DLA SMD-5962-89446-1991 MICROCIRCUIT DIGITAL CMOS 8-BIT VARIABLE LENGTH SHIFT REGISTERS MONOLITHIC SILICON《硅单片8位可变长度移位寄存器互补型金属氧化物半导体数字微电路》.pdf

1、SMD-5962-87446 59 9999996 0004643 4 REVISIONS P STAN DAR DI ZED MILITARY DRAWING THIS DRAWING IS AVAILABLE OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA iSC FORM 193 SEP 87 DEENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT VARIABLE

2、LENGTH SHIFT REGISTERS, MONOLITHIC SILICON SIZE CAGE CODE I 5962-89446 A I 67268 SHEET 1 OF 12 5962-E05 DISTRIRUTION STATEMENT A. Approved for public release; dislrlbullon Is unlimlled. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-89446 5

3、9 M 9999996 0004644 6 1, SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Pravicions for the use of MIL-STD-883 in conjunction with compliant non-JAN devi ces“. 1.2 Part or Identifying Number (PIN). The complete PIN shall

4、 be as shown in the following example: 5962-89446 o1 L X I .I - - Lead finish per Drawing number Device type Case outline (1.2.1) (1.2.2) MIL-M-38510 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function o1 02 TMC201 IV T

5、MC2111V 30 MHz, CMOS 8-bit variable-length (3-18 stages) shift register 30 MHz, CMOS 8-bit variable-length (1-16 stages) shift register 1.2.2 Case outLineW. The case outline(c1 shall be as designated in appendix C of MIL-M-38510, and as follows: Outline letter Case outline L 3 D-9 (24-lead, 1.280“ x

6、 .310“ x .200“), dual-in-line package C-4 (28 terminal, .460“ x .460“ x .loo“), square chip carrier package 1.3 Absolute maximum ratings. Supply voltage range - - - - - - - - - - - - - - - - - Input voltage range - - - - - - - - - - - - - - - - - Applied output voltage range I/ - - - - - - - - - - -

7、 Forced output current range 2/ - - - - - - - - - - - - Output short circuit duration 3/ - - - - - - - - - - - Power dissipation, unloaded (P ) 4/ - - - - - - - - - Lead temperature (soldering, 18 seconds) - - - - - - - Thermal resistance, junction-to-case (OJc) - - - - - - Junctian temperature (TJ)

8、 - - - - - - - - - - - - - - -0.5 V dc to +7.0 V dc -0.5 V dc to VDp t 0.5 V dc -0.5 V dc to V + 0.5 V dc -3.0 mA to +6.hDm 1 .O secand 330 mW +300C See MIL-M-38510, appendix C +175“C - I/ Applied voltage must be current limited ta specified range and measured with respect to ground. - 2/ Forcing vo

9、ltage must be limited to specified rqnge. - 3/ Applies ta a single output in high state to ground. - 4/ Must withstand the added PD due to short circuit test; e.g., Ios. STANDARDIZED 5962-89446 MILITARY DRAWING DEFENSE ELECCTRONtCS SUPPLY CEMER DAYTDN, Hi0 45444 ;C FORM 193A :P 87 Provided by IHSNot

10、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-1.4 Recommended operating conditions. Supply voltage range (V D) - - - - - - - - - - - - - - Clock pulse width, LOW ItpWL) - - - - - - - - - - - - Clock pulse width, HIGH (tpWH) - - - - - - - - - - - - Data input setup t

11、ime (t,) see figure 1: Data input hold time (tH) see figure 1 - - - - - - - - Input LOW voltage (V ) - - - - - - - - - - - - - - - input HIGH voltage dLH) - - - - - - - - - - - - - - - Input HIGH voltage, clock (VIHC) - - - - - - - - - - - Output LOW current (ioL) - - - - - - - - - - - - - - Output

12、HIGH current (IOH) - - - - - - - - - - - - - - Operating case temperature range .(TC) - - - - - - - - Device type 01 Device type 02 - - - - - - - - - - - - - - -_ - - - - - - - - -_ - - 2. APPLICABLE DOCUMENTS 4.5 V dc to 5.5 V dc 12 ns minimum 12 ns minimum 10 ns minimum 12 ns minimum 3 ns minimum

13、0.8 V dc maximum 2.0 V dc minimum 2.4 V dc minimum 4.0 mA maximum -2.0 mA minimum -55OC to t125“C 2.1 Government specif,ication, standard, and bulletin. Unless otherwise specified, the following specification, standard, and bulletin of the issue listed in that issue of the Department of Defense inde

14、x of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILIT

15、ARY MIL-BUL-103 - List of Standardized Military Drawings (SMDIS). (Copies of the Specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity, 1 2.2 Order

16、of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS r 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the

