DLA SMD-5962-89566 REV D-2006 MICROCIRCUIT HYBRID LINEAR HIGH ACCURACY SAMPLE HOLD AMPLIFIER《高准确扬声器 线性混合微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Inactivate case outline C for new design. Add case outline X. Rewrite entire document. 93-05-17 K. A. Cottongim B Changes in accordance with NOR 5962-R103-94. 94-01-07 K. A. Cottongim C Make changes/corrections to table I. Rewrite entire document

2、. 94-03-15 K. A. Cottongim D Update drawing. 06-07-11 Raymond Monnin REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber POST OF

3、FICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY D. M. Cool MICROCIRCUIT, HYBRID, LINEAR, HIGH ACCURACY SAMPLE/HOLD AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-04-19 AMSC N/A REVISION LEVE

4、L D SIZE A CAGE CODE 67268 5962-89566 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E547-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION L

5、EVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a

6、 choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 89566 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (

7、see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s)

8、 identify the circuit function as follows: Device type Generic number Circuit function 01 HS9716 16-bit sample and hold amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements o

9、f MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applica

10、tions. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible lim

11、ited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of

12、that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manuf

13、acturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C 1/ CDIP3-T14 14 Dual-in-lineX See figure 1 14 Dual-in

14、-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1/ Inactive for new design.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

15、43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +18 V dc Negative supply voltage (VEE) . -18 V dc Input voltage (VIN) 15 V dc Logic input voltage range -0.5 V dc to 5.5 V dc Output current, continuous (IOUT). 40 mA Output shor

16、t-circuit duration (IOS) Indefinite Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Power dissipation (PD). 650 mW Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) 10C/W Thermal resistance, junction-to-ambient (JA) . 35C/W 1.4 Recomme

17、nded operating conditions. Positive supply voltage range +14.25 V dc to +15.75 V dc Negative supply voltage range -14.25 V dc to -15.75 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specificat

18、ion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DE

19、PARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of t

20、hese documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this draw

21、ing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device

22、classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may elimin

23、ate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device cl

24、ass. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

25、IT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outl

26、ine(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

27、specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking

28、of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device d

29、escribed herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. T

30、his data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The cert

31、ificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcir

32、cuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or funct

33、ion as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

34、level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in acc

35、ordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or

36、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA +125C u

37、nless otherwise specified Group A subgroups Device type Min Max Unit Power supply requirements Positive supply current ICCVCC= +15.75 V dc 1,2,3 01 30 mA Negative supply current IEEVEE= -15.75 V dc 1,2,3 01 -28 mA Analog input Input voltage range VIN1,2,3 01 10 15 V Input impedance 2/ ZIN1,2,3 01 9

38、11 k Digital input 2/ High level input voltage VIHTrack mode, logic “1“ 1,2,3 01 2.0 5.5 V Low level input voltage VILHold mode, logic “0“ 1,2,3 01 0 0.8 V High level input current IIHLogic “1“ 1,2,3 01 5.0 A Low level input current IILLogic “0“ 1,2,3 01 -5.0 A Analog output Output voltage VOUT1,2,3

39、 01 10 V Output current 2/ OUT1,2,3 01 2.0 mA Output short circuit 2/ IOS1,2,3 01 25 mA f = 1.0 kHz 0.1 Output impedance 2/ ZOUTf = 1.0 MHz 1,2,3 01 12 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

40、IT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Mi

41、n Max Unit DC accuracy / stability Gain A TA= +25C 1 01 -1.0 V/V Gain error AETA= +25C 1 01 0.02 % Gain temperature drift A/T TA= -55C and +125C 2,3 01 5.0 ppm/C Gain nonlinearity 2/ 10 V output track 1,2,3 01 0.0005 % Offset voltage Adjusted to zero, TA= +25C 1 01 30 m/V Output offset voltage VOS T

42、rack mode, TA= -55C and +125C 2,3 01 3.0 m/V Track (sample) mode dynamics 4,6 0.9 Small signal (-3dB) 5 01 0.35 MHz 4,6 0.2 Frequency response 2/ Full power bandwidth 5 01 0.09 MHz 4 5 5 2 Slew rate 2/ SRVOUT= 10 V 6 01 8 V/s Noise in track mode 2/ DC to 1.0 MHz 4,5,6 01 50 V rms Noise in hold mode

43、2/ 4,5,6 01 25 V rms See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 9

44、7 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit Track (sample)-to-hold switching Offset step (pedestal) TA= +25C 1 01 3.0 mV Aperture delay 2/ tAD9,10,11 01 30 ns Apert

45、ure uncertainty 2/ tAU9,10,11 01 100 ps Amplitude 1,2,3 01 50 mV Settling to 1.0 mV 9,10,11 01 0.5 s Switching transient 2/ Settling to 0.3 mV 9,10,11 01 1.0 s Dielectric absorption TA= +25C 4 01 25 V/V Hold mode dynamics 4 0.05 Droop rate VDRP5,6 01 10 V/s 20 V p-p at 20 kHz 98 Feedthrough rejectio

46、n 2/ FR 20 V p-p at 250 kHz 4,5,6 01 90 dB Hold-to-track (sample) dynamics For 20 V step to 0.0008%, TA= +25C 10 Acquisition time TAQ For 20 V step to 0.003%, TA= +25C 9 01 7.5 s 20 V p-p at 20 kHz 98 Feedthrough rejection 2/ FR 20 V p-p at 200 kHz 4,5,6 01 90 dB 1/ Unless otherwise specifies +14.25

47、 V dc VCC +15.75 V dc and -14.25 V dc VEE -15.75 V dc. 2/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo

48、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89566 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 3.68 .145 b 0.33 0.58 .013 .022 c 0.25 .010 D 20.45 .805 E 12.70 .500 e 2.54 BSC .100 BSC eA 7.49 7.75 295 .305 L 5.08 5.59 .