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本文(DLA SMD-5962-89534 REV C-1991 MICROCIRCUITS DIGITAL CMOS 80-BIT NUMERIC PROCESSOR EXTENSION MONOLITHIC SILICON《硅单片80位数字处理器扩建工程互补型金属氧化物半导体数字微电路》.pdf)为本站会员(sofeeling205)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-89534 REV C-1991 MICROCIRCUITS DIGITAL CMOS 80-BIT NUMERIC PROCESSOR EXTENSION MONOLITHIC SILICON《硅单片80位数字处理器扩建工程互补型金属氧化物半导体数字微电路》.pdf

1、NOTICE OF REVISION (NOR)(See MIL-STD-480 for instructions)This revision described below has been authorized for the document listed.DATE (YYMMDD)91-11-21 Form ApprovedOMB No. 0704-0188Public reporting burden for this collection is estimated to average 1 hour per response, including the time for revi

2、ewing instructions, searchingexisting data sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send commentsregarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden

3、, to WashingtonHeadquarters Services, Directorate for Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office of Information and Regulatory Affairs, Office of Management and Budget, Washington, DC 20503. 1. ORIGINATOR NAME AND ADDRESS

4、 Defense Electronics Supply CenterDayton, Ohio 45444-52772. CAGE CODE672683. NOR NO.5962-R012-924. CAGE CODE672685. DOCUMENT NO.5962-895346. TITLE OF DOCUMENTMicrocircuits, Digital, CMOS, 80-Bit Numeric Processor Extension, Monolithic Silcon7. REVISIONLETTER(Current) B (New) C8. ECP NO.Not Required

5、due to nature of changes9. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIESAll10. DESCRIPTION OF REVISIONSheet 1: Revisions ltr column; add “C“Revisions description column; add “Changes in accordance withNOR 5962-R012-92“.Revisions date column; add “91-11-21“.Sheet 3: Add Para. 1.5 as follow: 1.5

6、 Digital logic testing for device classes Q and V. Fault coverage measurement of manufacturinglogic tests (MIL-STD-883, test method 5012) - - - - - 98.5 percent11. THIS SECTION FOR GOVERNMENT USE ONLYa. CHECK ONEG65xG66EXISTING DOCUMENT SUPPLEMENTED G65 G66 REVISED DOCUMENT MUST BE G65 G66 CUSTODIAN

7、 OF MASTER DOCUMENTBY THIS NOR MAY BE USED IN RECEIVED BEFORE MANUFACTURER SHALL MAKE ABOVE REVISION ANDMANUFACTURE. MAY INCORPORATE THIS CHANGE. FURNISH REVISED DOCUMENT TO:b. ACTIVITY AUTHORIZED TO APPROVECHANGE FOR GOVERNMENTDESC-ECCSIGNATURE AND TITLEMonica PoelkingChief, Custom Microelectronics

8、DATE (YYMMDD)91-11-21 12. ACTIVITY ACCOMPLISHING REVISION DESC-ECCREVISION COMPLETED (Signature)Tim H. NohDATE (YYMMDD)91-11-21DD Form 1695, JUL 88 Previous editions are obsolete.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REVISIONSLTR DESCRIPTIO

9、NDATE(YR-MO-DA)APPROVEDA Add device types 02 and 03. Add case outline Y. Editorial changesthroughout.1990 AUG 8 Don CoolB Technical changes in absolute maximum ratings and recommendedoperating conditions. Editorial changes throughout.91-08-29 Don CoolREV SHEETREVBBBBBBBBBBBBBBBBBBSHEET15 16 17 18 19

10、 20 21 22 23 24 25 26 27 28 29 30 31 32REV STATUSOF SHEETSREVBBBBBBBBBBBBBBSHEET123456789101121314PMIC N/APREPARED BY Tim H. NohDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZEDMILITARYDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAM

11、SC N/A CHECKED BYTim H. NohMICROCIRCUITS, DIGITAL, CMOS,80-BIT NUMERIC PROCESSOREXTENSION, MONOLITHIC SILICONAPPROVED BYD R CoolDRAWING APPROVAL DATE89-03-01SIZEACAGE CODE672685962-89534REVISION LEVELBSHEET 1 OF 32DESC FORM 193JUL 91 5962-E268DISTRIBUTION STATEMENT A. Approved for public release; di

12、stribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89534REVISION LEVEL BSHEET2DESC FORM 193AJUL 911. SCOPE1.1 Scope. This drawing forms a pa

13、rt of a one part - one part number documentation system (see 6.6 herein). Twoproduct assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (deviceclasses S and V), and a choice of case outlines and lead finishes are available and are reflected i

14、n the Part or IdentifyingNumber (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 ofMIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. When available, achoice of radiation hardness assurance (RHA) lev

15、els are reflected in the PIN.1.2 PIN. The PIN shall be as shown in the following example:5962 - 89534 01 M X X | | | | | | | | | | | | | | | | Federal RHA Device Device Case Leadstock class designator type class outline finishdesignator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) / (S

16、ee 1.2.3) /Drawing number1.2.1 Radiation hardness assurance (RHA) designator. Device classes M, B, and S RHA marked devices shall meetthe MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q andV RHA marked devices shall meet the MIL-I-38535 spec

17、ified RHA levels and shall be marked with the appropriate RHAdesignator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:Device type Generic number Circuit function01 80387-16 Numeric processor extension, 80-bit02 80387-20

18、 Numeric processor extension, 80-bit03 80387-25 Numeric processor extension, 80-bit1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurancelevel as follows:Device class Device requirements documentationM Vendor self-certification to the re

19、quirements for non-JAN class Bmicrocircuits in accordance with 1.2.1 of MIL-STD-883B or S Certification and qualification to MIL-M-38510Q or V Certification and qualification to MIL-I-385351.2.4 Case outline(s). For device classes M, B, and S, case outline(s) shall meet the requirements in appendix

20、C ofMIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements ofMIL-I-38535, appendix C of MIL-M-38510, and as listed below.Outline letter Case outlineX P-AC (68-pin, 1.180“ x 1.180“ x .345“), pin grid array packageY See figure 1 (68-terminal, .970“ x .

21、970“ x .115“), ceramic quad flatpackageProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89534REVISION LEVEL BSHEET3DESC FORM 193AJUL 911.2.5 Lead finish. The lead

22、 finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchan

23、geable without preference.1.3 Absolute maximum ratings.Voltage on any pin (referenced to GND) - - - - - - - - - -0.5 V dc to V +0.5 VCCStorage temperature range - - - - - - - - - - - - - - - - -65G28C to +150G28CMaximum power dissipation (P ) - - - - - - - - - - - - - - 2.1 WDThermal resistance, jun

24、ction-to-case (G14 ):JCCases X and Y - - - - - - - - - - - - - - - - - - - - - See MIL-M-38510, appendix CJunction temperature (T ) - - - - - - - - - - - - - - - - +200G28CJLead temperature (soldering, 10 seconds) - - - - - - - - +260G28C1.4 Recommended operating conditions.Supply voltage (V ) - - -

25、 - - - - - - - - - - - - - - - 4.75 V dc to 5.25 V dcCCCase operating temperature range (T ) - - - - - - - - - - -55G28C to +125G28CCMinimum high level input voltage (V ):IHLogic inputs - - - - - - - - - - - - - - - - - - - - 2.0 V dcClock input - - - - - - - - - - - - - - - - - - - - - 3.7 V dcMaxi

26、mum low level input voltage (V ) - - - - - - - - - - - 0.8 V dcILFrequency of operation:Device type 01 - - - - - - - - - - - - - - - - - - - 16 MHzDevice type 02 - - - - - - - - - - - - - - - - - - - 20 MHzDevice type 03 - - - - - - - - - - - - - - - - - - - 25 MHz2. APPLICABLE DOCUMENTS2.1 Governme

27、nt specifications, standards, bulletin, and handbook. Unless otherwise specified, the following specifications, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this dr

28、awing to the extent specified herein.SPECIFICATIONSMILITARYMIL-M-38510 - Microcircuits, General Specification for.MIL-I-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSMILITARYMIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waivers.MIL-STD-883 -

29、 Test Methods and Procedures for Microelectronics.BULLETINMILITARYMIL-BUL-103 - List of Standardized Military Drawings (SMDs).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45

