DLA SMD-5962-87789 REV C-2011 MICROCIRCUIT LINEAR MICROPROCESSOR COMPATIBLE 8-BIT DIGITAL-TO-ANALOG CONVERTER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline 2. Delete subgroups 2 and 3 from C and D end points. Editorial changes throughout. Change footnote 4/ on table I.90-02-02 M. A. Frye B Drawing updated to reflect current requirements. Editorial changes throughout. drw 01-01-25 Ra

2、ymond Monnin C Redraw. Update paragraphs to current boilerplate requirements. - drw 11-10-05 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Joseph A. Kerby DL

3、A LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Ray Monnin APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, MICROPROCESSOR COMPATIB

4、LE 8-BIT DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 88-06-30 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87789 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E471-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

5、ARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, ap

6、pendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87789 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function as follows: Device type Gen

7、eric number Circuit function 01 AD558S 8-bit D/A with full microprocessor interface 02 AD558T 8-bit D/A with full microprocessor interface 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T1

8、6 or CDIP2-T16 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage VCCto digital return . 0 V dc to +18 V dc Digital input voltage to digital return . 0 V dc

9、 to +7.0 V dc Output short circuit duration (to ground) Indefinite Output short circuit duration (to VCC) . Momentary Power dissipation. 450 mW Lead temperature (soldering, 10 seconds) +300C Storage temperature range -65C to +150C Junction temperature (TJ) +175C Thermal resistance, junction-to-case

10、(JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case outline E 100C/W Case outline 2 120C/W 1.4 Recommended operating conditions. Positive supply voltage range (VCC): 2.56 V output range 4.5 V dc to 5.5 V dc 10 V output range . 11.4 V dc to 16.5 V dc Ambient operating temperatu

11、re range (TA) -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Gov

12、ernment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFIC

13、ATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard

14、 Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. I

15、n the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. T

16、he individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has bee

17、n granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications t

18、o the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Des

19、ign, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be

20、as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Functional block diagram. The functional block diagram shall be as specified on figure 3. 3.2.5 Timing diagram. The timing diagram shall be as specified on figure 4. 3.3 Electrical performance chara

21、cteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. Th

22、e electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR

23、 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Relative accuracy RA All bits with positive errors on 1 All 0.50 LSB and all bits with negative errors on 2, 3 01 0.75 12 02 0.25

24、2, 3 0.375 Differential nonlinearity DNL All major carriers 1, 2, 3 All 1 LSB Zero error VZEAll bits off 1 All 1 LSB 2, 3 01 2 12 02 0.5 2, 3 1 Gain error AENo load and 5 mA load, all 1 All 1.5 LSB bits on 2, 3 01 2.5 12 02 0.5 2, 3 1.0 Output voltage settling tVO0 to 10 V range 2/ 7 All 3.0 s time

25、(settling) 8 5.0 3/ 0 to 2.56 V range 2/ 7 All 1.5 8 3.0Power supply rejection ratio PSRR 4/ 1, 2, 3 All 0.03 %/% Power supply current ICCAll bits on 1, 2, 3 All 25 mA Digital input high voltage VIH1, 2, 3 All 2.0 V Digital input low voltage VIL1, 2, 3 All 0.8 V Functional tests 3/ See 4.3.1c 7, 8 A

26、ll See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical perfo

27、rmance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Digital input high current IIHVIH= 7 V 1, 2, 3 All 100 A Digital input low current IILVIL= 0 V 1, 2, 3 All 100 A Write pulse width (strobe) tWR5/ 9

28、 All 200 ns 10,11 270 Data setup time tDS5/ 9 All 200 ns 10,11 270 Data hold time tDH5/ 9, 10, 11 All 10 ns 1/ VCC= +5 V for 0 to 2.56 V range, VCC= +15 V for 0 to 10 V range (unless otherwise specified). 2/ Settling time is specified for a positive full scale step to 1/2 LSB. 3/ Guaranteed if not t

29、ested. 4/ VCC= 4.5 V to 5.5 V for 0 to 2.56 V range, VCC= 11.4 V to 16.5 V for 0 to 10 V range. 5/ Timing per figure 4. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also

30、be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compl

31、iance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in

32、 order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A

33、and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be requ

34、ired for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available ons

35、hore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type 01 and 02 C

36、ase outline E 2 Terminal number Terminal symbol 1 DB0 (LSB) NC 2 DB1 DB0 (LSB)3 DB2 DB1 4 DB3 DB25 DB4 DB3 6 DB5 NC7 DB6 DB4 8 DB7 (MSB) DB5 9 CE DB6 10 CS DB7 (MSB) 11 +VCCNC 12 GND CE 13 GND CS 14 VOUTselect +VCC15 VOUTsense GND 16 VOUTNC 17 - - - GND 18 - - - VOUTselect 19 - - - VOUTsense 20 - -

37、- VOUTNC = no connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 In

38、put data CE CS DAC data Latch condition 0 0 0 0 “Transparent” 1 0 0 1 “Transparent”0 0 0 Latching 1 0 1 Latching0 0 0 Latching 1 0 1 LatchingX 1 X Previous data Latched X X 1 Previous data LatchedX = Does not matter. = Logic threshold at positive-going transition. FIGURE 2. Truth table. Provided by

39、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Functional block diagram. FIGURE 4. Timing diagram. Provided

40、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection

41、 procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 10

42、15 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power d

43、issipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretio

44、n of the manufacturer. c. Optional subgroup 12 is used for grading and part selection at +25C, it is not included in PDA. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004)

45、 1 Final electrical test parameters (method 5004) 1*, 2, 3, 9, 12 Group A test requirements (method 5005) 1, 2, 3, 7*, 8*, 9, 10, 11, 12 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. * Subgroups 7 and 8 are guaranteed, if not tested, to the limits specif

46、ied in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II h

47、erein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. d. Optional subgroup 12 is used for grading and part selection at +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted wi

48、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87789 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level cont