DLA SMD-5962-88560 REV B-2006 MICROCIRCUIT MEMORY DIGITAL ECL 64-BIT RAM MONOLITHIC SILICON《硅单片64位内存发光数字存储微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R018-92 92-05-28 Michael A. Frye B Boilerplate update, part of 5 year review. ksr 06-11-21 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV B B B B B B

2、 B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED B

3、Y Michael A. Frye AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-11-01 MICROCIRCUIT, MEMORY, DIGITAL, ECL, 64-BIT RAM, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-88560 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E007-07 .Provided by IHSNot for ResaleNo

4、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 com

5、pliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88560 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device t

6、ype(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Access time 01 10545 64-bit (16 x 4) ECL RAM 18 ns 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Termi

7、nals Package style E GDIP1-T16 or CDIP2-T16 16-lead dual-in-line package F GDFP2-F16 or CDFP3-F16 16-lead flat package 2 CQCC1-N20 20-terminal square chip carrier package 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage ran

8、ge (VCC= 0.0 V)- -8.0 V dc to 0.0 V dc Base input voltage range (VCC= 0.0 V)- 0.0 V dc to -8.0 V dc Output source current (IO): Continuous - 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least four (4) minutes before the r

9、eading is taken. This method was used for theoretical limit establishment only. 2/ The high and low level output current varies with temperature, and can be calculated using the following formulas: IOH= (-2 V - VOH)/100 and IOL= (-2 V - VOL)/100. 3/ The DC rapid test forcing functions and limits are

10、 used for all DC testing. These limits are determined for each device type based on the power dissipation and package type. The rapid test (delta V) limits and forcing functions are skewed allowing rapid testing to be performed at standard temperatures without the addition of delta Ts. 4/ The minimu

11、m limits are included for design purposes only. If not tested, are guaranteed to the limits specified in TABLE I. 5/ Transition times if not tested are guaranteed to the limits specified in TABLE I. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (per method 5005, tab

12、le I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8A, 8B, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * indicates PDA applies to subgroups 1

13、 and 7. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 Device types All Case outlines E and F 2 T

14、erminal number Terminal symbol 1 Q1 NC 2 Q0 Q1 3 CS Q0 4 D1 CS 5 D0 D1 6 A3 NC 7 A2 D0 8 VEEA3 9 A1 A2 10 A0 VEE11 D2 NC 12 D3 A1 13 WE A0 14 Q3 D2 15 Q2 D3 16 VCCNC 17 WE 18 Q3 19 Q2 20 VCCPin description CS A0 A3 D0 D3 Q0 Q3 WE NC Chip select input Address inputs Data inputs Data outputs Write ena

15、ble input No connection FIGURE 1. Terminal connections. Input Output Mode CS WE Dn Qn Write “0“ L L L L Write “1“ L L H L Read L H X Q Disabled H X X L H = High voltage level L = Low voltage level X = Irrelevant Q = No change FIGURE 2. Truth table . Provided by IHSNot for ResaleNo reproduction or ne

16、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 Notes: 1. CL 5 pF. CLincludes probe and jig capacitance. 2. All input pulses have the following cha

17、racteristics: Duty cycle = 50 percent, tTHL= tTLH= 2.0 0.2 ns (20% to 80%) 3. VIH= -0.9 V and VIL= -1.7 V 4. Unused outputs are connected through 100 to -2 V. 5. Timing delays should be de-rated 30 ps/pF for capacitance loads up to 50 pF. FIGURE 3. Test circuit and switching waveforms. Provided by I

18、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 11 DSCC FORM 2234 APR 97 FIGURE 3. Test circuit and switching waveforms - Continued. Pr

19、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 12 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of com

20、pliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements

21、 of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA s

22、hall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of

23、the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance ins

24、pection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing activity upon request. The test

25、circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical

26、parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4

27、.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7, 8A, and 8B tests shall verify the truth table specified on figure 2 herein. 4.3.2 Groups C and D inspections. a. End-point elec

28、trical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing activit

29、y upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provide

30、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88560 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 13 DSCC FORM 2234 APR 97 5. PACKAGING 5.1 Packaging requirements. The requirement

31、s for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuit

32、s covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be acco

33、mplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be

34、used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-

35、0547. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. Provided by IHSNot for ResaleNo reproduction or

36、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 06-11-21 Approved sources of supply for SMD 5962-88560 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 an

37、d QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-3

38、8535. DSCC maintains an online database of all current sources of supply at http:/www.dscc.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-88560012A 0DKS7 3/ GEM17501Q2A 10545/B2AJC 5962-88560012C 0DKS7 GEM17501Q2C 5962-8856001EA 0DKS7 3/ GE

39、M17501QEA 10545/BEAJC 5962-8856001EC 0DKS7 GEM17501QEC 5962-8856001FA 0DKS7 3/ GEM17501QFA 10545/BFAJC 5962-8856001FC 0DKS7 GEM17501QFC 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead

40、finish is not listed, contact the Vendor to determine its availability. 2/ Caution: Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source. Vendor CAGE Vendor name number and ad

41、dress 0DKS7 Sarnoff, David Research Center 201 Washington Road Princeton, NJ 08540-6449 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-