17、use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. STANDARDIZED SIZE a MILITARY DRAWING DEFENSE ELECTRWICS SUPPLY CEMER AMSKHILEWL CHEET I AYTN, OCIO 45444 3 . u I Qovcc*cyyrn Cf?m (YUIDY? SC FORM 193A EP a7 Provided by IHSNot for ResaleNo reproduction or netw

18、orking permitted without license from IHS-,-,-SMD-59b2-8944b 59 9999996 0004b4b T TANDARDIZED MILITARY DRAWING Dff EUSE ELECTnONCS SUPPLY CENE DAMON, OHIO 45844. 3.2 Design, construction. and physical dimensions. The design, construction, and physicat dimensions chat C be as specified, in MIL-M-3854

19、0 ancf herein. 3.2.1 Case aut:hDne(sE. The case outline(s. shebl be in accordance wlth 1.22 fieretni. 3.2.2 TeFIIlinal connections. 3.2.3 Functional block diagrams. The terminal connections sheC1 be as specified on figure 2. The functional block diagrams shall be. as specifted on figure 3. specified

20、 on figure 4. 3.2.4 Procramming length controls. The operation of the programming LengBh. controls shall! be as 3.3 Electrical performance characteristics. Unless otherwise specified: herein, the electrical performance characteristics are as specified in table L and shall apply over the full- case o

21、perating temperature range. 3.4 Electrical fest requirements. The electrical test requirements shaLI be rhe subgroups specified in table IL. The electrical tests for each subgroup are described in table 1. 3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall

22、be marked with the PIN listed in 1.2 herein. listed in MIL-BUL-103 Csee 6.7 herein). In addTtion, the manuFacturers PIN may EFLCO be marked as. 3.6 Certificate OF compliance. A certfficate of compliance shall be required from a manufacturer in order to be Listed as an approved. source of supply in M

23、rL-BUL-103 Csee 6.7 herein). the certificats of compliance submitted to DESC-ECC prior to Listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-STR-883 (see 3.1 herein) and the requirements herein. 3.7 Certificate of confoPmance. A certific

24、ate of conformance as required in MIL-STD-883 (see 3.1 herein) shalL be prouided with each lot of microcircuits delivered tu this drawing. 3.8 Notification of change. Notification of change to DESC-ECC shall be required irr accordance dth MIL-STD-883 (see 3.1 herein). 3.9 Verification and review. DE

25、SC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. be made available onshore at the option of the reviewer. Offshore documentation shall 4. QUALITY ASSURANCE PROVISIONS 4.1 SampLing.and inspection. Sampling and in

26、spection procedures shall be. in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 5.1 herein). 4.2 Screening. Screening shall be. in accordance with.method 5004 of MIL-ST-883, and shall be conducted on all devices prior to quality conformance inspection. shall app

27、ly: The following additional criteria a. Burn-in test, method 1015 of Mil-ST-883. , (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125“C, minimum. Interim and. final electrical test parameters shall be as specified in table

28、 II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. b. 5962-89446 CITE A“ AEwsK)(LEVEL SHm 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i t TABLE I. Electrical performance ch

29、aracteristics. Test I I jymbol Conditions Devi ce unless otherwise specified -55OC 5 Tc 5 +125 C qui escent supply current Dynamic supply current Input 1 ow current Input high current Output low voltage Output high voltage Short circuit output 2/ current Input capacitance f = 20 MHz 1 -1 f = 25 MHz

30、I f = 30 MHz I/ I I See footnotes at endpf Table. CIN f = 1.0 MHz, see 4.3.lb Group A . Limits ubgroups Min Max 1,2,3 5 40 50 60 -10 +10 0.4 2.4 -50 4 10 Init - mA mA SIZE 5962-89446 STANDARDIZED MILTTARY DRAWING A SHEET DEFENSE ELECTRONICS SUPPLY CENTER DAlN. OHIO 45444 -. . SEP 87 Provided by IHSN

31、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_ SMD-5962-87446 59 M 9999996 8004648 3 E TABLE I. Electrical performance characteristics - Continued. Test Output capacitance Functional testing Maximum clock rate s/ i/ Digital output delay time - 3/ Digital output h

32、old time - 3/ Symbol I Condi ti ons I -55C TC 5 +12SC I unless otherwise specified I I COUT ITA = 2SoC, f = 1.0 MHz I see 4.3.lb I l )See 4.3.1 fCLK IVDD = 4.5 v tD IVDD = 4.5 v I I ISee figure 1 I I tHO IVDD = 5.5 v ISee figure 1 I Device 1 Group A i Limits Unit type Isubgroups) Min I Max I I I III

33、 I III - I/ Tested initially and at process and design changes. limits specified in table I. - 2/ Not more than one output shall be shorted at a time for a maximum duration of I second. - 3/ All transitions are measured at a 1.5 V level. during functional testing, and V - 4/ Not directly tested, but

34、 verifiefdwing functional tests by operating the device at the specified frequency. Thereafter guaranteed, if not tested, to the Inputs are driven at VIL = 0.4 V and VIH = 2.4 V = O V and VI, = 3.0 V during dynamic testing. 43 Quality conformance inspection. Quality conformance inspection shall be i

35、n accordance with method 5005 of MIL-STD-883 including groups A, 6, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspecticzn. a. Tests shall be as specified in table II herein. b. Subgroup I, (GIN and COUT measurements) shall be measured only for the initial tes

36、t and after process or design changes which may affect input capacitance. A minimum sample size of five devices with zero rejects shall be required. c. Subgroups 7 and 8 shall consist of verifying the functionality of the device. form a part of the vendors test tape andshall be maintained and availa

37、ble from the approved source of supply. These tests I I I 5962-89446 WE A STANDARDIZED MICTTARY DRAWING SHEET DEFENSE ELECTRONICS SUPPLY CEMER REVISKH( LEVEL DAWON, OH0 45444 6 u 8 QOv*rmyW mr(Mi0 OCFICL Oa0.$47 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitt

38、ed without license from IHS-,-,-Timing diagram (preset length controls) I I II I CLK DATA N+L+1 I DATA, DATA Il O7-0 .I N+L-1 L3-0 MC I CONTROLS ItHk II TJHT 1x1 NA? DATA II O7-0 N NOTE: L IS 007-4 LENGTH FROM FIGURE 4. Length control operation CLK IIEVICE-OI DATA DATA DATA DATA DATA DATA DEVICE 02

39、DATA DATA DATA DATA DATA DATA 9 5 6 7 a a 1 8 9 10 lo- 11 . “7-0 “7-0 Test circuit CL 20 pf MINIMUM (INCLUDES FIXTURE CAPACITANCE) FIGURE 1. Switchins waveforms and test circuit. STANDARDIZED 5962-89446 MILITARY DRAWING Provided by IHSNot for ResaleNo reproduction or networking permitted without lic

40、ense from IHS-,-,-SMD-5962-87446 59 E 9999996 0804650 1 _ , , -. 1 ,. - . r- STANDARDIZED MILITARY DRAWING DEFENSE EECiR0“;S SUPPLY CE- DAWN, OHIO 45444 Device 01 -SIZE 5962-89446 5 , . ,_. . _. A - 8 Am LEEL SHEET . _. Device OI Device 0.2 Device -02 TOP 1 VIEW FIGURE 2. Terminal connections. r . 1

41、 SC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-87446 59 m 9999996 0004651 3 m I - DEVICE O1 - 3-0 MC 1 OF 16 SELECTOR 4 0) - D17.0 I/ 14 2 15 - A c 6A / 0 8/ f c/ 0 I 1 Ir / . 8, 8 1 -BIT OF 16 WIDE SELE$TOR f / O CLK -

42、b TO ALL STAGES FIGURE 3. Functional block diagrams. 5962-89446 MILITARY DRAWING DEFENSE ElEcTRop(tCS SUPPLY Cm DAYTN. OHB 45444 .- - . I I I u s -nnwn m c-bx tyLuo-YI OESC FORM 193A SEP 07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- L3 - O O O

43、O O O O O 1 1 1 1 1 1 1 1 STANDARDIZED MILITARY DRAWING L2 - O O O O 1 1 1 1 O O O O 1 1 1 1 - 5962-89446 we A O O 1 1 O O 1 1 O O 1 1 O 1 1 a - - LO O 1 O 1 O 1 O 1 O 1 O 1 O 1 O 1 Device O1 Mode i !4$h 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 2 = o 007-4 lencith 3 4 5 6 7 8 9 10 11 12 13 14 15 16

44、17 18 Mode i 12iR 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 3 = 1 l “7-0 length 1 a 3 4 5 6 7 8 9 10 11 12 13 14 15 16 I DEFENSE ELECfRONCS SUPPLY CENlER M“LEVEL DAMON, OH0 45444 “ a -Mulm rrrmco OF?= YMIOYI C FORM 193A P a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without

45、 license from IHS-,-,- T c .- TABLE II. Electrical test requirements. I I I I MIL-STD-883 test requirements I subgroups I 1 (per method I I 5005, table I) L I I I I I I interim electrical parameters I J (method 5004) I I I I Final electrical test parameters I 1*,2,3,5,6,7*, I J (method 5004) I 8,9,1

46、0,11 1 I I I 1,2,3,4,5,6,7,8, I I I Group A test requirements I (method 5005) 9,10,11 I I I 1,2,4,7,9 I I I Groups C and D end-point I electrical parameters I I J (method 5005) *PDA applies to subgroups 1 and 7. . 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as speci

47、fied in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test conditions A, 8, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125“C, minimum. (3) Test duration: 5. PACKAGING 5.1 1,000 hours, except as permitted

48、 by method 1005 of MIL-STD-883. Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-385TO. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will

49、perform the required function are not available for OEM application. by this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. for all applications. 6.2 Replaceability. When a military specification e%ists and the pr