1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct dimension to case outline. Change table I IDDand IEElimits. Update format. Editorial changes throughout. Change to reflect MIL-H-38534 processing. 90-01-08 W. Heckman B Changes in accordance with NOR 5962-R140-97. 96-11-25 Kendall A. Cott
2、ongim C Update drawing to the current requirements of MIL-PRF-38534. 06-02-16 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY
3、CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Donald R. Osborne POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, QUAD, 12-BIT, DIGITAL TO ANALOG CONVERTER
4、 AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-02-02 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-88629 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E271-06Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUI
5、T DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and lead finishes are available and are
6、 reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-88629 01 X X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as f
7、ollows: Device type Generic number Circuit function 01 HS 9342 Quad, 12-bit, digital to analog converter 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CDIP2-T28, GDIP1-T28 28 Dual-in-l
8、ine 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Positive supply voltage range (VDD) . -0.3 V dc to +18 V dc Negative supply voltage range (VEE) +0.3 V dc to 18 V dc Input voltage, Bits 1-12, LBE, HBE, and 4-1CE (VIN) -0.3 V dc to (VDD+ 0.3
9、 V dc) Reference input voltage (VREF IN) . 20 V dc Power dissipation (PD) . 1.8 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambie
10、nt (JA) 30C/W 1.4 Recommended operating conditions. Positive supply voltage range (VDD) . +14.25 V dc to +15.75 V dc Negative supply voltage range (VEE) 14.25 V dc to -15.75 V dc Logic supply voltage range (VDD) . +4.25 V dc to +5.5 V dc Ambient operating temperature range (TA) -55C to +125C Provide
11、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, sta
12、ndards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybr
13、id Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780
14、 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the ev
15、ent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indiv
16、idual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for applicable device class. The
17、manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for t
18、he applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The ter
19、minal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.2.4 Truth table. The truth table shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performan
20、ce characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided
21、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking of device(s). Marking of device(s) shall be in
22、 accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall ma
23、intain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be mainta
24、ined under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (o
25、riginal copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this
26、drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein.
27、 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall
28、be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of
29、method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted wi
30、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C VDD= +15 V, VEE= -15 V, unle
31、ss otherwise specified Group A subgroups Device type Min Max Unit Resolution - 01 12 Bits Input high voltage VIH1/ 1,2,3 01 2.4 V Input low voltage VIL1/ 1,2,3 01 0.8 V Input current IIN0 V VIN VDD1,2,3 01 4.0 A Reference input voltage range VREF IN3/ 1,2,3 01 10 V Reference input impedance ZINTA= +
32、25C 3/ 4 01 1.2 3.8 k Reference output voltage error VETA= +25C 4/ 1 01 10.0 mV Reference output noise voltage VON Peak-to-peak wideband See 4.3.1d 4/ 9,10,11 01 200 V Reference output voltage drift TA= +125C, -55C 4/ 2,3 01 8.0 ppm/C Total available current IMAXIREF+ IEXT3/ 4/ 1,2,3 01 20 mA Curren
33、t available for external use IEXT3/ 1,2,3 01 12 mA Integral linearity error LE TA= +25C 5/ 1 01 0.5 LSB Integral linearity error drift TA= +125C, -55C 2,3 01 1.0 ppm/C Differential linearity error DLE Deviation of an output step from the theoretical value of 1 LSB for any two adjacent digital codes.
34、 TA= +25C 1 01 1.0 LSB Differential linearity error drift TA= +125C, -55C 2,3 01 1.0 ppm/C See footnotes at end of table. TVREFTLETDLEProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTE
35、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Unit Test Symbol Conditions -55C TA +125C VDD= +15 V, VEE= -15 V, unless otherwise specified Group A subgroups Device type Min Max Bipolar zero erro
36、r BZE Digital input code = 100000000000 TA= +25C 1 01 2.0 LSB Bipolar zero error drift TA= +125C, -55C 2,3 01 5.0 ppm/C Gain error AE Calculated: All 1s - All 0s - Theoretical value, TA= +25C 1 01 4.0 LSB Gain error drift TA= +125C, -55C 2,3 01 15 ppm/C Small signal, see figure 4 and 4.3.1d 3/ 9,10,
37、11 01 2.0 s Settling time to 0.012% tSFull signal, see figure 4 and 4.3.1d 3/ 9,10,11 01 5.0 s Slew rate SR TA= +25C 3/ 4 01 8.0 V/s LDAC to output change tLOSee figure 4 and 4.3.1d 3/ 9,10,11 01 300 ns VDD= +15 V 5.0% 6/ 1,2,3 01 35 mA Positive supply current IDDVDD= +15 V 5.0% 7/ 1,2,3 01 35 mA VE
38、E= -15 V 5.0% 6/ 1,2,3 01 35 mA Negative supply current IEEVEE= -15 V 5.0% 7/ 1,2,3 01 35 mA Functional tests See 4.3.1c 7,8 01 1/ Digital inputs must never exceed VDDor go below -0.3 V. 2/ Data must be stable before strobe (HBE, LBE, and LDAC) goes to 0. 3/ Guaranteed, but not tested. 4/ Measured w
39、ith REF OUT connected to REF IN. 5/ Integral linearity, for this product, is measured as the arithmetic mean value of he magnitudes of the greatest positive deviation and the greatest negative deviation from the theoretical value of any combination. 6/ Utilizing internal voltage reference. 7/ Applyi
40、ng external voltage reference to REF IN. TAETBZEProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 De
41、vice type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 Bit 1 (MSB) Bit 2 Bit 3 Bit 4 Bit 5 Bit 6 Bit 7 Bit 8 Bit 9 Bit 10 Bit 11 Bit 12 (MSB) CE1 CE2 CE3 CE4 HBE LBE VDD(+15 V) VEE(-15 V) Ground REF IN REF OUT VOUT1 VOUT
42、2 VOUT3 VOUT4LDAC FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97
43、FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 CE1CE1CE1CE1HBE LBE LDAC
44、Description 0 1 1 1 X 1 0 1 1 X 1 1 0 1 X 1 1 1 0 X 1 1 1 1 X 1 1 1 1 X 0 0 0 0 1 Enables 1st rank of DAC1 Enables 1st rank of DAC2 Enables 1st rank of DAC3 Enables 1st rank of DAC4 Load DACs 1-4 secondary register from primary registers 0 = Logic low level 1 = Logic high level X = Dont care Strobe
45、logic: Strobe 0 = Data latched (held) Strobe 1 = Data changing (transfer) FIGURE 3. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
46、REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 NOTE: Minimum common active time for CE and any byte enable is 250 ns. FIGURE 4. Timing diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88629 DEFENSE S
47、UPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 11 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*,2,3,
48、4,7,9 Group A test requirements 1,2,3,4,7,8,9,10*,11* Group C end-point electrical parameters 1,2,3,4,9 * PDA applies to subgroup 1. * See 4.3.1d 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-
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