30、444SIZEA5962-89534REVISION LEVEL BSHEET4DESC FORM 193AJUL 91HANDBOOKMILITARYMIL-HDBK-780 - Standardized Military Drawings.(Copies of the specifications, standards, bulletin, and handbook required by manufacturers in connection with specificacquisition functions should be obtained from the contractin

31、g activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, thetext of this drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual item requirements for device

32、 class M shall be in accordance with 1.2.1 ofMIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specifiedherein. The individual item requirements for device classes B and S shall be in accordance with MIL-M-38510 and asspecified herein. For devi

33、ce classes B and S, a full electrical characterization table for each device type shall be includedin this SMD. The individual item requirements for device classes Q and V shall be in accordance with MIL-I-38535, thedevice manufacturers Quality Management (QM) plan, and as specified herein.3.2 Desig

34、n, construction, and physical dimensions. The design, construction, and physical dimensions shall be asspecified in MIL-M-38510 for device classes M, B, and S and MIL-I-38535 for device classes Q and V and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and

35、 figure 1.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.3.2.3 Functional block diagrams. The functional block diagram shall be as specified on figure 3.3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified

36、 herein, theelectrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply overthe full case operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. Theelect

37、rical tests for each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be inaccordance with MIL-STD-883 (see 3.1 herein). In addition, the manufacturers PIN may also be marked as listed inMIL-BUL-103. Marking for

38、 device classes B and S shall be in accordance with MIL-M-38510. Marking for device classesQ and V shall be in accordance with MIL-I-38535.3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required inMIL-STD-883 (see 3.1 herein). The certification mark for

39、 device classes B and S shall be a “J“ or “JAN“ as required inMIL-M-38510. The certification mark for device classes Q and V shall be a “QML“ as required in MIL-I-38535.3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer inorder to be

40、listed as an approved source of supply in MIL-BUL-103 (see 6.7.3 herein). For device classes Q and V, acertificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirementsof this drawing (see 6.7.2 herein). The certificate of compliance submitted to

41、 DESC-ECC prior to listing as an approvedsource of supply for this drawing shall affirm that the manufacturers product meets, for device class M the requirementsof MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-I-38535 and the requirements herein.Provided by IHS

42、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89534REVISION LEVEL BSHEET5DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics.TestSymbolConditions-55C G06 T G0

43、6+125CC4.75 V V = 5.25 VCCunless otherwise specified Group AsubgroupsDevice typesLimits UnitMin MaxInput low voltageVIL1, 2, 3 All -0.31/+0.8 VInput high voltageVIH2.0 V +0.3CC1/386CLK2 inputlowvoltageVCL-0.31/+0.8386CLK2 inputlowvoltageVCHV+0.3CC1/Output lowvoltageVOLI = 4 mA, D0-D31OL0.45I = 2.5 m

44、A, RG0AEG0AAG0ADG0AYG0AOG0A,OLEG0ARG0ARG0AOG0ARG0A, BG0AUG0ASG0AYG0A, PEREQ0.45Output high voltageVOHI = -1 mA, D0-D31OH2.4I = 2.5 mA, RG0AEG0AAG0ADG0AYG0AOG0A,OHEG0ARG0ARG0AOG0ARG0A, BG0AUG0ASG0AYG0A, PEREQ2.4Input leakage current,ILI0 V V VIN CC-15 +15 AOutput leakagecurrentILO0.45 V V VOUT CC-15

45、+15Supply current ICCCLK2 = 32 MhzCLK2 = 40 MhzCLK2 = 50 Mhz 2/010203250310390mAInputcapacitanceCINFc = 1 Mhz, see 4.3.1c 4 All 10 pFOutput or I/OcapacitanceCOUT12CLK2 capacitance CCLK20See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license

46、 from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89534REVISION LEVEL BSHEET6DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics - Continued.TestSymbolConditions-55C G06 T G06+125CC4.75 V V = 5.25 VCCunless otherwise specified Group AsubgroupsDevice typesLimits UnitMin MaxFunctional tests See 4.4.1d 7, 8 AllOperatingfrequencyperiodHalf of CLK2 frequency3/9, 10, 11 010203444162025MHz386CLK2 period t1At 2 V 3/010203312520125125125ns386CLK2 high time1/t2a01

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