DLA SMD-5962-88776 REV C-2004 MICROCIRCUIT HYBRID LINEAR 8-BIT FLASH ANALOG TO DIGITAL CONVERTER《硅单片8位快闪记忆体类比数位转换器线性混合微电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Made corrections in table I. Editorial changes throuhout. 91-05-03 W. Heckman B Change to VCCin paragraph 1.4 and table I. 99-05-13 K. A. Cottongim C Added new source of supply, (Satcon) with cage code 27851. Made corrections to table I for the i

2、nput high current and gain error tests. Updated drawing to reflect the latest requirements of MIL-PRF-38534. -sld 04-01-20 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 1

3、2 13 14 PMIC N/A PREPARED BY Steve Duncan STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil APPROVED BY William K. Heckman DRAWING APPROVAL DATE 90-07-23 MICROCIRCUIT, HYBRID, LINEAR, 8-BIT, FLASH, ANALOG TO DIGITAL CO

4、NVERTER SIZE A CAGE CODE 67268 5962-88776 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL C SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E112-04 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provid

5、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requir

6、ements for class H hybrid microcircuits in accordance with MIL-PRF-38534. 1.2 PIN. The PIN shall be as shown in the following example: 5962-88776 01 X X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circu

7、it function as follows: Device type Generic number Circuit function 01 HS1068, SP-2069 A/D converter, 8-bit flash 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Dual-in-line

8、1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) . +0.5 V dc to +7.0 V dc Negative supply voltage (VEE) -7.0 V dc Digital input voltage +5.5 V dc Analog input voltage. 5.5 V dc Reference voltage 2.2 V dc A

9、pplied output voltage 5.5 V dc Power dissipation (TC= +125C) 3.0 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Junction temperature (TJ). +150C Thermal resistance, junction-to-case (JC). 40C/W 1.4 Recommended operating conditions. Positive supply voltage r

10、ange (VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage range (VEE) -4.9 V dc to -5.5 V dc Analog ground voltage range (VAGND). -0.1 V dc to +0.1 V dc Digital input high voltage (VIH) 2.0 V dc minimum Digital input low voltage (VIL) 0.8 V dc maximum Applied output voltage (VO) VCCRBOTadjustmen

11、t range (RADJ). 0.2 V 2/ Convert pulse width low (tPWL) 18 ns minimum Convert pulse width high (tPWH) 22 ns minimum Maximum clock frequency (fCLK). 20 MHz minimum Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum ratings may cause permanent damage to the de

12、vice. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Operation is possible down to RBOT= -1.1 V with reduced dynamic performance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

13、NG SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent

14、 specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microci

15、rcuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Mi

16、crocircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.). 2.2 Order of precedence. In the event of a conflict between the text of t

17、his drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for

18、 device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections he

19、rein may not be performed for the applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the a

20、pplicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections

21、. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram(s). The block diagram(s) shall be as specified on figure 3. 3.2.4 Output coding table(s). The output coding table(s) shall be as specified on figure 4. 3.2.5 Timing diagram(s). The timing diagram(s) shall be as specifi

22、ed on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance charact

23、eristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. Th

24、e electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addi

25、tion to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should incl

26、ude a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate o

27、f compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A cert

28、ificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manuf

29、acturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1)

30、Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation,

31、as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests

32、prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 5 DSC

33、C FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC+125C +4.75 V dc VCC +5.25 V dc -4.9 V dc VEE -5.5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Resolution RES 1,2,3 01 8.0 Bits 1 -0.5 +0.5 Integral linearity error

34、 ELI DC, best straight line 2,3 01 -1.0 +1.0 LSB Differential linearity error EDIDC 1,2,3 01 -0.75 +0.75 LSB Code size CS 4,5,6 01 25 175 % 4 7.0 Full power bandwidth FPBW No spurious codes 5,6 01 5.0 MHz Range amplifier 1/ bandwidth RABW 4,5,6 01 100 kHz Range amplifier settling time tS One volt st

