DLA SMD-5962-88533 REV C-1994 MICROCIRCUIT DIGITAL CMOS ERROR DETECTION AND CORRECTION UNIT MONOLITHIC SILICON《硅单片误差检测与校正的单位互补型金属氧化物半导体数字微电路》.pdf

1、 SUD-5962-88533 REV C E! 9999996 0063870 bT2 m Changes in accordance with NOR 5962-R073-92 LTR 91/11/30 A REV B ccc C REVISIONS DATE (IR-HO-DA) D-ON Add evi types 03 thmugb 05 for vendar cage 34335. Alter electrical performmce characbristics . Add additional load circuit (figure 5) for device types

2、03 through 05. device type 06 for vendar cage 61772. inactivate case 2. Mitorial changes thruughout. Add 89/06/30 AM device type 07 for vendor cage 61772. Add case outline T. Bitorial changes throughout. I 94/04/20 SHEET PMIC N/A STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL

3、 DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A ISC FORM 193 JUL 91 M.A. Frye M. L. Poelkinq M, L. Poelking PREPARED BY Christopher A. Rauch DAYTON, mo 45444 CHECKED BY Ray Honnin APPROVED BY Michael A. Frye DRAWING APPROVAL DATE 2 JUNE 1988 REVISION LEVEL C MICROCIRCUIT, DIGITAL, CM

4、OS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON SIZE I CAGE WE I 5962-88533 A 67268 SHEET 1 OF 24 _ 5962-E400-93 . _ - DISTRIBUTION STATEMENT A. Approved for pubtic release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr

5、om IHS-,-,-SHD-5962-88533 REV C qqqq996 OOhL871 539 I 1. SCOPE 1.1 a. This drawing describes device rwirernents for class B microcircuits in accordance with 1.2.1 of 1.2 Part or Identifvins Nunber (PINl. o1 MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN dev

6、iceso8. The complete PIN shall be as shown in the following example: X - X - 5962 - 88533 - I I I I STANDARD1 ZED SI2E MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION C I I 1 1 I I Lead finish per Drawing nuber Device type Case outline (see 1.2.1) (see 1.2.2) MIL-M-3

7、8510 5962-88533 SHEET 2 1.2.1 Device twe(s1. The device type(s) shall identify the circuit function as follows: Device type Generic der Circuit function Detect time Correct time o1 49C460A 32-bit EDCU 33 ns 39 ns 02 49C460B 32-bit EDCU 28 ns 33 ns 03 29C660A 32-bit EDCU 33 ns 39 ns o4 29COB 32-bit E

8、DCU 28 ns 33 ns 05 29C660C 32-bit EDCU 21 ns 29 ns o6 49C460C 32-bit EDCU 21 ns 29 ns 07 49C460D 32-bit EDCU 16 ns 22 ns 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter DeSCriDtiVe designator Terminals Package style CMGA3 - 68 See figu

9、re 1 CPCC1 -N84 See figure 2 See figure 3 68 68 68 68 68 1.3 Absolute maximun ratinss. I/ Voltage on any pin relative to ground . DC output current into outputs Storage temperature range . Maximun power dissipation (PD) lead temperature (soldering, 10 seconds) Thermal resistance, junction-to-case (O

10、Jc): Cases U and Y . Case X Case 2 Case T Junction tenperature (TJ) 1.4 Recomnended oDeratina conditions. Supply voltage range (Vcc) . Minimm input high voltage (VI ) . Maximm input tow voltage vILj Case operating temperature range (Tc) . pin grid array dual-in-line package square chip carrier squar

11、e chip carrier quad flat package -0.5 V dc to +7.0 V dc z/ 30 mA -65C to +150C 1.0 u I/ y +30Ooc See MIL-STD-1835 38“C/U s/ 35“C/V s/ 2O0C/W +150“C 4.5 V dc to 5.5 V dc 2.0 V dc 0.8 V dc -55OC to +125c - 1/ Stresses greater than those listed may cause permanent damage to the device. - 2/ VIL minimm

