DLA SMD-5962-87751 REV A-2007 MICROCIRCUIT DIGITAL ECL COUNTER CONTROL LOGIC MONOLITHIC SILICON《硅单片计数机控制逻辑发光数字微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 07-06-20 Robert M. Heber REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Phu H. Nguyen

2、DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Tim H. Noh COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ECL, COUNTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWIN

3、G APPROVAL DATE 93-01-20 CONTROL LOGIC, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-87751 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E250-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

4、 A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice

5、 of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 87751 01 M E X Federal stock clas

6、s designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the ap

7、propriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device typ

8、e Generic number Circuit function 01 12514 Digital counter control logic. 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements f

9、or MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Termin

10、als Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

11、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . 0 V dc to +7.0 V dc Output voltage (VOUT) . +5.5 V dc Input voltage (VIN) . +5.5 V dc

12、 Maximum power dissipation . 195 mW Storage temperature range (TS) . -65C to +175C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +165C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V

13、dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) . 2.4 V dc Maximum low level input voltage (VIL) 0.5 V dc Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards

14、, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DE

15、PARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these

16、 documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and th

17、e references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operat

18、ion at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET

19、4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall

20、not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction,

21、 and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall

22、be as specified on figure 1. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 2. 3.2.4 Test circuits and switching waveforms. The test circuits and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter li

23、mits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgrou

24、ps specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to spac

25、e limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with M

26、IL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For de

27、vice classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approv

28、ed source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or

29、for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits deliv

30、ered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For

31、device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Dev

32、ice class M devices covered by this drawing shall be in microcircuit group number 33 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUM

33、BUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C 1/ VCC= 5.0 V 10% unless otherwise specified Group A subgroups Min Max Unit High voltage output VOHB2, 0P, 2P , 3P, VCC = 4.5 V, 0Z, 1Z , 2

34、Z , 3Z = 0.5 V, IOH= -0.4 mA 1, 2, 3 2.4 Low voltage output VOL0P, 2P , 3P = 0.5 V, 0Z, 1Z , 2Z , 3Z , B1, P1 = 4.5 V, VCC = 4.5 V, IOL= 16 mA 1, 2, 3 0.5 Input clamp voltage VICVCC= 4.5 V, IIC= -10 mA 1, 2, 3 -1.2 V 1, 3 40 Input current high IINH1VCC= 5.5V, B1, P1, 0P, 2P , 3P = 2.4 V, B2, 0Z, 1Z

35、, 2Z , 3Z = 2.4 V 2 80 1, 3 160 Input current high IINH2VCC= 5.5 V, B1 = GND 2 420 A Input current high IINH3VCC= 5.5V, B1, P1, 0P, 2P , 3P = 4.5 V, B2, 0Z, 1Z , 2Z , 3Z, fIN= 5.0 V 1, 2, 3 1.0 Input current low IINL1VCC= 5.5V, B1, P1, 0P, 2P , 3P = 0.5 V, 0Z, 1Z , 2Z , 3Z = 0.5 V 1, 2, 3 -1.6 Input

36、 current low IINL2fIN= 0.5 V, VCC= 5.5 V, B2, 0P, 2P , 3P = open , B1 = GND 1, 2, 3 -6.4 Power supply drain current ICCVCC= 5.0 V, B1, B2 = GND 1, 2, 3 35 mA Short circuit current IOSVCC= 5.0 V, Enable out, OUTf = GND, 0Z, 1Z , 2Z , 3Z = 0.5 V 1, 2, 3 -20 -65 A Functional test See 4.4.1b, VCC= 4.5 V

37、, 5.5 V 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE

38、I. Electrical performance characteristics - Continued. Limits 2/ Test Symbol Test conditions 1/ -55C TC +125C VCC= 5.00 V 10% unless otherwise specified Group A subgroups Min Max Unit 9 15 10 19 tPLH111 16 9 16 10 18 Propagation delay (early decode) tPHL10P, 2P , 3P = 0.5 V, P1 = 2.4 V, B1 = 0.0 V t

39、o 3.0 V, VCC= 5.0 V, See figure 3 11 17 9 12 10 17 tPLH211 12 9 16 10 19 tPHL211 17 9 16 10 20 Propagation delay (zero detector) tPHL30P, 2P , 3P, 0Z, 1Z , 2Z , 3Z = 0.5 V, B1, P1 = 2.4 V, VCC= 5.0 V, See figure 3 11 17 Setup time (high input decode B1, P1) tsetup19 2.0 Setup time (high input decode

40、 0P, 2P , 3P) tsetup19 12 Setup time (low input decode B1, P1) tsetup09 8.0 Setup time (low input decode 0P, 2P , 3P) tsetup09 9.0 Hold time (high input decode B1, P1) thold19 8.0 Hold time (high input decode 0P, 2P , 3P) thold19 10 Hold time (low input decode B1, P1) thold09 2.0 Hold time (low inpu

41、t decode 0P, 2P , 3P) thold00P, 2P , 3P = 0.5 V, B1, P1 = 5.0 V, VCC= 5.0 V, See figure 3 9 14 ns 1/ Output load = 100 to 5.0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COL

42、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline E Terminal number Terminal symbol 1 fIN2 0Z 3 1Z 4 2Z 5 3Z 6 B2 7 Enable out 8 GND 9 OUTf 10 B1 11 0P 12 2P 13 3P 14 P1 15 NC 16 VCCFIGURE . Terminal connections. Provided by IHSNot for ResaleNo reproduction

43、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted w

44、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 See notes at end of figure. FIGURE 3. Test circuits and switching waveforms . Provided by IHSNot for ResaleNo reproducti

45、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 Propagation delay time See notes at end of figure FIGURE 3. Test circuits and switching wav

46、eforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 11 DSCC FORM 2234 APR 97 Setup and release time NOTES:

47、 1. Two pulse generators are required and must be slaved together to provide the waveforms shown. 2. CT= 15.0 pF equal total parasitic capacitance, which includes probe, wiring, and local capacitances. 3. The coax delays from input to scope and output to scope must be matched. The scope must be term

48、inated in 50 impedance. The 950 resistor and the scope termination impedance constitute a 20:1 attenuator probe. Coax shall be CT-070-50 or equivalent. 4. A load is connected to each output during testing. PRF = 1.0 MHz double pulsed for input waveform fIN; 1.0 MHz single pulsed for other inputs waveforms. tr= tf= 5.0 ns (10 percent to 90 percent points). FIGURE 3. Test circuits and switching waveforms - Continue