DLA SMD-5962-88546 REV B-1991 MICROCIRCUITS DIGITAL ADVANCED SCHOTTKY TTL SHIFT REGISTER MONOLITHIC SILICON《硅单片移位寄存器肖特基TTL促进数字微电路》.pdf

1、NOTICE OF REVISION (NOR) (See MIL-STO- 480 for instructions) This revision described below has been authorized for the document listed. Sheet 1: Kevisions ltr column; add “BI lievisions description column; add “Changes in accordance with tmrc 596249 15-9 1“. Revisions date coluirin; add “91-07-11“.

2、Revisions approved column; adCi signature of responsible individual accomplishing this revision. DATE (YYMMOOI Form Approved OMS No. 0704 - o i88 91-07-12 Sheet 4: Table I; Change VOL max limit from “0.5“ to “0.4“. Change LCC max limit from “72“ to “75“. b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR

3、GOVERNMENT KTHSSECTION FOR GOVERNMENT USE ONLY a. CHECKONE DATE (YYMMDO) SIGNATURE AND TITLE I NSTOOUN OF MAITLR DOCUMIIYT SHALL MAKE *sova RMSJON AND RICENLO IIFORt MANUFACTURER 0 REVISED WCUMINT MUST IC FunNiSn RNISfO DOCUMLNT TO: EXISllNG DOCUMIN1 SUPPCEMEWTED UY TH15 NM MAY IL USLD IN MANUFACNRL

4、. MAY INCORPO(UlZ THIS WWOE. DESC-ECS 12. ACTIVITY ACCOMPLISHING REVISION Branch Chief I 91-07-11 REVISION COMPLETED (Signdtufe) DATE (YYMMDO) I OD Form 1695, JUL 88 21s 2: Prevtous editions arc obsolete. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

5、-,-k - SMD-5962-546 REV B 59 9999996 0006432 1 LTR A T- -lLp-o? I DESCRIPTION * Made technical changes to 1.4. Added test condition A to 4.2 and 4.3.2, step 1. Added test circuit and switching waveforms. Editorial changes throughout. DATE (MI-MO-DA) APPROVU) 1989 AUG 15 STAN DARDIZEDE MILITARY DRAWI

6、NG THIS DRAWING IS AVAIL1 -LE FOR USE BY ALL DEPARWENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA I OF in A SHEET 1 I REVSoN LEVEL DESC FORM 193 riU.S.OOM(WAt(nPn“GOFfKt: lW7-748-lW11 5962-El451 SEP 87 DISTRIBUTION STATEMENT A, Approved lor public release; distribution is unlimited. Provide

7、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-59b2-54b REV B 59-1 9997996 0006433 3 E 1 1. &OPE 1.1 SCO e. This drawing describes device requirements for class B microcircuits in accordance dith l.&f MIL-STD-883, “Provisions for the use of MIL-STD-88

8、3 in conjunction with compliant non-JAN device& 1.2 Part number, The complete part number shall be as shown in the following example: L 7- I T i Lead finish per i- i Case outline i Drawing number Device type (1.2.1) (1.2.2) MIL-M-38510 1.2.1 Device type. The device type shall identify the circuit fu

9、nction as follows: Device type Generic number Circuit function o1 54F676 16-bi t serial/paral lel-i na serial-out shift regi stet 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and 1s follows: Outline letter Case outline K F-6 (24-lead, ,640 x.420“ x .090

10、“) flat acka e L 3 D-9 (24-lead, 1.280“ x ,310“ x .200), duay-in-qine package C-4 (28-termina1, ,460“ x ,460“ x .loo“), square chip carrier package 1.3 Absolute maximum ratings. Supply voltage range - - - - - - - - - - - - - - - - Input voltage range - - - - - - - - - - - - - - - - Maximum power dis

11、sipation (PD) L/ - - - - - - - - - Storage temperature range - - - - - - - - - - - - - Lead temperature (soldering, 10 seconds) - - - - - - Thermal resistance, junction-to-case (BJC) - - - - - Junction temperature (TJ) - - - - - - - - - - - - - 1.4 Recommended operating conditions. Supply voltage (V

12、cc) - - - - - - - - - - - - - - - - Case operating temperature range (TC)- - - - - - - - Minimum high level input voltage (V - - - - - - - Maximum low level input voltage VI? - - - - - - - Minimum setup time (ts): High or low, SI tom- - - - - High or low, Pn to IT- - - - - High or low, M to 7T - - -

