DLA SMD-5962-87793 REV B-2009 MICROCIRCUIT DIGITAL ECL HEX D-TYPE FLIP-FLOP MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 01-09-10 Raymond Monnin B Update drawing to current requirements. Editorial changes throughout. gap 09-02-12 Robert M. Heber The original first sheet

2、of this drawing has been replaced. REV SHET REV SHET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Ray Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THI

3、S DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, HEX D-TYPE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-08-30 FLIP-FLOP, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-87793 SHEET 1 OF 10 DSCC F

4、ORM 2233 APR 97 5962-E368-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. T

5、his drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87793 01 E X Drawing number Device type (see 1.2.1)

6、 Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10586 Hex D-type flip-flop with common reset 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 a

7、nd as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute max

8、imum ratings. Supply voltage range . -8.0 V dc to 0.0 V dc Input voltage range (VIN) . 0.0 V dc to -5.2 V dc Storage temperature range . -65C to +150C Maximum power dissipation (PD) . 698 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Jun

9、ction temperature (TJ) +165C 1.4 Recommended operating conditions. Supply voltage range (VCC) . -5.46 V dc minimum to -4.94 V dc maximum Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH) : TA= +25C . -0.780 V dc TA= +125C . -0.630 V dc TA= -55C -0.880 V dc

10、 Maximum low level input voltage (VIL): TA= +25C . -1.850 V dc TA= +125C . -1.820 V dc TA= -55C -1.920 V dc Minimum setup time (ts) 2.5 ns Minimum hold time (th) 1.5 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

11、E A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent speci

12、fied herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standar

13、d Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/qu

14、icksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

15、document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Produc

16、t built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qu

17、alifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as d

18、escribed herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and he

19、rein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test ci

20、rcuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical tes

21、t requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

22、87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked.

23、 For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to M

24、IL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to

25、be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein.

26、 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.

27、 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection.

28、 Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a.

29、 Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, bi

30、ases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional

31、 at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. E

32、lectrical performance characteristics. Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max Cases E, F, and 2 Quiescent tests 1/ 2/ High level output voltage VOHVIHVIL-0.780 -1.850 1 -0.930 -0.780 -0.630 -1.820 2 -0.825 -0.630 -0.880 -1.920 3 -1.080 -0

33、.880 V -0.780 -1.850 1 -1.850 -1.620 -0.630 -1.820 2 -1.820 -1.545 Low level output voltage VOL-0.880 -1.920 3 -1.920 -1.655 V -1.105 -1.475 1 -0.950 -0.780 -1.000 -1.400 2 -0.845 -0.630 High level threshold output voltage VOHA-1.255 -1.510 3 -1.100 -0.880 V -1.105 -1.475 1 -1.850 -1.600 -1.000 -1.4

34、00 2 -1.820 -1.525 Low level threshold output voltage VOLAOutputs terminated through 100 to -2 V VCC= 0.0 V VEE= -5.2 V 3/ -1.255 -1.510 3 -1.920 -1.635 V 1 -110 Power supply drain current IEEVEE= -5.46 V, VCC= 0.0 V VIH= -0.780 V at +25C 2, 3 -121 mA 1 220 High level input current IIH1-0.630 V at +

35、125C -0.880 V at -55C Data inputs 2, 3 375 A 1 310 IIH2Clock input 2, 3 525 A 1 575 IIH3Reset input 2, 3 975 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VCC= 0.0 V VIH= -1.850 V at +25C -1.820 V at +125C -1.920 V at -55C 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo

36、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Condition

37、s -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max Cases E, F, and 2 AC tests 9 1.1 4.0 10 1.0 4.7 Transition time tTLH, tTHL VEE= -3.2 V, VCC= +2.0 V, CL 5 pF, RL= 100 11 1.0 4.3 ns 9 1.6 4.5 10 1.6 5.3 Propagation delay time, clock to output tPHH, tPHL1 See figure 3 11

38、 1.6 4.9 ns 9 1.6 4.5 10 1.6 5.3 Propagation delay time, reset to output tPHL211 1.6 4.9 ns 9 125 10 125 Maximum clock frequency fMAX11 125 MHz 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with

39、 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be u

40、sed after an increased ambient temperature has been stabilized by external thermal sources. This adjusted temperature simulates the quiescent method by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal

41、 characteristics of the device and package used. 3/ The high and low level output current varies with temperature, and can be calculated using the following formula: IOH= (VOH- 2 V)/100 and IOL= (VOL- 2 V)/100 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro

42、m IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outlines E F 2 Terminal number Terminal Symbol 1 RESET Q3 NC 2 Q0 Q4 RESET 3 Q1 Q5 Q04 Q2 VCC Q1 5 D0 RESET Q2 6 D1 Q0 NC 7 D2 Q1 D0

43、8 VEEQ2 D1 9 CLOCK D0 D210 D3 D1 VEE11 D4 D2 NC 12 D5 VEE CLOCK 13 Q3 CLOCK D3 14 Q4 D3 D415 Q5 D4 D5 16 VCCD5 NC 17 Q3 18 Q419 Q5 20 VCCNC = No connection FIGURE 1. Terminal connections. Reset Clock* Q Qn+1 L L X Qn L H L L L H H H H L X L H = High level.L Low level. X = Irrelevant. * A clock high

44、is a clock transition from low to high. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM

45、 2234 APR 97 NOTES: 1. Pulse generator characteristics: PRR = 1 MHz, tTHL= tTLH= 2.0 0.2 ns (20% to 80%), duty cycle = 50%. 2. The 50 resistor in series with the 50 coax constitutes the 100 load. FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networki

46、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87793 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-ST

47、D-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup

48、 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 tests shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End