DLA SMD-5962-88579 REV B-2009 MICROCIRCUIT HYBRID LINEAR FAST SETTLING VIDEO OPERATIONAL AMPLIFIER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate to most current format. 02-03-29 Raymond Monnin B Table II, add note to Group C end-point test parameters. -gz 09-06-16 Joseph D. RodenbeckTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET

2、REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Ray Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPR

3、OVED BY Michael A. Frye MICROCIRCUIT, HYBRID, LINEAR, FAST AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-11-30 SETTLING VIDEO OPERATIONAL AMPLIFIER AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-88579 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E352-09 Provided by IHSNot for

4、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class

5、 H hybrid microcircuits to be processed in accordance with MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-88579 01 X X Drawing number Device type

6、Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function VIO (TA= +25C) 01 HOS-050A Fast settling video operational amplifier 15 mV 02 HOS-060SH Fast settling vide

7、o operational amplifier 1.5 mV 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Can package 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3

8、Absolute maximum ratings. 1/ Supply voltage range (VS) 18 V dc Input voltage range 18 V dc Power dissipation (PD), TA= +25C . 1.5 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Thermal resistance, junction-to-case (JC). 12C/W

9、Thermal resistance, junction-to-ambient (JA) . 98C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance a

10、nd affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1

11、 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPEC

12、IFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Micro

13、circuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the e

14、vent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indi

15、vidual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class.

16、 The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device

17、for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connecti

18、ons. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. Provided by IHSN

19、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements

20、 shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor

21、similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each devi

22、ce type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon reques

23、t. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 a

24、nd herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 o

25、r as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test,

26、 method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs

27、, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are opti

28、onal at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE

29、I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA+125C VS= 15.0 V unless otherwise specified Group A subgroups Device type Min Max Unit 01 15.0 RS= 100 k, TA25C 1 02 1.5 1/ mV 01 18.5 Input offset voltage VIORS= 100 k, TA= -55C to +125C 2,3 02 5.0 mV Temperature coeffi

30、cient of input offset voltage VIOT TA= -55C to +125C 2,3 All 35 V TA25C 1 0.1 Input offset current IIOTA= -55C to +125C 2,3 All 25 nA TA25C 1 2.0 Input bias current IIBTA= -55C to +125C 2,3 All 50 nA TA25C 1 25 Supply current ICCTA= -55C to +125C 2,3 All 35 mA -SVRR V- = -12 V, (V+ = +15 V) V- = -18

31、 V 4,5,6 All 50 dB Supply voltage rejection ratio +SVRRV+ = +12 V, (V- = -15 V) V+ = +18 V 4,5,6 All 50 dB Large signal voltage gain AVS() VOUT= 10 V, RL= 200 4,5,6 All 80 dB VIN= 10 V, TA= +25C 4 60 Input voltage common mode rejection ratio CMRR VIN= 10 V, TA= -55C to +125C 5,6 All 55 dB See footno

32、tes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performan

33、ce characteristics - Continued. Limits Test Symbol Conditions -55C TA+125C VS= 15.0 V unless otherwise specified Group A subgroups Device type Min Max Unit Maximum output voltage swing VOPRL= 200 1,2,3 All 10 V Voltage gain AV RL= 200 f = 1.0 kHz 4,5,6 All 80 dB RL= 200, AV= 2 or -1, TA= +25C 4 All

34、230 V/s Slew rate SR RL= 200, AV= -1 TA= -55C to +125C 5,6 All 210 V/s AV= -1, RL= 200 TA= +25C 9 All 100 ns Settling time to 0.1% of final value tSETAV= -1, RL= 200 TA= -55C to +125C 10,11 All 120 ns 1/ For group C end-point tests, the maximum input offset voltage (VIO) limit for device type 02 is

35、3.5 mV. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Inches Millimeters Symbol

36、Min Max Min Min Notes A .148 .181 3.76 4.60 b .016 .019 .41 .48 1,5 b1.016 .021 .41 .53 1,5 D .595 .605 15.11 15.37 D1.545 .555 13.84 14.10 e .400 BSC 10.16 BSC 3 e1.200 BSC 5.08 BSC 3 e2.100 BSC 2.54 BSC 3 F .022 .030 .56 .76 k .026 .036 .66 .91 k1.026 .036 .66 .91 2 L .500 .560 12.70 14.22 1 L1- .

37、050 - 1.27 1 L2.250 - 6.35 - 1 45 BSC 45 BSC 3 NOTES: 1. All leads b applies between L1and L2. b1applies between L2and 0.500 (12.70 mm) from the reference plane. Diameter is uncontrolled in L1and beyond 0.500 (12.70 mm) from the reference plane. 2. Measured from the maximum diameter of the product.

38、3. Leads having a maximum diameter 0.019 (0.48 mm) measured in gauging plane 0.054 (1.37 mm) + 0.001 (0.03 mm) - 0.000 (0.00 mm) below the base plane of the product shall be within 0.007 (0.18 mm) of their true position relative to a maximum tab width. 4. The product may be measured by direct method

39、s or by gauge. 5. All leads: Increase maximum limit by 0.003 (0.08 mm) when lead finish A is applied. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE SUPPLY CENTER COLUMB

40、US COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device types All Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 V+ Ground Offset adjust* Offset adjust* Inverting input Non-inverting input No connection Ground V- V- Output V+ *These pins are for

41、connecting an optional offset adjust potentiometer. Recommended value is 10 k with center arm connected to +15 V. FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88579 DEFENSE

42、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2,

43、3, 4, 5, 6, 9 Group A test requirements 1, 2, 3, 4, 5, 6, 9, 10*, 11* Group C end-point electrical parameters 1/ 1,2,3 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. * If not tested, shall be guaranteed to the specified limi

44、ts of table I. 1/ As a minimum, for all Group C testing performed after June 16, 2009, manufacturers shall perform subgroups 1, 2, and 3 from the Group A electrical test table (Table C-Xa of MIL-PRF-38534). 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection

45、 (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 shall be omitted. 4.3.2 Group B inspection (PI)

46、. Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-8

47、83. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissi

48、pation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f