DLA SMD-5962-88721 REV F-2013 MICROCIRCUIT LINEAR DUAL LOW NOISE OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add radiation hardened and class V requirements. - ro 00-04-13 R. MONNIN B Make change to AVOradiation hardened test limit as specified under table I. - ro 00-10-05 R. MONNIN C Add case outline D. Make changes to 1.2.4, 3.2.3, figure 1, and table

2、 IIA. Delete figure 2. - ro 03-03-21 R. MONNIN D Drawing updated to reflect current requirements. - rrp 05-11-09 R. MONNIN E Make changes to 4.4.4 and add 4.4.4.1. - ro 06-12-21 R. MONNIN F Update drawing to current MIL-PRF-38535 requirements. rrp 13-01-09 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS

3、DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY CHARLES E. BESORE DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY WILLIAM J. JOH

4、NSON THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, DUAL, LOW NOISE, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-10-17 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-88721

5、 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E147-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE

6、1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a

7、choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes M and Q: 5962 - 88721 01 P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish

8、(see 1.2.5) / / Drawing number For device class V: 5962 - 88721 01 V P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q an

9、d V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

10、1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OP-270A Dual, low-noise, precision, operational amplifier 02 OP-271A Dual, low-noise, high speed, operational amplifier 1.2.3 Device class designator. The device class de

11、signator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class Dev

12、ice requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 Provided by IHSNot for ResaleNo reproduction or networkin

13、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descript

14、ive designator Terminals Package style D GDFP1-F14 14 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolu

15、te maximum ratings. 1/ Supply voltage (VS) . 18 V Differential input voltage 2/ 1 V Differential input current 2/ . 25 mA Input voltage (VIN) Supply voltage Output short-circuit Continuous Storage temperature range -65C to +150C Lead temperature (soldering, 60 seconds) . +300C Junction temperature (

16、TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case D 150C/W Case P . 45C/W Case 2 . 35C/W 1.4 Recommended operating conditions. Supply voltage (VS) . 15 V Source resistance (RS) . 50 Ambient operating temperature range (TA) . -

17、55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 300 rads(Si)/s) 100 Krads(Si) 3/ _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ The

18、 inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise performance. If the differential input voltage exceeds 1.0 V, the input current should be limited to 25 mA. 3/ These parts may be dose rate sensitive in a space environment and may dem

19、onstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

20、UIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent

21、 specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method S

22、tandard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/

23、quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in thi

24、s document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the de

25、vice manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifi

26、ed herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in

27、accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the prep

28、aring and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full amb

29、ient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the

30、 manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for

31、device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The complia

32、nce mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEE

33、T 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIO1 01 75 V 2,3 175 M,D,P,L,R 1 01 200 1 02 200 2,3 400 Input offset current IIO

34、VCM= 0 V 1 All 10 nA 2,3 30 M,D,P,L,R 1 01 100 Input bias current IBVCM= 0 V 1 All 20 nA 2,3 60 M,D,P,L,R 1 01 1000 Input noise voltage 4/ EntfO= 1 Hz to 100 Hz, TA= +25C 7 01 80 nV RMS Input noise voltage 4/ 5/ density enfO= 1 kHz, TA= 25C 7 02 11 nV / Hz Large signal voltage gain AVOVO= 10 V, RL=

35、10 k 4 01 1500 V/mV 5,6 750 M,D,P,L,R 4 100 VO= 10 V, RL= 2 k 4 750 5,6 400 VO= 10 V, RL= 10 k 4 02 400 5,6 300 VO= 10 V, RL= 2 k 4 300 5,6 200 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

36、NG SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Ou

37、tput voltage swing 4/ VORL= 2 k 4,5,6 All 12 V Average input offset 4/ voltage drift TCVOSTA= 55C, +125C 2,3 01 1.0 V/C 02 2.0 Common mode rejection 4/ CMR VCM= 12 V 1 All 106 dB 2,3 100 Power supply rejection 4/ ratio PSRR VS= 4.5 V to 18 V 1 All 3.2 V/V 2,3 5.6 Supply current 6/ ISYNo load 1 All 6

38、.5 mA 2,3 7.5 M,D,P,L,R 1 01 6.5 Slew rate 4/ SR AVCL= +20, RL= 10 k, 7 01 1.7 V/s TA= +25C 02 5.5 1/ Unless otherwise specified VS= 15 V, RS= 50 . 2/ Devices supplied to this drawing meet all levels M, D, P, L, and R of irradiation however this device is only tested at the R level. Pre and post irr

39、adiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits f

40、or the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019. 4/ Not tested post irradiation. 5/ Guaranteed if not tested to the limit specified. 6/ ISYlimit = total for both amplifiers. Provided by IHSNot for ResaleNo reproduction or networking permitted with

41、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines D P 2 Terminal number Terminal symbol 1 NC OUT A NC 2 OUT A -IN A OUT A 3 -IN A +IN A NC 4 +IN

42、A -VSNC 5 NC +IN B -IN A 6 NC -IN B NC 7 -VSOUT B +IN A 8 NC +VSNC 9 +IN B - NC 10 -IN B - -VS11 OUT B - NC 12 NC - +IN B 13 NC - NC 14 +VS- NC 15 - - -IN B 16 - - NC 17 - - OUT B 18 - - NC 19 - - NC 20 - - +VSNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reprodu

43、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88721 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be re

44、quired from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The c

45、ertificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-

46、PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of ch

47、ange for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land an

48、d Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, a