2、ro 02-09-25 R. MONNIN C Add case outline 2. Make changes to 1.2.2, 1.3, figure 1, and figure 2. - ro 05-08-15 R. MONNIN D Add case outline F. Make changes to 1.2.2, 1.3, and figure 1. - ro 07-02-05 J. RODENBECK E Update paragraphs to current MIL-PRF-38535 requirements. - ro 13-02-19 C. SAFFLE THE OR

3、IGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWI

4、NG THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, POWER SUPPLY SUPERVISORY CIRCUIT, MONOLITHIC SILICON DRAWING APPROVAL DATE 88-05-09 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE

5、67268 5962-87740 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E242-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234

6、APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87740 01 E A Drawing nu

7、mber Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 1543 Power supply output supervisory circuit 02 1544 Power supply output supervisory circuit

8、 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack V GDIP1-T18 or CDIP2-T18 18 Dual-in-line 2 CQCC1-N20 20 Square le

9、adless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Input supply voltage (VIN) . 40 V dc Sense inputs . VINSCR trigger current . -600 mA 1/ Indicator output voltage 40 V dc Indicator output sink current . 50 mA Power diss

10、ipation (PD) . 1000 mW 2/ 3/ Junction temperature (TJ) . +150C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases E, F, V, and 2 . See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating tempera

11、ture range (TA) . -55C to +125C _ 1/ At higher input voltages, a dissipation limiting resistor (RG) is required: RG (VIN 5 V) / 0.2 A. 2/ Derate linearly above TA= +25C at 8.0 mW/C. 3/ Must withstand the added PDdue to short circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or ne

12、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification,

13、standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specificatio

14、n for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies

15、 of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited

16、 herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix

17、 A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML produ

18、ct in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or funct

19、ion of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical

20、dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Functional diagrams. The functional diagrams shall

21、be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test

22、requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS

23、, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VIN= 10 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Total device Input voltage range VINR1,2 All 4.5 40 V 3 4.7 40

24、 Supply current ISVIN= 40 V 1 All 10 mA 2,3 15 Reference section ( VREFand VINpins ) Output voltage VO1 All 2.48 2.52 V 2,3 2.45 2.55 Line regulation VLINEVIN= 5.0 V to 30 V 1,2,3 All 5.0 mV Load regulation VLOADIREF= 0 mA to -10 mA 1,2,3 All 10 mV Short circuit current IOSVREF= 0 V 1,2,3 All -10 -4

25、0 mA SCR TRIGGER section ( SCR TRIGGER, REMOTE ACTIVATE, and RESET pins ) Peak output current IO(pk)VIN= 5.0 V, RG= 0 , VO= 0 V 1,2,3 All -100 -600 mA Peak output voltage VO(pk)VIN= 15 V, IO= 100 mA 1,2,3 All 12 V Output off voltage VO(off)VIN= 40 V 1,2,3 All 0.1 V REMOTE ACTIVATE current IACTREMOTE

26、 ACTIVATE pin = GND 1,2,3 All -0.8 mA REMOTE ACTIVATE voltage VACTREMOTE ACTIVATE pin open 1,2,3 All 6.0 V RESET current IRESETREMOTE ACTIVATE and RESET pins = GND 1,2,3 All -0.8 mA RESET voltage VRESETRESET pin = open, REMOTE ACTIVATE pin = GND 1,2,3 All 6.0 V See footnotes at end of table. Provide

27、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Sy

28、mbol Conditions -55C TA +125C VIN= 10 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Comparator sections (OV INDICATE, OV DELAY, OV INPUT, UV INPUT, UV DELAY, and UV INDICATE pins). For device 02, OV and UV INPUTS are tested inverted and noninverted respectively. Inpu

29、t threshold 1/ voltage VIN(th)1 All 2.45 2.55 V 2,3 2.40 2.60 Input bias current IIBSense input = 0 V 1,2,3 All -1.0 A Delay saturation voltage VD(sat)1,2,3 All 0.5 V Delay high level voltage VDH1,2,3 All 8.0 V Delay charging current IDVD= 0 V 1,2,3 All -200 -300 A Indicate saturation VIND(SAT)IL= +

30、10 mA 1,2,3 All 0.5 V Indicate leakage current IL(IND)VIND= 40 V 1,2,3 All 1.0 A Current limit section ( CL INV INPUT, CL NI INPUT, OFFSET/COMP, CL OUTPUT, GROUND pins ) Input voltage range VINR1,2,3 All 0 VIN3.0 V V Input bias current IIBOFFSET/COMP pin = open, VCM= 0 V 1,2,3 All -1.0 A Input offse

31、t voltage VOSOFFSET/COMP pin = open, VCM= 0 V 1,2,3 All 10 mV 10 k 0.1% from OFFSET/COMP pin to GROUND, 2 k from CLOUTPUT to VREF80 120 Common mode rejection CMRR 0 V VCM 12 V, VIN= 15 V 4,5,6 All 60 dB Open loop voltage gain AVOLOFFSET/COMP pin = open, VCM= 0 V 4,5,6 All 72 dB Output saturation VO(

32、SAT)IL= -10 mA 1,2,3 All 0.5 V Output leakage IL(IND)VIND= 40 V 1,2,3 All 1.0 A 1/ Input voltage rising on pin OV input and falling on pin UV input. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA L

33、AND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Device types 01 01 02 Case outlines E and F 2 V Terminal number Terminal symbol 1 SCR TRIGGER NC SCR TRIGGER 2 REMOTE ACTIVATE SCR TRIGGER REMOTE ACTIVATE 3 RESET REMOTE ACTIVATE RESET 4 OV INDICATE RESET OV IN

34、DICATE 5 OV DELAY OV INDICATE OV DELAY 6 OV INPUT NC OV NI INPUT 7 UV INPUT OV DELAY OV INV INPUT 8 UV DELAY OV INPUT UV NI INPUT 9 UV INDICATE UV INPUT UV INV INPUT 10 CL INV INPUT UV DELAY UV DELAY 11 CL NI INPUT NC UV INDICATE 12 OFFSET/COMP UV INDICATE CL INV INPUT 13 CL OUTPUT CL INV INPUT CL N

35、I INPUT 14 GROUND CL NI INPUT OFFSET/COMP 15 VREFOFFSET/COMP CL OUTPUT 16 VINNC GROUND 17 - CL OUTPUT VREF18 - GROUND VIN19 - VREF- 20 - VIN- NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

36、MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Device type 01 FIGURE 2. Functional diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D

37、RAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 Device type 02 FIGURE 2. Functional diagram - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

38、WING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be

39、 marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in complia

40、nce to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in o

41、rder to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A an

42、d the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be requir

43、ed for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onsho

44、re at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to qua

45、lity conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or ac

46、quiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in tab

47、le II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The foll

48、owing additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87740 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgr