DLA SMD-5962-89630 REV A-2001 MICROCIRCUIT LINEAR DUAL CMOS COMPATIBLE DIFFERENTIAL LINE RECEIVER MONOLITHIC SILICON《硅单片 双重氧化物半导体可兼容差动线路接收器 数字微型电路》.pdf

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Drawing updated to reflect current requirements. - lgt 01-06-13 Raymond MonninTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV AAAAAAAAAAOF SHETS SHET 12345678910PMIC N/A PREPARED BY Joseph A. KirbyDEFENSE SU

2、PPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYRay MonninCOLUMBUS, OHIO 43216http:/www.dscc.dla.milTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMichael FryeMICROCIRCUIT, LINEAR, DUAL CMOSCOMPATIBLE DIFFERENTIAL LINE RECEIVER,MONOLITHIC SILICONAND AGENCIES OF THEDEPARTMENT O

3、F DEFENSEDRAWING APPROVAL DATE28 June 1989AMSC N/AREVISION LEVELASIZEACAGE CODE672685962-89630SHEET1 OF 10DSCC FORM 2233APR 97 5962-E474-01DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without lic

4、ense from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits inaccordance with

5、MIL-PRF-38535, appendix A.1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:5962-89630 01 E XDrawing number Device type(see 1.2.1)Case outline(see 1.2.2)Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows:D

6、evice type Generic number Circuit function01 78C120 Dual CMOS compatible differentialline receiver1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleE GDIP1-T16 or CDIP2-T16 16 Dual-in-line1.2.3 Lea

7、d finish. The lead finish is as specified in MIL-PRF-38535, appendix A.1.3 Absolute maximum ratings. 1/Supply voltage (VCC). 18 V dcCommon mode input voltage (VCM) G0125 V dcDifferential input voltage (VID). G0125 V dcStrobe voltage 18 V dcOutput sink voltage. 50 mAPower dissipation (PD) 1433 mW 2/S

8、torage temperature range -65G02C to +150G02CLead temperature (soldering, 10 seconds). +260G02CJunction temperature (TJ). +150G02C 3/Thermal resistance, junction to case (G03JC) . See MIL-STD-18351/ All voltages, except differential voltages, are with respect to ground. Unless otherwise specified, al

9、l absolute maximumlimits apply over the full operating temperature range.2/ Derate linearly 9.6 mW/G02C above +25G02C case temperature. Must withstand the added PD due to short circuit test;e.g., IOS.3/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in sc

10、reening conditionsin accordance with method 5004 of MIL-STD-883.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET3DSCC FORM 2234APR 9

11、71.4 Recommended operating conditions.Supply voltage range (VCC) 4.5 V dc to 15 V dcCommon mode input voltage (VCM) G0115 V dcHigh level output current (IOH) -200 G04ALow level output current (IOL) 1.6 mACase operating temperature range (TC) . -55G02C to +125G02C2. APPLICABLE DOCUMENTS2.1 Government

12、 specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listedin the issue of the Department of Defense Index of Specifications and S

13、tandards (DoDISS) and supplement thereto, cited inthe solicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard Electron

14、ic Component Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings.MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 7

15、00 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations u

16、nless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufactur

17、erListing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifyingactivity approval in accordance with MIL-PRF-38535. This QM

18、L flow as documented in the Quality Management (QM) planmay make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with

19、 MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be asspecified in MIL-PRF-38535, appendix A and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance

20、 with 1.2.2 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.3 Switching test circuit and waveforms. The switching test circuit and waveforms shall be as specified on figure 2.Provided by IHSNot for ResaleNo reproduction or networking permitted withou

21、t license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET4DSCC FORM 2234APR 973.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics areas specified

22、in table I and shall apply over the full case operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are described in table I.3.5 Marking. Marking shall be in accordance with M

23、IL-PRF-38535, appendix A. The part shall be marked with the PINlisted in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). Forpackages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has

24、 theoption of not marking the “5962-“ on the device.3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in complianceto MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark inaccordan

25、ce with MIL-PRF-38535 to identify when the QML flow option is used.3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as anapproved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-V

26、A prior tolisting as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein.3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be providedwith ea

27、ch lot of microcircuits delivered to this drawing.3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,appendix A.3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturersfacili

28、ty and applicable required documentation. Offshore documentation shall be made available onshore at the option of thereviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,appendix A.4.2 Screening. Screening s

29、hall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devicesprior to quality conformance inspection. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the

30、 manufacturer under document revision levelcontrol and shall be made available to the preparing or acquiring activity upon request. The test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified intest method 1015 of MIL-STD-8

31、83.(2) TA = +125G02C, minimum.b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parametertests prior to burn-in are optional at the discretion of the manufacturer.Provided by IHSNot for ResaleNo reproduction or networking permitted wi

32、thout license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions-55G02C G05 TC G05 +125G02Cunless otherwise specified 1/Group Asu

33、bgroupsDevicetypeLimits UnitMin MaxVCM = -7 V to+7 V1, 2, 3 0.2Differential inputhigh thresholdvoltageVTH IOH = -200 G04A,VOUT G07 VCC 1.2VVCM = -15 V to+15 V010.3VVCM = -7 V to+7 V1, 2, 3 -0.2Differential input lowthreshold voltageVTL IOL = 1.6 mA,VOUT G05 0.5 VVCM = -15 V to+15 V01-0.3VDifferentia

34、l inputhigh thresholdvoltageVTH2/IOH = -200G04A,VCM = -7 V to +7 V,VOUT G07 VCC 1.2 V,Fail-safe offset = +5 V1, 2, 3 01 0.7 VDifferential input lowthreshold voltageVTL2/IOL = 1.6 mA,VCM = -7 V to +7 V,VOUT G05 0.5 V,Fail-safe offset = +5 V1, 2, 3 01 0.2 VInput resistance RIN VCM = -15 V to +15 V,VCC

35、 = 0 V to + 15 V,TA = 25G02c1014 kG08Line terminationresistanceRIN TA = 25G02C1 01 100 300 G08VCM = 10 V 3.1VCM = 0 V -0.5Data input current(unterminated)IIND VCC = 0 V to+ 15 VVCM = -10 V1, 2, 3 01-3.1mAIOUT = -200G04A,VOUT G07 VCC 1.2 V0.4Input balance VTHB RS = 500 G08,VCM = -7 V to+7 VIOUT = 1.6

36、 mA,VOUT G05 V 0.5 V1, 2, 3 01-0.4VVCC = 4.5 V 3.3High level outputvoltageVOH ICUT = -200 G04A,VID = 1 V VCC = 15 V1, 2, 3 0113.8VLow level outputvoltageVOL IOUT = 1.6 mA,VID = -1 V,VCC = 4.5 V1, 2, 3 01 0.5 VSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking pe

37、rmitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics - Continued.Test SymbolConditions-55G02C G05 TC G05 +125G02Cunless otherwise

38、 specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxVCC = 5.5 V 15Power supplycurrentICC VCM = -15 V to 15 VVID = -0.5 V(both receivers)VCC = 15 V1, 2, 3 0130mAHigh level strobecurrentIIH VSTROBE = 15 V, VID = 3 V 1, 2, 3 01 100 G04ALow level strobecurrentIIL VSTROBE = 0 V, VID = -3 V 1, 2, 3 01 -

39、100 G04AVCC = 5 V 3.5VCC = 10 V 8.0High level strobeinput voltage 3/VIH VOL G05 0.5 VIOUT = 1.6 mAVCC = 15 V1, 2, 3 0112.5VVCC = 5 V 1.5VCC = 10 V 2.0Low level strobeinput voltage 3/VIL VOH = VCC 1.2 VIOUT = -200 G04AVCC = 15 V1, 2, 3 012.5VShort circuit outputcurrentIOS VOUT = 0 V, VCC = 15 V, 4/VS

40、TROBE = 0 V 1, 2, 3 01 -5 -40 mA9 100 nsPropagation delaytime high to lowoutput fromdifferential inputtPHLD CL = 50 pFSee figure 2 10, 11 2/011259 150 nsPropagation delaytime low to highoutput fromdifferential inputtPLHD CL = 50 pFSee figure 2 10, 11 2/01187970nsPropagation delaytime high to lowoutp

41、ut from strobeinputtPHLS CL = 50 pFSee figure 2 10, 11 2/01879 150 nsPropagation delaytime low to highoutput from strobeinputtPLHS CL = 50 pFSee figure 2 10, 11 2/011871/ Parameters are tested at VCC = 5 V unless otherwise specified. Limits shown apply to operation over the full voltage rangeof VCC

42、= 5 V to 15 V.2/ Guaranteed if not tested.3/ VIH and VIL parameters are guaranteed by the VOH and VOL tests.4/ Only one output may be shorted at a time.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE

43、 SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET7DSCC FORM 2234APR 97Device type 01Case outline ETerminal Number Terminal symbol1 Offset fail-safe2 -Input3 Termination4 +Input5 Strobe6 Response time7 Output8Gnd9 Output10 Response time11 Strobe12 +Input13 Termination14 -Input15 Fa

44、il-safe offset16 VCCFIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET8DSCC FORM 2234APR 97FIGURE 2. Sw

45、itching test circuits and waveforms.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89630DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET9DSCC FORM 2234APR 97TABLE II. Electrical test r

46、equirements.MIL-STD-883 test requirements Subgroups(in accordance withMIL-STD-883, method 5005,table I)Interim electrical parameters(method 5004)-Final electrical test parameters(method 5004)1*, 2, 3, 9Group A test requirements(method 5005)1, 2, 3, 9, 10, 11*Groups C and D end-pointelectrical parame

47、ters(method 5005)1, 2, 3* PDA applies to subgroup 1.* Subgroups 10 and 11 if not tested shall be guaranteed to the limits specified in table I.4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D ins

48、pections. The following additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.4.3.2 Groups C and D inspections.a. End-point electrical parameters shall be as sp

49、ecified in table II herein.b. Steady-state life test conditions, method 1005 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revisionlevel control and shall be made available to the preparing or acquiring activity upon request. The test circuitshall spec