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本文(DLA SMD-5962-89549-1989 MICROCIRCUITS DIGITAL BIPOLAR PIPELINE REGISTER WITH SHADOW REGISTER MONOLITHIC SILICON《硅单片阴影调节管道双极数字微电路》.pdf)为本站会员(twoload295)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-89549-1989 MICROCIRCUITS DIGITAL BIPOLAR PIPELINE REGISTER WITH SHADOW REGISTER MONOLITHIC SILICON《硅单片阴影调节管道双极数字微电路》.pdf

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREV SHEETREVSHEETREV STATUSOF SHEETSREV SHEET 1 2 3 4 5 6 7 8 9101 121314PMIC N/APREPARED BY Christopher A. Rauch DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZEDMILITARYDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGE

2、NCIES OF THEDEPARTMENT OF DEFENSEAMSC N/A CHECKED BYRay MonninMICROCIRCUITS, DIGITAL, BIPOLAR, PIPELINEREGISTER WITH SHADOW REGISTER,MONOLITHIC SILICONAPPROVED BYMichael A. FryeDRAWING APPROVAL DATE10 MAY 1989SIZEACAGE CODE672685962-89549REVISION LEVELSHEET 1 OF 14DESC FORM 193SEP 87 5962-E1225DISTR

3、IBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET2DESC FORM 1

4、93ASEP 871. SCOPE1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 ofMIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“.1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in t

5、he following example:5962-89549 01 K X G0D G0D G0D G0DG0D G0D G0D G0DG0D G0D G0D G0D Drawing number Device type Case outline Lead finish per(See 1.2.1) (See 1.2.2) MIL-M-385101.2.1 Device type. The device type shall identify the circuit function as follows:Device type Generic number Circuit function

6、01 29818A Pipeline register with serial shadow register diagnostics1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows:Outline letter Case outlineF F-6 (24-lead, .640“ x .420“ x .090“), flat packageL D-9 (24-lead, 1.280“ x .310“ x .200“), dual-i

7、n-line package3 C-4 (28 terminal, .460“ x .460“ x .100“), square leadless chip carrier package1.3 Absolute maximum ratings. Supply voltage range - - - - - - - - - - - - - - - - - - - - -0.5 V dc minimum to +7.O V dc maximumInput voltage range - - - - - - - - - - - - - - - - - - - -1.5 V dc to V + 6.

8、0 V dcCCStorage temperature range - - - - - - - - - - - - - - - - - - - -65G28C to +150G28CDC output voltage - - - - - - - - - - - - - - - - - - -0.5 V dc to + 5.5 V dcDC output current into outputs - - - - - - - - 100 mADC input current - - - - - - - - - - - - - - - - -30 mA to +5.0 mAMaximum power

9、 dissipation (P )1/ - - - - - - - - - - - - - - - 1.35 W DLead temperature (soldering, 10 seconds) - - - - - - - - - - +300G28CThermal resistance, junction-to-case (G14 ) - - - - - - - - See MIL-M-38510, appendix CJCJunction temperature (T ) - - - - - - - - - - - - - - - - - +150G28CJ1.4 Recommended

10、 operating conditions.Supply voltage range (V ) - - - - - - - - - - - - - - - - - - - +4.5 V dc minimumto +7.0 V dc maximumCCMinimum high level input voltage (V ) - - - - - - - - - - - - 2.0 V dcIHMaximum low level input voltage (V )- - - - - - - - - - - - - 0.8 V dcILCase operating temperature rang

11、e (T )- - - - - - - - - - - -55G28C to +125G28CC1/ Must withstand the added P due to short circuit test; e.g., I .DOSProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5

12、962-89549REVISION LEVEL SHEET3DESC FORM 193ASEP 872. APPLICABLE DOCUMENTS2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard,and bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Sta

13、ndards specifiedin the solicitation, form a part of this drawing to the extent specified herein.SPECIFICATIONMILITARYMIL-M-38510 - Microcircuits, General Specification for.STANDARDMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.BULLETINMILITARYMIL-BUL-103 - List of Standardize

14、d Military Drawings (SMDs).(Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisitionfunctions should be obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict

15、between the text of this drawing and the references cited herein, thetext of this drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisionsfor the use of MIL-STD-883 in conjunction with compliant

