DLA SMD-5962-89633 REV C-2009 MICROCIRCUIT LINEAR BUFFER AMPLIFIER HIGH SPEED MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R332-92. 92-09-22 CHARLES E. BESORE B Changes in accordance with NOR 5962-R218-93. 93-08-25 MICHAEL A. FRYE C Drawing updated to reflect current requirements. -rrp 09-12-02 CHARLES F. SAFFLE THE ORIGINAL FIRST

2、PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla

3、.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, BUFFER AMPLIFIER, HIGH SPEED, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-05-30 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89633 SHEET 1 OF

4、 9 DSCC FORM 2233 APR 97 5962-E658-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1

5、 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89633 01 X X Drawing number Device type (s

6、ee 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-5033 Video buffer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follow

7、s: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage between +V and V terminals 40 V dc Input voltage Equal to supplies Peak output current (50 ms

8、on, 1.0 s off) 200 mA Storage temperature range . -65C to +150C Maximum power dissipation (PD) 1.2 W Lead temperature (soldering, 10 seconds) +275C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 82C/W 1.4 Re

9、commended operating conditions. Positive supply voltage range (+V) +12 V dc to +15 V dc Negative supply voltage range (-V) . -12 V dc to -15 V dc Load resistance (RL) . 100 Ambient operating temperature (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without

10、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and ha

11、ndbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT

12、 OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documen

13、ts are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the

14、 text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-J

15、AN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accord

16、ance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the d

17、evice. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions s

18、hall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwi

19、se specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for eac

20、h subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible

21、due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced

22、with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUM

23、BUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOVIN= 0 V 1 01 15 mV 2, 3 25 Input bias cur

24、rent IIBRS= 1.0 k 1 01 35 A 2, 3 50 Voltage gain +AV1RL= 100 , VIN= 2.0 V 4 01 0.93 V/V 5, 6 0.92 -AV1RL= 100 , VIN= -2.0 V 4 0.93 5, 6 0.92 +AV2RL= 1.0 k, VIN= 10 V, TA= +25C 4 0.94 -AV2RL= 1.0 k, VIN= -10 V, TA= +25C 4 0.94 Output voltage swing +VOUT1RL= 100 , VIN= 12 V 1 01 8.5 V 2, 3 8.0 -VOUT1R

25、L= 100 , VIN= -12 V 1 -8.5 2, 3 -8.0 +VOUT2+V = 15 V, -V = -15 V, RL= 1.0 k, VIN= 15 V 1, 2, 3 12 -VOUT2+V = 15 V, -V = -15 V, RL= 1.0 k, VIN= -15 V 1, 2, 3 -12 Output current +IOUTVIN= 12 V, TA= +25C 1 01 80 mA -IOUTVIN= -12 V, TA= +25C 1 -80 Power supply current +ICCVOUT= 0 V 1, 2, 3 01 25 mA -ICC

26、VOUT= 0 V 1, 2, 3 -25 Power supply rejection ratio +PSRR +V = 7.0 V and 17 V, -V = -12 V 1, 2, 3 01 54 dB -PSRR -V = -7.0 V and -17 V, +V = +12 V 1, 2, 3 54 Input resistance 2/ RIN+V = 15 V, -V = -15 V, TA= +25C, VIN= 10 V, RL= 100 4 01 1.0 M Slew rate 2/ +SR +V = 15 V, -V = -15 V, TA= +25C, VOUT= -

27、5 V to 5 V, 7 01 1.0 V/ns -SR +V = 15 V, -V = -15 V, TA= +25C, VOUT= 5 V to -5 V, 7 01 1.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS C

28、OLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Full power bandwidth 2/ 3/ FPBW TA= +25C, VPK= 10 V

29、4 01 15.9 MHz Rise time 2/ 4/ trVOUT= 0 V to +200 mV, TA= +25C 9 01 6.0 ns Fall time 2/ 4/ tfVOUT= 0 V to -200 mV, TA= +25C 9 01 6.0 ns Output resistance 2/ ROUT1+V = 15 V, -V = -15 V 4 01 10 5, 6 12 ROUT2+V = 15 V, -V = -15 V 4 10 5, 6 12 Quiescent power consumption 2/ 5/ PC1+V = 15 V, -V = -15 V,

30、VOUT= 0 V, IOUT= 0 mA 1, 2, 3 01 750 mW PC2+V = 12 V, -V = -12 V, VOUT= 0 V, IOUT= 0 mA 1, 2, 3 01 600 1/ +V = +12 V, -V = -12, RS= 50 , RL= 1.0 k, CL 10 pF, and VOUT= 0 V, unless otherwise specified. 2/ If not tested, shall be guaranteed to the limits specified in table I. 3/ Full power bandwidth =

31、 SR / (2 x VPK). 4/ Rise and fall times measured between 10 % and 90 % point. 5/ Quiescent power consumption based on quiescent supply current test maximum (no load on outputs). 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as

32、an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certific

33、ate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verifica

34、tion and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networkin

35、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Case outline X Symbol Inches Millimeters Min Max Min Max A .130 .150 3.30 3.81 b .016 .021 0.41 0.53 D .585

36、 .615 14.86 15.62 D1.545 .555 13.84 14.10 e .400 BSC 10.16 BSC e1.100 BSC 2.54 BSC F .020 .040 0.51 1.02 k .027 .034 0.69 0.86 k1.027 .045 0.69 1.14 L .505 .562 12.83 14.27 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Pin numbers are for refere

37、nce only and do not appear on package. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM

38、 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 NC 2 CASE 3 NC 4 NC 5 +IN 6 NC 7 NC 8 NC 9 NC 10 -V 11 OUT 12 +V NC = No connection FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

39、MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screeni

40、ng shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained

41、 by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-

42、STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection

43、 shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be

44、omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

45、 level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test du

46、ration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89633 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9

47、DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005

48、) 1, 2, 3, 4, 5, 6, 7*,9* Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. * Subgroups 7 and 9 are guaranteed if not tested. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (origin