DLA SMD-5962-87792 REV C-2011 MICROCIRCUIT DIGITAL ECL MULTIPLEXER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R075-92. 91-12-10 Monica L. Poelking B Update to reflect latest changes in format and requirements. Correct paragraph in 3.5. Editorial changes throughout. les 05-06-09 Raymond Monnin C Update drawing as part o

2、f 5 year review. jt 11-11-08 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Monica L. Poelking DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.d

3、la.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY David H. Johnson APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL MULTIPLEXER MONOLITHIC SILICON DRAWING APPROVAL DATE 88-05-03 AMSC N/A REVISION LEVEL

4、 C SIZE A CAGE CODE 67268 5962-87792 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E039-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET

5、 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87792

6、 01 E X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 10558 Quad 2-input multiplexer, noninverting 1.2.2 Case outlines. The case outli

7、nes are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, append

8、ix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC= 0.0 V) -8.0 V dc to 0.0 V dc Input voltage range (VCC= 0.0 V) 0.0 V dc to -5.2 V dc Output current (IOUT): Continuous . 50 mA Surge . 100 mA Storage temperature range . -65C to +165C Maximum power dissipation (PD) 1/ 319 mW Lead temperat

9、ure (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +165C 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Minimum high level input voltage (VIH): TA= +25C -1.105 V TA= +

10、125C -1.000 V TA= -55C . -1.255 V Maximum low level input voltage (VIL): TA= +25C -1.475 V TA= +125C -1.400 V TA= -55C . -1.510 V Ambient temperature range (TA) . -55C to +125C _ 1/ Maximum power dissipation is defined as VCCx ICC, and must withstand the added PDdue to short-circuit test; e.g., IOS.

11、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, stan

12、dards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integ

13、rated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL

14、-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict b

15、etween the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirem

16、ents shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional cert

17、ification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein.

18、These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used 3.2 Design, construction, and physi

19、cal dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.

20、2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical

21、test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. I

22、n addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted witho

23、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF

24、-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be lis

25、ted as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirem

26、ents herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any cha

27、nge that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the opti

28、on of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact

29、eristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Cases E, F, and 2 Quiescent tests 1/ 2/ VIHVILHigh level output voltage VOHOutputs -0.780 -1.850 1 All -0.930 -0.780 V terminated -0.630 -1.820 2 -0.825 -0.630 through -0.880 -

30、1.920 3 -1.080 -0.880 Low level output voltage VOL 100 to -2 V, -0.780 -1.850 1 All -1.850 -1.620 V VEE= -5.2 V, -0.630 -1.820 2 -1.820 -1.545 VCC= 0.0 V -0.880 -1.920 3 -1.920 -1.655 High level threshold output VOHA 3/ -1.105 -1.475 1 All -0.950 -0.780 V voltage -1.000 -1.400 2 -0.845 -0.630 -1.255

31、 -1.510 3 -1.100 -0.880 Low level threshold output VOLA-1.105 -1.475 1 All -1.850 -1.600 V voltage -1.000 -1.400 2 -1.820 -1.525 -1.255 -1.510 3 -1.920 -1.635 Power supply drain current IEE VIH= -0.780 V at +25C 1 All -48 mA 4/ -0.630 V at +125C 2, 3 -53 -0.880 V at -55C VEE= -5.46 V, VCC= 0.0 V Hig

32、h level input current IIH1 Select 1 All 225 A 2, 3 385 IIH2 Inputs 1 All 250 A A & B 2, 3 425 Low level input current IILVIH= -1.850 V at +25C 1, 3 All 0.5 A -1.820 V at +125C 2 0.3 -1.920 V at -55C VEE= -4.94 V, VCC= 0.0 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction

33、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless

34、 otherwise specified Group A subgroups Device type Limits Unit Min Max Cases E, F, and 2 AC tests Transition time tTLH, tTHLVEE= -3.2 V, 9 All 1.5 3.3 ns VCC= +2.0 V, 10 1.6 3.5 CL 5 pF 10%, 11 1.6 3.5 Propagation delay time, tPLH, RL= 100 9 All 1.2 3.0 ns A, B to Y tPHL, tPHH1, tPLL15/ 10 1.5 3.5 1

35、1 1.5 3.5 Propagation delay time, tPHH2, 9 All 2.4 4.5 ns Select to Y tPLL210 2.5 5.0 11 2.5 5.0 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable

36、) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be used after an increased ambient temperature has

37、been stabilized by external thermal sources. This adjusted temperature simulates the quiescent method by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal characteristics of the device and package used

38、. 3/ The high and low level output current varies with temperature, and can be calculated using the following formula: IOH= ( -2V - VOH)/100, IOL= ( -2V - VOL)/100. 4/ The IEElimits, although specified in the minimum column, shall not be exceeded, in magnitude, as a maximum value. 5/ The load circui

39、t shall consist of the output under test going through RLto GND and through CLto the tester. CLincludes the scope probe, wiring, and stray capacitance without the package in the test fixture. tPHHis measured from the midpoint of a high input to the midpoint of a high output. tPLLis measured from the

40、 midpoint of a low input to the midpoint of a low output. Voltage waveforms for tPLHand tPHLshall be in accordance with method 3003 of MIL-STD-883 with the transition point being 50 percent of the maximum input or output voltage. Voltage waveforms for tTLHand tTHLshall be in accordance with method 3

41、004 of MIL-STD-883 with the transition point being 50 percent of the maximum input or output voltage. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVI

42、SION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device types 01 01 01 Case outlines E F 2 Terminal number Terminal symbols Terminal symbols Terminal symbols 1 Y1 B3 NC 2 Y2 Y4 Y1 3 A2 Y3 Y2 4 B2 VCCA2 5 A1 Y1 B2 6 B1 Y2 NC 7 NC A2 A1 8 VEEB2 B1 9 SELECT A1 NC 10 A4 B1 VEE11 B4 NC SELECT 12 A3 VEEA4 13 B3

43、 SELECT B4 14 Y4 A4 A3 15 Y3 B4 B3 16 VCCA3 NC 17 - - - - - - Y4 18 - - - - - - Y3 19 - - - - - - VCC20 - - - - - - NC NC = No connection FIGURE 1. Terminal connections. Inputs Output SELECT A B Y L L X L L H X H H X L L H X H H H = High voltage level L = Low voltage level X = Irrelevant FIGURE 2. T

44、ruth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87792 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sa

45、mpling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Bu

46、rn-in test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biase

47、s, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at

48、 the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall