DLA SMD-5962-89622 REV B-2009 MICROCIRCUIT LINEAR HIGH SPEED JFET OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R280-94. 94-09-28 M. A. FRYE B Drawing updated to reflect current requirements. -rrp 09-05-12 J. D. RODENBECK THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV B B B

2、 B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. F

3、RYE MICROCIRCUIT, LINEAR, HIGH SPEED, JFET, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-01-16 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89622 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E666-07 Provided by IHSNot for ResaleNo r

4、eproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 comp

5、liant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89622 01 G X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device ty

6、pe(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LT1022A Single, high-speed, precision JFET input operational amplifier 02 LT1022 Single, high speed, precision JFET input operational amplifier 1.2.2 Case outline(s). The case outline(s

7、) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) . 20 V dc Input voltage 20 V dc Differ

8、ential input voltage range 40 V dc Output short-circuit duration . Indefinite Power dissipation (PD) . 210 mW Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Therma

9、l resistance, junction-to-ambient (JA) 150C/W 1.4 Recommended operating conditions. Supply voltagerange (VS) . 15 V dc Ambient temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

10、 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specifie

11、d herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard M

12、icrocircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quick

13、search/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this doc

14、ument, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product b

15、uilt to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and quali

16、fying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as desc

17、ribed herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herei

18、n. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as s

19、pecified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in ac

20、cordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking

21、 the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535

22、to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 TABL

23、E I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C VS= 15 V, VCM= 0 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset current IIOFully warmed up 1 01 10 pA 02 20 2 01 2 nA 02 3 Input bias current IBFully warmed up 1 01, 02 50 pA

24、 2 01 4 nA 02 6 Fully warmed up, VCM= 10 V 1 01 +100 pA 02 +150 Supply current ISY1 01, 02 7 mA 2, 3 11 Input voltage range VIR1/ 1 01, 02 10.5 V 2, 3 10.4 Common-mode rejection ratio CMRR VCM= 10.5 V 1 01 86 dB 02 82 VCM= 10.4 V 2, 3 01 85 02 80 Power supply rejection ratio PSRR VS= 10 V to 18 V 1

25、01 88 dB 02 86 VCM= 10 V to 17 V 2, 3 01 86 02 84 Input offset voltage VIO2/ 4 01 250 V 02 600 5, 6 01 750 02 1500 Large signal voltage gain AVOVO= 10 V, RL= 2 k 4 01 150 V/mV 02 120 5, 6 01 40 02 35 RL= 1 k 4 01 130 02 100 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction

26、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C VS= 15 V,

27、VCM= 0 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage swing VORL= 2 k 4, 5, 6 01, 02 12 V Input noise voltage density enfo= 10 Hz, 3/ TA = +25C 7 01 50 nV/ Hz 02 60 fo= 1 kHz, 3/ TA = +25C 01 20 02 22 Input noise current density info= 10 Hz, 1 kHz, 4/ 5

28、/ TA = +25C 7 01 4 fA/ Hz 02 4 Gain-bandwidth product GBW f = 1 MHz 5/ 7 01 6 MHz 02 5 8 01 4 02 3 Slew rate SR 7 01 23 V/s 02 18 8 01 14 02 10 Settling time tSAVCL= -1, CL 10 pF, 10 V step to 0.1 % 5/ 9 01 1.3 s 02 1.4 1/ Guaranteed by CMRR test. 2/ Offset voltage is measured under two different co

29、nditions: a. Approximately 0.5 seconds after application of power. b. At TA= +25C, with the chip self heated to approximately +45C to account for chip temperature rise when the device is fully warmed up. 3/ Noise voltage density is sample tested on every lot to an LTPD of 15. 4/ Current noise is cal

30、culated from the formula: in= (2qIB)1/2, where q = 1.6 x 10-19coulombs. The noise of source resistors up to 1 G swamps the contribution of current noise. 5/ If not tested, shall be guaranteed to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproduction or networking permit

31、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outline G Terminal number Terminal symbol 1 Balance 2 -Input 3 +Input 4 V- 5 Balance 6 Output 7

32、 V+ 8 No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 9

33、7 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm

34、that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notifi

35、cation of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentat

36、ion shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be cond

37、ucted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made

38、 available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parame

39、ters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A,

40、B, C, and D inspections. The following additional criteria shall apply. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8

41、DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*,2,3,4 Group A test requirements (method 5005) 1

42、,2,3,4,5,6,7,8,9* Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. * If not tested, shall be guaranteed to the limits specified in table I. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 10 and 11 in table I, metho

43、d 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manuf

44、acturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2)

45、TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing ar

46、e intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. Provided by IHSNot

47、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89622 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 6.3 Configuration control of SMDs. All proposed changes to existing S

48、MDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users