16、 non-JAN devices“ and as specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein.3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.2 Truth table. The

17、 truth table shall be as specified on figure 2.3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3.3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical perfor

18、mancecharacteristics are as specified in table I and shall apply over the full case operating temperature range.3.4 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with thepart number listed in 1.2 herein. In addition, the manufacturers part number

19、 may also be marked as listed in 6.4 herein.3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed asan approved source of supply in 6.4. The certificate of compliance submitted to DESC-ECS prior to listing as an approvedsource of suppl

20、y shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) andthe requirements herein.3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall beprovided with each lot of microcircuits delivered to this dr

21、awing.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET4DESC FORM 193ASEP 87TABLE I. Electrical performance characteristics.TestSymbolCon

22、ditions 1/-55C G06 T G06 +125CC4.5 V V 5.5 VCCunless otherwise specified Group AsubgroupsLimits UnitMin MaxOutput high voltageY - Y07VOH1V = 4.5 VCCV = V or VIN IH ILIOH = -6 mA1, 2, 3 2.4 VOutput high voltageD - D , SDO07VOH2V = 4.5 VCCV = V or VIN IH ILIOH = -1 mA2.4Output low voltageY - Y07VOL1V

23、= 4.5 VCCV = V or VIN IH ILIOL = 24 mA0.5Output low voltageD - D07, SDOVOL2V = 4.5 VCCV = V or VIN IH ILIOL = 4 mA0.5High level input voltage VIHGuarantee input logical highvoltage for all inputs 1/2.0Low lever input voltage VILGuarantee input logical highvoltage for all inputs 1/0.8Input clamp volt

24、age VICV = 4.5 V; I = -18 mACC IN-1.2Input leakage current IILV = 5.5 VCCV = 0.5 VIN-250 AIIHV = 2.4 VIN50 AInput reverse current IIV = 5.5 V; V = 5.5 VCC IN100 ASee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZ

25、EDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET5DESC FORM 193ASEP 87TABLE I. Electrical performance characteristics.TestSymbolConditions 1/-55C G06 T G06 +125CC4.5 V V 5.5 VCCunless otherwise specified Group AsubgroupsLimits UnitMin MaxOff sta

26、te output leakage currentIOZHV 5.5 V; V = 2.4 VCC OUT1, 2, 3 100 AIOZLV 5.5 V; V = 0.5 VCC OUT-250 AOutput shor circuitcurrentIOSV = 5.5 VCCV = 0.0 VOUTY - Y07-30 -100 mAD - D,SDO07-15 -50 mABus leakage current IOFFV = 0.0 V; V = 2.9 VCC 0100 ASupply current ICCV = 5.5 VCCOutputs open at Hi-Z145 mAF

27、unctional test See 4.3.1c 7, 8Propagatiion delay fromPCLK to output (Yi) 3/tPLH1tPHL1See figure 4 9, 10, 11 12.0 nsPropagation delay fromMODE to SDOtPLH2tPHL218.0 nsPropagation delaySDI to SDOtPLH3tPHL318.0 nsPropagation delayDCLK to SDOtPLH4tPHL430.0 nsDi to PCLK 3/set up timetS16.0 nsMODE to PCLKs

28、et up timetS215.0 nsSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET6DESC FORM 193ASEP 87TABLE I. Electric

29、al performance characteristics - Continued.TestSymbolConditions -55C G06 T G06 +125CC4.5 V V 5.5 VCCunless otherwise specified Group AsubgroupsLimits UnitMin MaxYi to DCLK 3/set up timetS3See figure 4 9, 10, 11 5.0 nsMODE to DCLKset up timetS412.0SDI to DCLKset up timetS512.0DCLK to PCLKset up timet

30、S615.0PCLK to DCLKset up timetS745.0Di to PCLK 3/hold timetH12.0MODE to PCLKhold timetH20.0Yi to DCLK 3/hold timetH35.0MODE to DCLKhold timetH45.0SDI to DCLKhold timetH50.0Output disable timeOG09EG09YG09 to Yi 3/tPLZ120.0Output disable timeDCLK to DI 3/tPLZ245.0See footnotes at end of table.Provided

31、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET7DESC FORM 193ASEP 87TABLE I. Electrical performance characteristics - Continued.TestSymbolCondi