13、 - - Low, 73 tow- - - - - - - - - -0.5 V dc to 17.0 V dc -1.2 V dc at -18 m4 to t7.0 V dc 396 mW -65C to +15OoC +3OO0C See IL-M-38510, appendix C 1175 C 14.5 V dc to t5.5 V dc -55 C to +125C 2.0 V dc 0.8 V dc 4 ns 3 ns 8 ns 12 ns withstand the added PD due to short circuit test, e,g., 10s. STANDARDI

14、ZED SIZE A 5962-88546 MILITARY DRAWING I DEFENSE ELECTRONICS SUPPLY CEMER AWN, OH10 45444 I RMWN LEVEL A I SHEET 2 iSC FORM 193A SEP a7 ii U. 9. GOVERNMENT PRIMING OFFICE: 1088-540-M Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I t f STAMDL3DIZED

15、MILITARY DRAWING - SMD-5762-54b REV B 57 E 777977b 0006434 5 E SIZE A : 5962-88546 . -. . . _- 2.1 Government specification, standard, and Illetin. Unless otherwise specified, the following specification, standard, and bitlletin pf the issue listed in that issue of the Department of Defense Index of

16、 Specifications and Standards sp.ecified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MI L-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITAR

17、Y MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. 1 references ci

18、ted herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of IIL-STD- nnd as sEsifi!d hirein. 3.2 D

19、esign, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MILrM-38510 and herei n. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure

20、 2. 3.2.3 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as Specified on figure 3. I rov s ons for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ DEFENSE ELECTRONICS SUPPLY CWR REVISION LEVEL SHEET DAYTON, OHIO 45444 A 3 U.S.QOVERNMENTP

21、RINTINQOFFICE1888648-801 ESC FORM 193A SEP a7 - P Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-L - SMD-59b2-854b REV B 57 977779b O006435 7 E TABLE I Electrical performance characteristics, Conditions 1/ I I I Group A I, I Limi.$s. , . I vin. I Ma

22、xL I 1 I -55C 25 V or 5 0.4 Y, and shall iot exceed 5.5 V or go less than 0.0 V. No inputs shall be floating. i/ A12 outputs shall be ested, produces the proper output state, the test shall be performed with each input being selected as the VIL maximum or VrH minimum .Input, Irr he case where only o

23、ne input at VIL maximum or VIH minimum 31 Not more than one output shal be tested t a time and the duration of the test shall not exceed 1 second. i/ Propagation deTay limits are based on single output switching. Unused outputs = 3,5 V or 2.7 V or open per function table, 4. Input pulse characterist

24、ics: PRR = 1-2, pulse width = 500 ns, tr = tf = 2.5 ns, duty cycle = 50 percent. FIGURE 3. Test circuit and switching waveforms. I STANDP SDIZED SIZE MILITARY DRAWING A 5962-88546 I DEFENSE ELECTRONICS SUPPLY CENTER RMCION LEVEL SHEET 7 DAYTON, OHIO 45444 A DESC FORM 193A t U 8 GOVEPNMEM FiNTiiM OFF

25、ICE. lQBB-548-9M SEP 87 - CP Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.2.4 Cilse outlJnesr, The case outllnes shall be in accordance wlth 1.2.2 herein. 5-3 Electrieal erfomance charaeteristicc, Unless otherwise specified herein, the electrica

26、l perfomnc cnarac!erictics are iS specitieu in table I and apply over the full case operating temperature range. specified in table II, The electrlcal tests for each subgroup are described Sn table I. 3.4 EJectrlal 333 requirements, The electrical test requirements shall be the subgroups 5.5 Markin

27、, Marking shall be in accordance with MIL4TD-883 (see 3.1 herein). The part shall be mark& the part number listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in MIL-BUL-103 (see 6.6 herein), in arder to-be listeaas an aiFhved source of sup ly in MIL-BUL-103

28、 (see 6.6 herein). The certificate of c6m liance submitted to DES-ECG pr!or to llsting as an a proved source of su ply shall affirm that !he manufacturers product meets the requirements of MfL-STD-883 (see 3.1 Rerein) and the requirements herein. herein) shall be provided wrth each lot of microcircu

29、its deljvered to this drawing. 3.6 Gertificate of comliance. A certificate of compliance shall be required from a manufacturer 3.7 Certificate .of cogforngnce, A certificate of conformance as required in MIL-STD-883 (see 3.1 3.8 Notification of change. Notification of change to DESC-ECC shall be req