12、= -3.0 V for pulse width less than 20 ns. 3/ Raximm power dissipation can only be achieved by excessive I %/ Must withstand the added PD due to short circuit test; e.g., PL . - 5/ Uhen a thermal resistance value for this case is included in My?-STD-1835, that value or IO“. shall supersede the value

13、indicated herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-7 SMD-5b2-533 REV C E?! b 0061872 475 2. APPLICABLE DDCUIIENTS 2.1 Goverrment specification. standard, and bulletin. Unless otherwise specified, the following specification, standard,

14、and bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drauing to the extent specified herein. SPECIFICATION MIL I TARY Mi L-M-385 10 - Microcircuits, General Specification for. STANDARD MIL

15、ITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN Mi LI TARY NIL-BUL-103 - List of Standardized Military Drawings (SMDIS). (Copies of the specification, standard, and bulletin required by manufacturers in connection uith specifi

16、c acquisition fuictions should be obtained from the contracting activity or as directed by the contracting activity.) references cited herein, the text of this drawing shall take precedence. 2.2 Order of Precedence. In the event of a conflict betueen the text of this drawing and the 3. REPUIREMENTS

17、3.1 Item requirements. lhe individual item requirements shall be in accordance uith 1.2.1 of MIL-STD-883, lProvisions for the use of MIL-STD-883 in conjunction uith compliant non-JAN devices“ and as specified herein. 3.2 Design, construction. and Dhvsical dimensions. The design, construction, and ph

18、ysical dimensions shall be as specified in MIL-M-38510 and herein. 1, 2, and 3. 3.2.1 Case outline(s). The case outline(s) shall be in accordance uith 1.2.2 herein and as specified on figures 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 4. 3.2.3 3.3 Electrical

19、 performance characteristics. Unless otherwise specified herein, the electrical Block diagram. The block diagram shall be as specified on figure 5. performance characteristics are as specified in table I and shall apply over the full (case or ambient) operating temperature range. specified in table

20、II. 3.0 Electrical test reauirements. The electrical test requirements shall be the subgroups The electrical tests for each subgroup are described in table i. STANDARDIZED 5962-88533 MILITARY DRAWXNO DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OBI0 45444 )ESC FDRM 193A JUL 91 Provided by IHSNot for Re

21、saleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-88533 REV C L!B 9999996 0061873 301 M TABLE I. Electrical oerformance characteristics. r Test Input high voltage Input Lou voltage Input high current Input low current Output high voltage Output low voltage Off state (

22、high impedance) output current Output short circuit current s/ Quiescent power supply current (CMOS inputs) Symbol Conditions Group A Device Limits Unit subgroups types -55C 5 T 5 +125C vcc = 4.5 e to 5.5 v unless atherwise swcifid Min Max VI, Guaranteed input logical high 1,2,3 All 2.0 V VIL Guaran

23、teed input Logical low 1,2,3 All 0.8 IIH vcc 5.5 v, VIN = 5.5 v 1,2,3 All 10 FA IIL Vcc = 5.5 V, VIN = GND l,2,3 All -10 VOH vcc = 4.5 v, Io, = -300 1,2,3 ALI V - V voltage for all inputs 2/ voltage for all inputs 2/ 05 V IN = IH Or IL io, = -12 nd 1,2,3 01,02 2.4 06.07 IoH = -8 IM 1,2,3 03,04 2.4 0

24、5 VOL vcc = 4.5 v, IoL = 300 STANDARD1 ZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REmSIONLEvEL C 5962-88533 SHEFT 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SvD-5962-88533 REV C 0 9999996 0063874 248 TABLE

25、 1. Electrical performance characteristics - Continued. )E = low, SOU duty cycle VIH I 3.4 V, VIL - 0.4 V STANDARD1 ZED MILITARY DRAWINO DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-88533 A RENISIONLEVEL SHEET C 5 Test Conditions I/ -55C 5 T 5 +125”C vcc = 4.5 6 to 5.5 v mless othe

26、rwise specified ts Unit lax -I evice ypes Hin All Al 1 Al 1 AL 1 Al 1 ALI Al 1 AL l O1 ,O3 02 , 04 05,06 07 O1 ,O3 02,04 OS, 06 07 O1 ,O3 02.04 05,06 07 O1 ,O3 02,04 05,M 07 1.75 ml/ I input Puiescent input power supply current (per input at TTL high) 4J 5.5 v, VI)( = 3.4 v, e 1 O WHZ Dynamic power