32、tions -55C G06 T G06 +125CC4.5 V V 5.5 VCCunless otherwise specified Group AsubgroupsLimits UnitMin MaxOutput disable timeOG09EG09YG09 to Yi 3/tPHZ1See figure 4 9, 10, 11 30.0 nsOutput disable timeDCLK to Di 3/tPHZ290.0Output disable timeOG09EG09YG09 to Yi 3/tPZL120.0Output disable timeDCLK to Di 3/

33、tPZL135.0Output disable timeOG09EG09YG09 to Yi 3/tPZH120.0Output disable timeDCLK to Di 3/tPZH230.0PCLK pulse width(high and low)tPW115.0DCLK pulse width(high and low)tPW225.01/ Input thresholds are tested in combination with other dc parameters or by correlation.2/ Not more than one output should b

34、e shorted at a time. Duration should not exceed 1 second.3/ i = 0 to 7.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET8DESC FORM 193ASE

35、P 87Case outlines K and L 3 Case outlines K and L 3Terminal number Terminal symbol Terminal number Terminal symbol0102030405060708091011121314OG09EG09YG09DCLKD0D1D2D3D4D5D6D7SDIGNDPCLKSDONCOG09EG09YG09DCLKD0D1D2D3NCD4D5D6D7SDIGND1516171819202122232425262728Y7Y6Y5Y4Y3Y2Y1Y0MODEVCC- - - - - - - - -NCP

36、CLKSDOY7Y6Y5Y4NCY3Y2Y1Y0MODEVCCNC = No connection.FIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET9DESC F

37、ORM 193ASEP 87Inputs OutputsOperationSDI MODE DCLK PCLK SDO ShadowregisterPipelineregisterXL G1BG1BS7SG95S-1iiSG95SDI0NA Serial shift: D -D disabled70XL X G1BS7NA PG95DiiNormal load pipeline registerLH G1BXSDISG95YiiNA Load shadow register from Y; D -D disabled70XH X G1BSDI NA PG95SiiLoad pipeline r

38、egister from shadow registerHH G1BX SDI Hold* NA Hold shadow register: D -D enabled (see note)70H = High voltage level S -S = Shadow register outputs70L = Low voltage level P -P = Pipeline register outputs70X = Irrelevant D -D = Data I/O port70G1B = Low-to-high transition Y -Y = Y I/O port70NA = Not

39、 applicable; output is not a function of thespecified input combinations.NOTE: Hold implemented by gating DCLK internally.FIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CEN

40、TERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET10DESC FORM 193ASEP 87FIGURE 3. Logic diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISI

41、ON LEVEL SHEET11DESC FORM 193ASEP 87NOTES:1. C = 50 pF, includes probe and jig capacitance.L2. For Y - Y I/O part, R = 1 kG36 and R = 280G36, unless otherwise specified.07 1 2For D - D I/O part, R = 5 kG36 and R = 2 kG36.07 1 23. Diagram shown for HIGH data only. Output transition may be oppositesen

42、se. Cross hatched area is dont care condition.4. Diagram shown for input circuit are closed except where shown.5. Pulse generator for all pulses: Rate 1.0 Mhz, Z = 50G36; t 2.5 ns; t 2.5 ns.0r fFIGURE 4. Switching waveforms and test circuits.Provided by IHSNot for ResaleNo reproduction or networking

43、 permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89549REVISION LEVEL SHEET12DESC FORM 193ASEP 873.7 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see3.1 here

44、in).3.8 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review themanufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore atthe option of the reviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling

45、and inspection. Sampling and inspection procedures shall be in accordance with section 4 ofMIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein).4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on alldevices prior to quality confor

46、mance inspection. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A using the circuit submitted with the certificate of compliance (see 3.5 herein).(2) T = +125G28C, minimum.Ab. Interim and final electrical test parameters shall be as spec

47、ified in table II herein, except interim electrical parametertests prior to burn-in are optional at the discretion of the manufacturer.4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 ofMIL-STD-883 including groups A, B, C, and D inspections.

48、 The following additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.c. Subgroups 7 and 8 sufficient to verify the truth table.4.3.2 Groups C and D inspections.a. End-point electrical parameters shall be

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