DLA SMD-5962-88751 REV C-2007 MICROCIRCUIT LINEAR TRIPLE RS-232 DRIVER RECEIVER MONOLITHIC SILICON《硅单片三倍RS-232驱动器 接收器线性微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R014-91. 91-10-01 M. A. Frye B Changes in accordance with N.O.R. 5962-R066-93. 93-01-11 M. A. Frye C Incorporate N.O.R. rev. A and rev. B. Update to current requirements. - drw 07-02-02 Joseph Rodenbeck THE

2、ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43218-3990 http:/www.d

3、scc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, TRIPLE RS-232 AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-01-29 DRIVER/RECEIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-88751 SH

4、EET 1 OF 8 DSCC FORM 2233 APR 97 5962-E245-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. S

5、COPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88751 01 V A Drawing number Device

6、 type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 LT1039 Triple RS-232 driver/receiver with shutdown and bias 02 LT1039-16 Triple RS-232 driver/receiver 1.2.2 C

7、ase outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line V GDIP1-T18 or CDIP2-T18 18 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix

8、A. 1.3 Absolute maximum ratings. Supply voltage, driver (V+, V-). 16 V dc Supply voltage, receiver (VCC) . +7.0 V dc Logic input voltage range. V- to +25 V dc Receiver input voltage . 30 V dc Off-On input voltage range 0 V dc to +12 V dc Driver output voltage range V- + 30 V dc to V+ - 30 V dc Outpu

9、t short circuit duration. indefinite Storage temperature range -65C to +150C Power dissipation (PD) . 1.0 W 1/ Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC). See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 100C/W Junction temperature (TJ) +150

10、C 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C _ 1/ Above TA= +50C, derate linearly at 10 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SU

11、PPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless other

12、wise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-

13、1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assis

14、t.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in t

15、his document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Pr

16、oduct built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan an

17、d qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN

18、as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A an

19、d herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics

20、 are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall

21、 be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of no

22、t marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-P

23、RF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 AP

24、R 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxDRIVER SECTION 1/ Output voltage swing VOPPRL= 3.0 k to ground Positive 1, 2, 3 All V+ - 0.4 V Negative V- + 1.5 Logic high input vol

25、tage VINVOUT= low 1, 2, 3 All 2.0 V Logic low input voltage VILVOUT= high 1, 2, 3 All 0.8 V Logic high input current IIHVIN= 2.0 V 1, 2, 3 All 20 A Logic low input current IILVIN= 0.8 V 1, 2, 3 All -20 A Output short circuit current 2/ IOSVOUT= 0.0 V Sourcing current 1, 2, 3 All 5.0 mA Sinking curre

26、nt -5.0 Output leakage current (shutdown) IO(SD)VOUT= 18 V, VIN= 0.0 V 3/ 1, 3 All 200 A VOUT= 18/-11.5 V, VIN= 0.0 V 3/ 2 500 Supply leakage current (shutdown) ICC(SD)3/ 1, 2, 3 All 100 A Supply current ICCVOUT= low 1, 2, 3 All 8.0 mA Slew rate SR RL= 3.0 k, CL= 51 pF 4 All 4.0 30 V/s 5, 6 1. 32 Pr

27、opagation delay time driver input to output tPHL, tPLH4/, 5/ 9, 10, 11 All 800 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

28、OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxRECEIVER SECTION 6/ Input high threshold voltage VTHVOUT= low 1

29、, 2, 3 All 2.8 V Input low threshold voltage VTLVOUT= high 1, 2, 3 All 0.5 V Hysteresis VHYS1, 2, 3 All 0.1 1.0 V Output high voltage VOHIOUT= 160 A 1, 2, 3 All 3.5 V Output low voltage VOLIOUT= -1.6 mA 1, 2, 3 All 0.5 V Output short circuit current 2/ IOSSinking current, VOUT= VCC1, 2, 3 All -10 mA

30、 Sourcing current, VOUT= 0.0 V 1, 2 0.5 3 0.4 Output leakage current (shutdown) IO(SD)0.0 V VOUT VCC, VIN= 0.0 V 3/ 1, 2, 3 All 10 A Supply leakage current (shutdown) ICC(SD)3/ 1, 2, 3 All 100 A Supply current ICCVOUT= low 1, 2, 3 All 8.0 mA Off-On pin current I OFF-ON 0.0 V V OFF-ON 5.0 V 1, 2, 3 0

31、1 -15 80 A Propagation delay time receiver input to output tPHL, tPLH4/, 5/ 9, 10, 11 All 800 ns 1/ For device type 01, V+ = +12 V, and V- = -12 V, and for device type 02, V+ = +12 V, V- = -12 V, V OFF-ON = 5.0 V unless otherwise specified. 2/ Not more than one output should be shorted at a time and

32、 duration of short-circuit condition shall not exceed one second. 3/ For device type 01, V OFF-ON = 0.2 V for TA + 100C and 0.2 V for TA 100C. 4/ Propagation delays are measured from the 50% point of the input to 10% of output. 5/ Guaranteed, if not tested, to the limits specified. 6/ For device typ

33、e 01, VCC= 5.0 V, V OFF-ON = 2.5 V, and for device type 02, VCC= 5.0 V, unless otherwise specified Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-399

34、0 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device types 01 02 Case outlines V E Terminal number Terminal symbol 1 V+ V+ 2 BIAS REC1 IN 3 REC1 IN TR1 OUT 4 TR1 OUT REC2 IN 5 REC2 IN TR2 OUT 6 TR2 OUT REC3 IN 7 REC3 IN TR3 OUT 8 TR3 OUT V- 9 V- GND 10 GND TR3 IN 11 TR3 IN REC3 OUT 12 REC3 OUT TR

35、2 IN 13 TR2 IN REC2 OUT 14 REC2 OUT TR1 IN 15 TR1 IN REC1 OUT 16 REC1 OUT VCC 17 Off-On - - - 18 VCC- - - FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY C

36、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of complian

37、ce submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A

38、shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review

39、 the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screenin

40、g. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be m

41、aintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 101

42、5 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test

43、requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6, 9*, 10*, 11* Groups C and D end-point electrical parame

44、ters (method 5005) 1 * PDA applies to subgroup 1. * Subgroups 9, 10, and 11 guaranteed, if not tested to the limits specified in table I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88751 DEFENSE SUPPLY CE

45、NTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.

46、 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditi

47、ons, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biase

48、s, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design appl