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本文(DLA SMD-5962-88749 REV A-2011 MICROCIRCUIT LINEAR NEGATIVE REGULATOR FIXED 24-VOLT MONOLITHIC SILICON.pdf)为本站会员(吴艺期)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-88749 REV A-2011 MICROCIRCUIT LINEAR NEGATIVE REGULATOR FIXED 24-VOLT MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 11-02-15 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A

2、 PREPARED BY JOSEPH A. KERBY DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINE

3、AR, NEGATIVE REGULATOR, FIXED 24-VOLT, MONOLITHIC SILICON DRAWING APPROVAL DATE 90-08-20 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-88749 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E174-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

4、ARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, ap

5、pendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88749 01 X A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type

6、 Generic number Circuit function 01 7924A 1.0 A negative regulator, fixed 24 volt 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X MACY1-X3 3 TO-39 canY MBFM1-P2 2 TO-3 flange mount Z MBFM4-P2

7、 TO-66 flange mount1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Input voltage: Operating or output shorted to ground -40 V dc Transient . -50 V dc 1/ Power dissipation (PD): TC= +25C: Case X . 2 W Cases Y and Z . 20 W TA= +25C: Case X

8、 . 1.0 W Cases Y and Z . 4.3 W Junction temperature (TJ) . +150C 2/ Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C _ 1/ The -50 volt input rating refers to the ability of the regulator to withstand high line or transient condition without damage. Since the r

9、egulators maximum current capability is reduced, the output may fall out of regulation at high voltages under nominal loading. 2/ The device is protected by a thermal shutdown circuit which is designed to turn off he output transistor whenever the device junction temperature is in excess of +150C. P

10、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings.- continued. Thermal resistance

11、, junction-to-case (JC) : Case X . 15C/W Cases Y and Z . 3C/W Thermal resistance, junction-to-ambient (JA) : Case X . 120C/W Cases Y and Z . 35C/W 1.4 Recommended operating conditions. Input voltage range . -28 V dc to -38 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOC

12、UMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DE

13、FENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - Li

14、st of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of

15、 precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item r

16、equirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufactur

17、er who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make m

18、odifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is

19、 used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. T

20、he design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical perf

21、ormance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in

22、 table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the

23、 entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The comp

24、liance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of

25、 supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate

26、 of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawin

27、g. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provide

28、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Condi

29、tions 1/ -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Output voltage VOUTTA= +25C 1 01 -4.95 -5.05 V VIN= -28 V to -38 V 2/ 1,2,3 -4.85 -5.15 Line regulation 3/ 4/ VRLINEVIN= -27 V to -38 V 1 01 12 mV 2,3 25VIN= -30 V to -36 V 1 4 2,3 12Load regulation 3/

30、VRLOADIO= 5.0 mA to 1.5 A 5/ 1 01 20 mV 2,3 25IO= 250 mA to 750 m A 5/ 1 15 2,3 30IO= 5.0 mA to 500 mA 6/ 1 25 2,3 50Standby current drain ISCD1 01 1.9 mA 2,3 2.0 Standby current drain change with line ISCD(line) VIN= -28 V to -38 V 1,2,3 01 0.4 mA Standby current drain change with load ISCD(load) I

31、O= 5.0 mA to 1 A 1,2,3 01 0.4 mA Dropout voltage VDOVOUT= 100 mV, IO= 1.0 A 5/ 1,2,3 01 2.5 V VOUT= 100 mV, 6/ IO= 500 mA 2.5 Peak output current IO(pk)TA= +25C 5/ 1 01 1.5 3.3 A TA= +25C 6/ 0.5 1.7 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted w

32、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C Group A subgroupsDevice type Li

33、mits Unit unless otherwise specified Min Max Short circuit current 7/ IOSVIN= -35 V 5/ 1 01 1.2 A 2,3 2.8VIN= -35 V 6/ 1 0.7 2,3 2.0Ripple rejection VIN/ VOUTf = 120 Hz, VIN= -10 V 4 01 54 dB 5,6 8/ 52 Output noise voltage 8/ NOTA= +25C, f = 10 Hz to 100 kHz 7 01 40 V / Vrms Long term stability 8/ V

34、OUT/ t TA= +25C, t = 1,000 hours 7 01 75 mV 1/ Unless otherwise specified, VIN= -33 V and IO= 500 mA for cases Y and Z, and VIN= -33 V and IO= 100 mA for case X. Maximum test current for case X is 500 mA. 2/ For case X: IO= 5 mA to 500 mA, P 2 W. For cases Y and Z, IO= 5 mA to 1.0 A, P 20 W. 3/ Meas

35、urements are made at constant junction temperature and with low duty cycle. 4/ Minimum load current for full line regulation is 5.0 mA. 5/ For cases Y and Z only. 6/ For case x only. 7/ Short circuit protection is only assured up to VIN= -35 V. 8/ Guaranteed if not tested to the limits specified. Pr

36、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 FIGURE 1. Terminal connections. Provided by IHSNot for Resale

37、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be

38、 in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (

39、1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as appli

40、cable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacture

41、r. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Sub

42、groups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test

43、 circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spec

44、ified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for Resale

45、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88749 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in acco

46、rdance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 5*, 6*, 7* Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgr

47、oup 1. * Subgroups 5, 6, and 7 if not tested shall be guaranteed to the limits specified in table I. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.

48、2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system a

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