DLA SMD-5962-89609 REV B-2012 MICROCIRCUIT DIGITAL HIGH SPEED CMOS PHASE LOCKED LOOP WITH VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add footnotes to figure 3, switching waveforms and test circuit. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout jak. 06-03-09 Thomas M. Hess B Update boilerplate paragraphs to the curren

2、t MIL-PRF-38535 requirements. - LTG 12-04-19 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MI

3、CROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Monica L. Poelking APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, PHASE LOCKED LOOP WITH VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON DRAWIN

4、G APPROVAL DATE 89-11-20 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89609 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E209-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBU

5、S, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as s

6、hown in the following example: 5962-89609 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54HC4046A Phase-locked loop with

7、voltage controlled oscillator 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appen

8、dix A. 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc Clamp diode current (IIK, IOK) 20 mA DC drain current (IOUT) 25 mA DC VCCor GND curre

9、nt (ICC, IGND) 50 mA Storage temperature range (TSTG) -65C to +150C Maximum power dissipation (PD) 500 mW 4/ Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. 2/ 3/ Suppl

10、y voltage range (VCC) . +2.0 V dc to +6.0 V dc Case operating temperature range (TC) -55C to +125C Input voltage range (VIN) . 0.0 V dc to VCCOutput voltage range (VOUT) 0.0 V dc to VCCInput rise or fall time (tr, tf): VCC= 2.0 V 0 to 1000 ns VCC= 4.5 V 0 to 500 ns VCC= 6.0 V 0 to 400 ns _ 1/ Stress

11、es above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, all voltages are referenced to ground. 3/ The limits for the parameters specified herein shall apply

12、over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For TA= +100C to +125C, derate linearly at 8 mW/C to 300mW. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND

13、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specifi

14、ed, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Inter

15、face Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardizati

16、on Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents cited in the solicitation or contra

17、ct. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JEDEC Standard No. 7 - Standard for Description of 54/74HCXXXXX and 54/74HCTXXXXX Advanced High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North

18、 10thStreet, Suite 240-S Arlington, VA 22201). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a speci

19、fic exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing

20、 (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow a

21、s documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PR

22、F-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with

23、 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 2. 3.2.4 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 3. Pro

24、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise s

25、pecified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgr

26、oup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to

27、space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a

28、“Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The

29、certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance

30、as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and M

31、aritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networ

32、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Test conditions 1/ -55C TC +125C unless otherwise sp

33、ecified VCCGroup A subgroups Limits Unit Min Max VOLTAGE-CONTROLLED OSCILLATOR SECTION High level output voltage VOHVIN= VIHminimum or VILmaximum IOH = -20 A 3.0 V 1, 2, 3 2.9 V 4.5 V 4.4 6.0 V 5.9 VIN= VIHminimum or VILmaximum IOH= -4.0 mA 4.5 V 1, 2, 3 3.98 V VIN= VIHminimum or VILmaximum IOH= -5.

34、2 mA 6.0 V 1, 2, 3 5.48 V Low level output voltage VOLVIN= VIHminimum or VILmaximum IOL= +20 A 3.0 V 1, 2, 3 0.1 V 4.5 V 0.1 6.0 V 0.1 VIN= VIHminimum or VILmaximum IOL= +4.0 mA 4.5 V 1, 2, 3 0.4 V VIN= VIHminimum or VILmaximum IOL= +5.2 mA 6.0 V 1, 2, 3 0.4 V High level input voltage VIH2/ 3.0 V 1,

35、 2, 3 2.1 V 4.5 V 1, 2, 3 3.15 V 6.0 V 1, 2, 3 4.2 V Low level input voltage VIL2/ 3.0 V 1, 2, 3 0.9 V 4.5 V 1, 2, 3 1.35 V 6.0 V 1, 2, 3 1.8 V Input leakage current IINVIN= VCCor GND 6.0 V 1, 2, 3 1.0 A R1 and R2 range RRNG3/ 4/ 4.5 V 1 3.0 300 k C1 capacitance range CRNG4/ 4.5 V 1 0.0 5/ pF VCOINo

36、perating voltage range VOP4/ 6/ 3.0 V 1 0.9 1.9 V 4.5 V 1 0.9 3.2 6.0 V 1 0.9 4.6 Frequency stability with temperature change f/T 4/ R1 = 100 k, R2 = 4.5 V 9 0.11 %/C Maximum frequency fMAX4/ C1 = 50 pF, R1 = 3.5 k R2 = 4.5 V 9 24 MHz C1 = 0 pF, R1 = 9.1 k R2 = 4.5 V 9 38 MHz Center frequency fCTR4/

