DLA SMD-5962-88649 REV E-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED LOW POWER SCHOTTKY QUADRUPLE DIFFERENTIAL LINE RECEIVER MONOLITHIC SILICON《硅单片四倍差动线路接收器低功率肖特基促进双极化数字微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R118-92. 92-02-04 M. A. Frye B Changes in accordance with NOR 5962-R198-93 93-07-13 M. A. Frye C Incorporate revisions A and B N.O.R.s. Update drawing to current requirements. Editorial changes throughout. - dr

2、w 01-08-15 Raymond Monnin D Corrected generic number paragraph 1.2.1. -drw 02-10-04 Raymond Monnin E Update to reflect latest changes in format and requirements. Correction to figure 4. Editorial changes throughout. les 05-06-30 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACE

3、D. REV SHET REV SHET REV STATUS REV E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABL

4、E FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY, QUADRUPLE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-11-17 DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 596

5、2-88649 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E376-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234

6、APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88649 01 E X Drawing nu

7、mber Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 55ALS195 Quadruple differential line receiver with three-state outputs 1.2.2 Case outlines. The case

8、outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, a

9、ppendix A. 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc minimum to +7.0 V dc maximum Input voltage, A or B inputs . -15 V dc to +15 V dc Differential input voltage 1/ . -15 V dc to +15 V dc Enable input voltage -1.5 V dc to +7.0 V dc Low level output current 50 mA Storage temperatu

10、re range -60C to +150C Maximum power dissipation (PD) 2/ 192.5 mW Lead temperature (soldering, 60 seconds) . +260C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Supply voltage range (VEE) +4.5 V dc minimum to +5.5 V

11、 dc maximum Common mode input voltage (VCM) 7.0 V dc maximum Differential input voltage (VID) . 12.0 V dc High level input voltage (VIH) 2.0 V dc minimum Low level input voltage (VIL) . 0.8 V dc Maximum high level output current (IOH) . -0.4 mA Maximum low level output current (IOL) 16 mA Case tempe

12、rature range (TC) -55C to +125C _ 1/ Differential input voltage is measured at the noninverting input with respect to the corresponding inverting input. 2/ Maximum power dissipation is defined as VCCx ICC, and must withstand the added PDdue to short circuit test; e.g., IOS Provided by IHSNot for Res

13、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handboo

14、ks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Ma

15、nufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standa

16、rd Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a

17、conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual ite

18、m requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transit

19、ional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirement

20、s herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction

21、, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on f

22、igure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4 3.3 Electrical performance c

23、haracteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. T

24、he electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FOR

25、M 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitation

26、s, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ cer

27、tification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of c

28、ompliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appe

29、ndix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to

30、 review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

31、88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Positive-goi

32、ng threshold voltage VT+1, 2, 3 All 200 mV Negative-going threshold voltage VT-1, 2, 3 All -200 mV Enable input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA 1, 2, 3 All -1.5 V High level output voltage VOHVCC= 4.5 V, IOH= -0.4 mA 1, 2, 3 All 2.5 V IL= 0.8 V, ID= 200 mV Low level output voltage VOLVCC=

33、4.5 V, VIL= 0.8 V, IOL= 8 mA 1, 2, 3 All 0.45 V IH= 2.0 V, VID= -200 mV IOL= 16 mA 0.50 High impedance state output current IOZVCC= 5.5 V, VIL= 0.8 V, VID= -3.0 V, VOUT= 2.7 V 1, 2, 3 All 20 A ID= +3.0 V, VOUT= 0.5 V -20 Line input current IIOther input at 0.0 V VCC = 4.5 V, VIN= 15 V 1, 2, 3 All 1.

34、2 mA CC = 5.5 V, VIN= -15 V -1.7 High level enable input IIHVCC= 5.5 V VIH= 2.7 V 1, 2, 3 All 20 A current VIH= 5.5 V 100 Low level enable input current IILVCC= 5.5 V VIL= 0.4 V 1, 2, 3 All -100 A Input resistance RIVCC= 5.5 V 1, 2, 3 All 12 k Short circuit output current IOSVCC= 5.5 V VOUT= 0.0 V V

35、ID= 3.0 V 1/ 1, 2, 3 All -15 -130 mA Supply current ICCVCC= 5.5 V outputs disabled 1, 2, 3 All 35 mA Functional tests See 4.3.1c 7, 8 All See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

36、E A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min MaxPropagat

37、ion delay time tPLHVCC= 4.5 V to 5.5 V, 9 All 25 ns A, B to Y VID= -1.5 V to 1.5 V, 10, 11 35 tPHLCL= 15 pF, 9 All 23 ns See figure 4 2/ 10, 11 34 Output enable time, tPZHVCC= 4.5 V to 5.5 V, 9 All 28 ns A, B to Y CL= 15 pF, 10, 11 40 tPZLSee figure 4 2/ 9 All 27 ns 10, 11 40 Output disable time, tP

38、HZ9 All 30 ns A, B to Y 10, 11 40 tPLZ9 All 24 ns 10, 11 35 1/ Not more than one output shall be shorted at one time and the duration of the short circuit condition shall not exceed 1 second. 2/ Vendor may test with VCC= 5.0 V but must guarantee the 4.5 V to 5.5 V limits. Provided by IHSNot for Resa

39、leNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Device types 01 01 Case outlines E and F 2 Terminal number Terminal symbols T

40、erminal symbols 1 1B NC 2 1A 1B 3 1Y 1A 4 1, 2EN 1Y 5 2Y 1, 2EN 6 2A NC 7 2B 2Y 8 GND 2A 9 3B 2B 10 3A GND 11 3Y NC 12 3, 4EN 3B 13 4Y 3A 14 4A 3Y 15 4B 3, 4EN 16 VCCNC 17 - - - 4Y 18 - - - 4A 19 - - - 4B 20 - - - VCCNC = No connection FIGURE 1. Terminal connections. Differential input A - B Enables

41、 EN Output Y VID 0.2 V H H -0.2 V VID 0.2 V H I VID -0.2 V H L X L Z H = High voltage level L = Low voltage level X = Irrelevant I = Indeterminate Z = High impedance (off) FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

42、D MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic Diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

43、ZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

44、 A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. The input pulse is supplied by a generator having the following characteristics: PRR 1 mHz, duty cycle 50%, ZOUT= 50, tr 6 ns, tf 6 ns. 2. CLincludes probe and jig capacit

45、ance. 3. All diodes are 1N3064 or equivalent. FIGURE 4. test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88649 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43

46、218-3990 REVISION LEVEL E SHEET 11 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on a

47、ll devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the

48、 preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test re