27、supply cur rcn t CCD cc Total power supply current z/ $!puts open, Input Capacitance IN See 4.3.1 e/ 4 See 4.3.1 g/ 4 Output capacitance 1/0 capacitance OUT -110 tPD1 functional testing See 4.3.ld EL = 50 pF, see figure 6 Combinational delay, 1-4 Input: DATAo-3, output: 9,10,11 ns 30 28 22 “0 - 7 $

28、33 tPD2 - ERROR tPD3 tPD4 f WLT ERROR 24 18 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-88533 REV C U 9999996 0063875 I184 - TABLE I. Electrical performance characteristics - Continued. O1 ,O3 02,04, 05,06

29、07 O1 ,O3 02 , 04 05,06 07 O1 ,O3 02,04 05 , 06 07 O1 ,O3 02,04 07 05 , 06 Test 19 17 17 13 37 33 23 17 22 20 16 12 26 23 14 ia Combinational delay, 5-8 Input: CB (code ID 08;Ti) Mitput: STANDARD1 ZED SIIE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REvISIONLIEvErJ C “0-7

30、 5962-885 SHEEr 6 ERROR HULT ERROR Combination delay, 9-12 Input: CB (code ID 18i7 Output: “0-7 - ERROR L/ 8/ HULT ERROR I/ s/ combination delay, 13-16 Input: GENERATE Output: “0-7 HULT ERROR PD9 tPD1O tPD1 1 tPD12 tPD13 tPD14 Conditions -55C 5 T 2 +12SoC vcc 4.5 6 to 5.5 v mless otheruise swcified

31、CL = 50 pF, see figure 6 Group A iubg roups 9,10,11 1 Device1 types Min Lirits Max 07-04 I I 19 05,06 O1 -04 07 i I !i 05 , 06 07 I I ;: o1 ,o2 22 - o1 ,o2 O1 -04 O5 , 06 07 o1 ,o2 - 26 init ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted withou

32、t license from IHS-,-,- SND-5962-8B533 REV C 3 9999996 0061876 010 STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 TABLE I. SIZE 5962-88533 A REVISICNLEVEL SHEET C 7 Electrical wrformance characteristics - Continued. Test Conbinational delay, 17 Input: CORRECT (no

33、t internal control mode) Output: -.- Combinational delay, 18-2 Input: DIAG MCDEO (not interhal control mode) Output: scO-7 - ERROR MULT ERROR Combinational delay, 22-25 Input: CODE IDO,1 Output: “0-7 - ERROR MULT ERROR Syinbol PD17 PD18 PD 19 PD20 PD21 PD22 a PD23 I/ PD24 PD25 Conditions -55C 5 1 5

34、+125”C unless otherwise swcified vcc = 4.5 6 to 5.5 v :L = 50 pF, see figure 6 Group A ; not internal control mode 1 output: “0-7 DATAO. 3 1 - ERROR tPD29 tPD30 PO31 tPD32 r tPD33 STANDARD1 ZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 RJWISIONLEVEL C tPD34 MILT ER

35、ROR 5962-88533 SHEFT a I See footnotes at end of table. Gray, A tubgroups 9,10,11 Device types Uin 01-04 O5,06 07 01-04 D5,06 07 D1-04 D5,06 07 D1-O4 D5,06 07 D1-04 05.06 07 11 -06 07 31-04 35,06 07 11 -04 15,06 07 11 -04 )5,06 07 Provided by IHSNot for ResaleNo reproduction or networking permitted

36、without license from IHS-,-,-Test Cornbinational delay, 35-38 Input: Internal control (fim iaPcked to transparent) mode# LE 1 G Output: tPD35 t- tPD36 Svnaol - ERROR WLT ERROR Combinational delay, 39-42 Input: Internal controi de, DATAO- 2 (via diagnoszic latch) Output: “0-7 tPD39 - ERROR STANDARD1