37、 C1 = 40 pF, R1 = 3 k R2 = , VCOIN= VCC/2 4.5 V 9 17 MHz Frequency linearity fVCO4/ C1 = 100 pF, R1 = 100 k R2 = 4.5 V 9 0.4 % Offset frequency fOFF4/ R2 = 220 k C1 = 1 nF 4.5 V 9 400 kHz See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

38、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions 1/ -55C TC +125C unless otherwise specified VCCGroup

39、A subgroups Limits Unit Min Max DEMODULATOR SECTION Resistor range RS4/ At RS 300 k leakage current can influence VDEMOUT 3.0 V 1 50 300 k 4.5 V 50 300 6.0 V 50 300 Offset voltage, VCOINto VDEMVOFF4/ VIN= VVCO(IN)= VCC/2, values taken over RSrange 3.0 V 1 30.0 mV 4.5 V 20.0 6.0 V 10.0 RD4/ VDEM(OUT)

40、= VCC/2 3.0 V 1 25 4.5 V 1 0.1 6.0 V 1 0.1 Quiescent supply current ICCVIN= VCCor GND 6.0 V 1 8.0 A 6.0 V 2, 3 160.0 Output voltage versus input frequency VOUT/fIN4/ R1 = 100 k, R2 = C1 = 100 pF, RS= 10 k R3 = 100 k, C2 = 100 pF 4.5 V 1 330 mV/ kHz PHASE COMPARATOR SECTION High level output voltage

41、VOHVIN= VIHminimum or VILmaximum IOH= -20 A CMOS loads 2.0 V 1, 2, 3 1.9 V 4.5 V 4.4 6.0 V 5.9 VIN= VIHminimum or VILmaximum IOH= -4.0 mA TTL loads 4.5 V 1, 2, 3 3.98 V VIN= VIHminimum or VILmaximum IOH= -5.2 mA TTL loads 6.0 V 1, 2, 3 5.48 V Low level output voltage VOLVIN= VIHminimum or VILmaximum

42、 IOL= +20 A CMOS loads 2.0 V 1, 2, 3 0.1 V 4.5 V 0.1 6.0 V 0.1 VIN= VIHminimum or VILmaximum IOL= +4.0 mA TTL loads 4.5 V 1, 2, 3 0.4 V VIN= VIHminimum or VILmaximum IOL= +5.2 mA TTL loads 6.0 V 1, 2, 3 0.4 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking p

43、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions 1/ -55C TC +125C unless otherwis

44、e specified VCCGroup A subgroups Limits Unit Min Max PHASE COMPARATOR SECTION Continued. High level input voltage VIH2/ 2.0 V 1, 2, 3 1.5 V 4.5 V 3.15 V 6.0 V 4.2 V Low level input voltage VIL2/ 2.0 V 1, 2, 3 0.5 V 4.5 V 1.35 V 6.0 V 1.8 V Input leakage current IINVIN= VCCor GND 2.0 V 1, 2, 3 5.0 A

45、3.0 V 11.0 4.5 V 29.0 6.0 V 45.0 Three-state output current IOZVIN= VCCor GND 6.0 V 1, 2, 3, 0.5 10.0 A Functional tests See 4.3.1d 7, 8 Propagation delay time, SIGINor COMPINto PC1OUTtPLH1, tPHL17/CL= 50 pF See figure 3 2.0 V 9 200 ns 10, 11 300 4.5 V 9 40 10, 11 60 6.0 V 9 34 10, 11 51 Propagation

46、 delay time, SIGINor COMPINto PCPOUTtPLH2, tPHL27/2.0 V 9 300 ns 10, 11 450 4.5 V 9 60 10, 11 90 6.0 V 9 70 10, 11 109 Propagation delay time, SIGINor COMPINto PC3OUTtPLH3, tPHL37/2.0 V 9 245 ns 10, 11 307 4.5 V 9 49 10, 11 74 6.0 V 9 42 10, 11 63 See footnotes at end of table. Provided by IHSNot fo

47、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89609 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test cond

48、itions 1/ -55C TC +125C unless otherwise specified VCCGroup A subgroups Limits Unit Min Max PHASE COMPARATOR SECTION Continued. Propagation delay time, output enable, SIGINor COMPINto PC2OUTtPZH, tPZL7/ 2.0 V 9 265 ns 10, 11 400 4.5 V 9 53 10, 11 80 6.0 V 9 45 10, 11 68 Propagation delay time, output disable, SIGINor COMPINto PC2OUTtPHZ, tPLZ7/2.0 V 9 315 ns 10, 11 475 4.5 V 9 63 10, 11 95 6.0 V 9 74 10, 11 112 Output transition time tTHL, tTLH8/ 2.0 V 9 75 ns 10, 11 110 4.5 V 9 15 10, 11 22 6