30、uired in accordance with MIL-STD-883 (see xi herein). 3.9 Verification- and-review, DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facm 1 ty and appllcable requlred documentation. Offshore documentation shall be made available onshore at tho optlsn of the

31、 revlewwer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampljpection, Sampling and inspection rocedures shall be !n accordance with 4,2 Screenin section 4 of - - conduct. devices prior to quality conformance lnspectlon, The following additional criterla shall apply: ar Burn-in test, method 115 of MIL-STO-8

32、83, (1) Test condition A, D, E, or F using the clircult submitted with the certificate of compliance (see 3-6 hreln). (2) TA = +E?c, minimum. b. Interim and flnal electpica1 test parameters shall be as specified Yn table II hereln, except inbrim etectrlcaf parameter tests prtor to burn-In are option

33、al at the discretion af the manufacturer. 4.3 Quaiit conformance ins ection, Quallty conformance inspectSon shall be in accordance with o*to the extent specified in MfL-S!D-883 (see 3,l herein). Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be nethod 5005 0: M-3 inG!din

34、g grups A, B, C, and D inspections, The following additional rriterla shall apply. J Y Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SND-5962-546 REV B 59 9999996 0006440 O STANDA3DIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHI

35、O 45444 I L i SIZE A 5962-88546 REVISION LEVEL SHEET A 9 TABLE II. Electrical test requirements. I Subgroups I I MIL-STD-883 test requirements (per method I 1 5005, table 1) I I I 1 I I - I I I interim electrical parameters I I (method 5004) I I I I 1 Final electrical test parameters I 1*, 2, 3, 7,

36、8, I (method 5004) I 9, 10, 11 I I I I I I Group A test requirements I 1, 2, 3, 7, 8 I I (method 5005) I 9, 10, 11 1 I I I I I I Groups C and D end-point electrical arameters I I 1 (method 500g) I * PDA applies to subgroup 1. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herei

37、n. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 tests shall verify the truth table specified on figure 2. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test

38、 conditions, method 1005 of MIL-STD-883. (11 Test condition A, D, E, or F using the circuit submitted with the certificate of compl iance (see 3.6 herein) . (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STO-883. 5. PACKAGING 5.1 Packaging requirem

39、ents. The requirements for packaging shall be in accordance with IIL-M-38510 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SND-5962-B85Yb REV B 59 m 999999b OOObYYIi 2 m I SIZE A STANDARDIZED 6. NOTES 6.1 Intended use. Microcircuits conforming to

40、this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM applicatfon. When a military specification exists and the product covered by this drawing has been qualified for listing on QPL

41、-38510, the device specified herein will be inactivated and will not be used for new design, The QPL-38510 product shall be the preferred item for all applications, covired-dhSEXor-prepared specification or drawing. 6 2 Re laceability, Microcircuits covered by this drawing will replace the same gene

42、ric device 5962-88546 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-CTD-481 using DD Fom 1693, Engineering Change Proposal (Short Form).

43、 6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system appllcation requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for coordination and distribution of changes to the draw

44、lngs, Users of drawings covering microelectronics devices (FSC 5962) should contact bESC-ECC, telephone (513) 296-6022. 6.5 Comments. Comnents on this drawing should be directed to DESC-ECC, Dayton, Ohio 45444, or tel epho5?37?96-8525. 6.6 Approved source of su ly. An approved source of supply is li

45、sted in MIL-BUL-103, Additional sources will be a$ed to MIL-BUL-103 as they become available. The vendor listed in MIL-BUL-103 has agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-ECC. The approved source of supply listed below is for

46、 information purposes only and is current only to the date of the last action of this document. I I Vendor I Vendor I I Military drawing I CAGE I similar part I I part number f number I number L/ I I I I I I I I 5962-8854601KX I 18324 I 54F676/BKA I I I I I I I 18324 I 54F676/BLA I I I 5962-8854601L

47、X I I I I I I I 5962-88546013X I 18324 I 54F676/B3A I I I I I - i/ Caution. Do not use this number for item acquisition. Items acqufred to this number may not satisfy the performance requirements of this drawing, Vendor CAGE Vendor name number and address 18324 Signetics Corporation 4130 South Market Court Sacramento, CA 95834 I SHEET DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL DAYTON, OHK) 45444 A 10 )ESC FORM 193A SEP 87 t U. 8. BOVUINMENT PRINTING OFFICE: iW-550447 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-