37、ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I tPD40 SIZE 5962-88533 A REVISIONLEVEL SHEET C 9 I tPDO1 MULT ERROR IIpo42 Setup time 1 Hold time 1 Input: To: LEIN Setup time 2 Hold time 2 Input: CBo-7 To: LEIN See footnotes at end of table. Electrical Performance characte

38、ristics - Continued. Conditions 11 -55C T +125“C untess otherwise specified vcc = 4:s 6 io 5.5 v CL 50 pF, see figure 6 ietup and hold times relative :o latch enables :L = 50 pF, see figure 6 Group A ;EvEL SHEFT C 10 DESC FORM 193A ;TUL 91 Provided by IHSNot for ResaleNo reproduction or networking p

39、ermitted without license from IHS-,-,-SMD-5762-.533 REV C b OObL880 541 II TABLE 1. Electrical performance characteristics - Continued. lest Enable time 1 DisableLime 1 From: M BYTE0-3 To: DAlA0-31 Enable time 2 DisableJime 1 From: OEsc To: SCOe7 Minimm puise widths; g/ See footnotes on next page. S

40、ymbol teni dis1 ten2 tdis2 pw Conditions u -55OC 5 T 5 +125C mless otherwise specified vcc = 4.5 6 to 5.5 Y CL = 5.0 pF See figure 6 g/ o/ CL = 50 pF, see figure 6 Group A ; DH = Data duty cycle TTL high period (VIN = 3.8 V). Nl Nunber of dynamic inputs driven at TTL levels. fw = Operating frequency

41、 in megahertz. lhe capacitance measurements shall be made between the indicated terminal and ground at a frequency of 1 MHz, and lc = +25“C. The ac signal anplitude shall be less than 50 mV rms. Guaranteed to the limits specified herein for device types 03, 04, and 05. Guaranteed, if not tested, to

42、the limits specified herein. Output disable tests are performed with CL = 5.0 pF and are measured to 0.5 V change of output voltage level. lhe dc bias of the measuring instrunent shall be less than tD.1 V. STANDARD1 ZED 5962-88533 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444

43、 ESC FRM 193A JULI 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-88533 REV C 7777996 OObL Symbol I 882 31 Inches Mi 11 irneters 1 I I I 4111 STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE A El .

44、620 14.99 15.75 e L L1 P S SI s2 FIGURE 1. Case outline X. I SEATING PLANE REViSIoN LEVEL C 5962-88533 SHEET 13 DESC FDlW 193A m 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-57b2-88533 REV C ?3 9b Symbol O4 05 e h Hillimeters - 065 -120 1.6

45、5 3.05 -055 - o75 Inches Millimeter Hin Max Min Max .535 13.59 .430 REF 10.92 REF .O25 BSC 0.64 BSC .O40 REF 1.02 REF I 61 62 D O1 D2 Figure 2. .O08 .O14 0.20 0.36 . O08 .O24 0.20 0.61 .554 -566 14.07 14.38 .O80 REF 2.03 REF .400 BSC 10.16 BSC OObI1883 250 .O20 REF 0.51 REF 12 - o77 - 093 1.96 2.36

46、Case outline 2. STANDARDIZED 5962-8853: MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 )ESC FRM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-88533 REV C ?El b STANDARD1 ZED MILITARY DRAWING DEFENSE ELECT

47、RONICS SUPPLY CENTER DAYTON, OHIO 45444 NOTE : SIZE A Ell Lb Dimensions are in inches, BSC = Basic leed spacing between centers. I Figure 3. Case outline T. 5962-88533 REVISIONLEVEL SHEET C 1 15 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-596

48、2-88533 REV C E! b 0061885 O23 Case T “cc O24 oz3 Dz 03 0 22 o4 021 DI O20 IN 1 IDENTIFICATION O6 o 19 o7 018 08 017 GiiD “ cc 09 O16 010 “2 LE/Gl“MTE COWCT 011 012 014 ERROR O13 LEOIAC - 01s HULT EROR =I 6ND Zl 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 Figure 4. Terminal connections. STANDARD1 ZED 5962-88533 MILITARY DRAWINQ DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REViSIoN LENEL )ESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,