35、ep at RBOT 9,10,11 01 50 s Maximum conversion rate fSVCC= +4.75 V, VEE= -4.9 V 9,10,11 01 20 MHz Sampling time offset 1/ tSTOVCC= +4.75 V, VEE= -4.9 V, See figure 5 9,10,11 01 10 ns Digital output delay 1/ tD VCC= +4.75 V, See figure 5 9,10,11 01 15 28 ns CONV pulse width, low 1/ tPWL VCC= +4.75 V 9

36、,10,11 01 18 ns CONV pulse width, high 1/ tPWHVCC= +4.75 V 9,10,11 01 22 ns NMINV, NLINV -2.8 OE -0.4 Input low current IIL CONV 1,2,3 01 -0.8 mA NMINV, NLINV -1340 50 OE 20 Input high current IIHCONV 1,2,3 01 70 A Input low voltage 1/ VIL 1,2,3 01 0.8 V Input high voltage 1/ VIH1,2,3 01 2.0 V Analo

37、g input resistance 1/ RIN 4,5,6 01 1.0 k Output leakage current, logic low ILOL 1,2,3 01 -20 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMB

38、US COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC+125C +4.75 V dc VCC +5.25 V dc -4.9 V dc VEE -5.5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit

39、Output leakage current, logic high ILOH 1,2,3 01 20 A Output voltage low VOL IOL= 12 mA 1,2,3 01 0.4 V Output voltage high VOHIOH= -1.0 mA 1,2,3 01 2.4 V Output short circuit current 1/ IOS VCC= +5.25 V, Output high 1,2,3 01 -30 -130 mA Reference voltage VREF VREFoutput 1,2,3 01 1.18 1.26 V Referenc

40、e regulation VREF1200 , VREFto GND, 0 to 1 mA load 1,2,3 01 -6.3 6.3 mV 1 150 Digital supply current, static ICC VCC= +5.25 V, 1.1 MHz FS input, one LSTTL load, dc input, output codes = low 2,3 01 200 mA 1 290 Analog supply current, static IEEVEE= -5.5 V, 1.1 MHz FS input, one LSTTL load, dc input,

41、output codes = low 2,3 01 340 mA 4 -3.4 -1.0 Input amplifier frequency response Full scale, 20 MHz input signal 5,6 01 -4.0 -1.0 dB Gain error GE Zero to full scale 1,2,3 01 -1.0 +1.0 % 1 -5.0 +5.0 Bipolar offset error VOS1 Midscale input 2,3 01 -6.0 +6.0 LSB 1 -5.0 +5.0 Unipolar offset error VOS2Lo

42、wscale input 2,3 01 -6.0 +6.0 LSB 4 45 1.1 MHz input 5,6 43 9.7 MHz input 4 32 Signal-to-noise ratio rms signal/rms noise and distortion SNR 8.1 MHz input 5,6 01 32 dB 1/ Parameter shall be tested as part of device characterization and after design and process changes. Parameter shall be guaranteed

43、to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 7

44、 DSCC FORM 2234 APR 97 Case outline X. Inches mm .010 0.25 .018 0.46 .030 0.76 .100 2.54 .185 4.70 .250 6.35 .295 7.49 .600 15.24 .795 20.20 1.370 34.80 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless otherwise specified, tolerance is .005

45、(0.13 mm). 4. Standoffs are optional at discretion of the manufacturer. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-500

46、0 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal Function number symbol 1 REF Refrerence output 2 RANGE Gain adjust input 3 RBOT Test point 4 VEE Negative supply voltage 5 NMINV Not most sigificant bit invert 6 VCC Positive supply voltage 7 FS Full scale low, o

47、verflow detector 8 OE Output enable 9 D1 (MSB) Data bit 1 10 D2 Data bit 2 11 D3 Data bit 3 12 D4 Data bit 4 13 D5 Data bit 5 14 D6 Data bit 6 15 D7 Data bit 7 16 D8 (LSB) Data bit 8 17 ZS Zero scale, underflow detector 18 DGND Digital ground 19 CONV Convert 20 NLINV Not least significant bits inver

48、t 21 AOUTTest point (amplifier output) 22 AGND Analog ground 23 AIN Analog signal input 24 OFFSET Offset adjust FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88776 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Block diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAN