DLA SMD-5962-89504 REV C-2011 MICROCIRCUIT LINEAR DUAL COMPARATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Sheet 4: TABLE I. Input offset voltage test. Device type 01. For subgroup 2, delete the min limit of “1.5 mV” and substitute “5 mV”. Input bias current test. Device type 01. For subgroup 2, delete the min limit of “40 nA” and substitute “60 nA”.

2、Input offset current test. Device type 01. For subgroup 2, delete the min limit of “12 nA” and substitute “20 nA”. Sheet 5: TABLE I. Common mode rejection ratio test. Device type 01. For subgroup 2, delete the min limit of “86 dB” and substitute “82 dB”; Power supply rejection ratio test. Device typ

3、e 01. For subgroup 2, delete the min limit of “86 dB” and substitute “82 dB”. Changes in accordance with notice of revision 5962-R012-96. - ro 96-01-30 M. A. FRYE B Drawing updated to reflect current requirements. Incorporate N.O.R. 5962-R012-96. Redrawn. - ro 05-03-09 R. MONNIN C Update boilerplate

4、 paragraphs to current MIL-PRF-38535 requirements. - ro 11-04-19 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 4321

5、8-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAY MONNIN APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, DUAL COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-05-02 AMSC N

6、/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89504 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E159-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REV

7、ISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following

8、example: 5962-89504 01 G A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function IIB( TA= 25C ) 01 LT1017 Dual comparator 15 nA 02 LT1018 Dual

9、 comparator 75 nA 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, app

10、endix A. 1.3 Absolute maximum ratings. Positive supply voltage (V+) . +40 V dc Negative supply voltage (V-) . -40 V dc Input voltage range . -0.3 V dc to +40 V dc Differential input voltage (VIN) 40 V dc Output short circuit duration Indefinite Storage temperature range . -65C to +150C Power dissipa

11、tion (PD) . 1.0 W Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 150C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to

12、 +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification

13、, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 -

14、 Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawing

15、s. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conf

16、lict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item re

17、quirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitiona

18、l certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements he

19、rein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, an

20、d physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figur

21、e 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be th

22、e subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packa

23、ges where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-385

24、35, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

25、 DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset vol

26、tage 1/ VIO0.75 V VS 20 V 1 All 1.0 mV 2 01 5.002 1.53 All 1.4 Input bias current IIB0.75 V VS 20 V 1 01 15 nA 02 752 01 6002 110 3 01 2502 100Input offset current IIO0.75 V VS 20 V 1 01 2.0 nA 02 8.02 01 2002 20 3 01 3.002 12Common mode rejection mode CMRR VS= 20 V, 1 All 105 dB -20 V VCM 19.1 V 2

27、01 82 02 863 All 100Power supply rejection ration PSRR +0.75 V V+ +20 V, 1 All 96 dB -20 V V- -0.75 V 2 01 82 02 863 All 95See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504

28、DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Gain G No load, VOUT= 19.9 V, 1 A

29、ll 110 dB V+ = +20 V dc, 2 100 V- = -20 V dc 2/ 3 105 RL= 4.0 k, VOUT= 19 V, 1 100 V+ = +20 V dc, 3 94 V- = -20 V dc Output sink current IO(SK)V+ = 4.5 V, V- = 0 V, 1 01 30 mA overdrive 30 mV, 02 35 VOUT= 2.0 V 2 All 10 3 25Output source current IO(SO)V+ = 40 V, V- = 0 V, 1 01 30 A VIN= 5.0 mV, 02 7

30、5 VOUT 0.4 V 2 01 25 02 503 01 2502 50 V+ = 1.2 V, V- = 0 V, 1 01 25 VIN= 5.0 mV, 02 70 VOUT 0.4 V 2 01 25 02 403 01 1502 45 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8950

31、4 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Positive output saturation volt

32、age +VO(SAT)IOUT= 0 A, 1 All 80 mV V+ = 1.2 V, V- = 0 V 2 100 3 90IOUT= 10 A, 1 250 V+ = 1.2 V, V- = 0 V 2,3 300 Negative output saturation voltage -VO(SAT)IOUT= 0 mA, 1 01 20 mV V+ = 4.5 V, V- = 0 V, 02 15 VIN= -10 V 2 01 50 02 403 All 20IOUT= 0.1 mA, 1 All 60 V+ = 4.5 V, V- = 0 V, 2 100 VIN= -10 V

33、 3 01 75 02 70IOUT= 1.0 mA, 1 All 120 V+ = 4.5 V, V- = 0 V, 2 200 VIN= -10 V 3 150 IOUT= 10 mA, 1 01 200 V+ = 4.5 V, V- = 0 V, 02 250 VIN= -10 V 2 01 600 02 4003 All 300IOUT= 30 mA, 1 01 600 V+ = 4.5 V, V- = 0 V, 02 700 VIN= -10 V 3 All 900 See footnotes at end of table. Provided by IHSNot for Resal

34、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C

35、TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Leakage current ILVOUT= 40 V, 1 01 3.0 A VIN 100 mV, 02 8.0 V+ = 5.0 V, V- = 0 V 2 01 5.0 02 153 01 3.002 10 Supply current ISV+ = 5.0 V, V- = 0 V 1 01 60 A 02 2502 01 8002 300 3 01 8002 250V+ = +40 V, V- = 0 V 1 01

36、 90 02 2502 01 10002 300 3 01 10002 270Minimum operating voltage VOPIOUT= 1.0 mA 1,2,3 01 1.15 V 02 1.2 1/ Input offset voltage is guaranteed over a common mode voltage range of V- VIN (V+ -0.9 V). 2/ No load gain is guaranteed but not tested, (device type 01 only). Provided by IHSNot for ResaleNo r

37、eproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device types All Case outlines G and P Terminal number Terminal symbol 1 Output A 2 -Input A

38、 3 +Input A 4 V- 5 +Input B 6 -Input B 7 Output B 8 V+ FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89504 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SH

39、EET 9 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing a

40、s an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microci

41、rcuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the optio

42、n to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4

43、.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circui

44、t shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified i

45、n method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality c

46、onformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I,

47、method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the

48、manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from