DLA SMD-5962-89648 REV B-2009 MICROCIRCUIT LINEAR OPERATIONAL AMPLIFIER WIDEBAND MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 00-05-12 R. MONNIN B Replace reference to MIL-STD-973 with reference to MIL-PRF-38535. - ro 09-05-05 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV

2、STATUS REV B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER CHECKED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY MICHAEL A. FRYE STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE

3、 BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-10-11 MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, WIDEBAND, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89648 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E160-09 Provided by IHSNot for Re

4、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-

5、883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89648 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 D

6、evice type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-2540 Wideband operational amplifier 02 EL-2040 Wideband operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Out

7、line letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage between V+ and V- terminals .

8、 35 V dc Differential input voltage (VID) 6.0 V dc Voltage at either input terminal . V+ to V- Peak output current ( 10% duty cycle) . 50 mA Maximum power dissipation (PD): Case C 1.03 W Case 2 . 1.06 W Derate linearly above TA= +75C: Case C 10.2C/W Case 2 . 10.6C/W Storage temperature range . -65C

9、to+150C Lead temperature (soldering, 10 seconds) . +275C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case C 98C/W Case 2 . 95C/W Provided by IHSNot for ResaleNo reproduction or networking permitted witho

10、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (V+) . +12 V dc to +15 V dc Negative supply voltage rang

11、e (V-) . -12 V dc to -15 V dc Common mode input voltage (VCM) . |(V+ - (V-) / 2| Load resistance (RL) . 1.0 k Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

12、 form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEF

13、ENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are

14、available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

15、 this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class

16、 level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance wit

17、h the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. T

18、hese modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be

19、as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein

20、, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are desc

21、ribed in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance

22、characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOVCM= 0 V 1 01 -10 +10 mV 2,3 -15 +15 1 02 -2 +2 2,3 -6 +6 Input bias current +IBVCM= 0 V, +RS= 1.1 k, 1 All -20 +20 A -RS= 100 2,3 -25 +25 -IBV

23、CM= 0 V, +RS= 100 , 1 -20 +20 -RS= 1.1 k 2,3 -25 +25 Input offset current IIOVCM= 0 V, +RS= 1.1 k, 1 All -6 +6 A -RS= 1.1 k 2,3 -8 +8 +VCMV+ = 5.0 V, V- = -25 V 1,2,3 All 10 V Common mode input range -VCMV+ = 25 V, V- = -5.0 V -10 PCVOUT= 0 V, IOUT= 0 mA 1,2,3 01 750 mW Quiescent power 2/ consumptio

24、n 02 510 +AVOLVOUT= 0 V and 10 V, 4 All 10 kV/V Large signal voltage range RL= 1.0 k 5,6 5 -AVOLVOUT= 0 V and -10 V, 4 10 RL= 1.0 k 5,6 5 +CMRR VCM= -10 V, V- = -25 V, 1,2,3 All 60 dB Common mode rejection ratio V+ = 5.0 V, VOUT= -10 V -CMRR VCM= -10 V, V+ = 25 V, 60 V- = -5.0 V, VOUT= 10 V See foot

25、notes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical perform

26、ance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output current +IOUTVOUT= -10 V, TA= +25C 1 All 10 mA -IOUTVOUT= 10 V, TA= +25C -10 Output voltage swing +VOUTRL= 1.0 k 1,2,3 All 10 V -VOUT-10 +ICCVOUT

27、= 0 V, IOUT= 0 mA 1,2,3 01 25 mA Quiescent power supply current 02 17 -ICC01 -25 02 -17 Power supply rejection ratio +PSRR V+ = 5.0 and 15 V, V- = -15 V 1,2,3 All 60 dB -PSRR V- = -5.0 V and -15 V, V+ = +15 V 60 Gain bandwidth 3/ product GBWP VOUT= 100 mV, RL= 1 k, fO= 1.0 MHz, TA= +25C 4 All 200 MH

28、z VOUT= 100 mV, RL= 1 k, fO= 40 MHz, TA= +25C 230 Output resistance 3/ ROUTOpen loop, TA= +25C 4 All 60 Full power bandwidth 3/ 4/ FPBW VPEAK= 10 V, TA= +25C, RL= 1 k 4 All 4.75 MHz Closed loop stable 3/ gain CLSG RL= 1 k, CL 10 pF 4,5,6 All 10 V/V Slew rate 3/ +SR VOUT= -5.0 V to +5.0 V, RL= 1 k, A

29、V= 10 V/V, 7 01 300 V/s measured at 4.0 V to +4.0 V 8 200 VOUT= -5.0 V to +5.0 V, RL= 1 k, AV= 10 V/V, 7 02 300 measured at 2.5 V to +2.5 V 8 200 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

30、WING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Ma

31、x Slew rate 3/ -SR VOUT= +5.0 V to -5.0 V, RL= 1 k, AV= 10 V/V, 7 01 300 V/s measured at 4.0 V to +4.0 V 8 200 VOUT= +5.0 V to -5.0 V, RL= 1 k, AV= 10 V/V, 7 02 300 measured at 2.5 V to +2.5 V 8 200 Rise time 3/ 5/ tRVOUT= 0 V to +200 mV, TA= +25C 9 All 30 ns Fall time 3/ 5/ tFVOUT= 0 V to 200 mV, T

32、A= +25C 9 All 30 ns Overshoot 3/ +OS VOUT= 0 V to +200 mV, TA= +25C 9 All 30 -OS VOUT= 0 V to 200 mV, TA= +25C 30 1/ Unless otherwise specified, V+ = +15 V, V- = -15 V, and CL 10 pF. Unless otherwise specified, for dc tests, RS= 100 , RL= 100 k, VOUT= 0 V, and for ac tests, AV= 10 V/V. 2/ Quiescent

33、power consumption is based on quiescent supply current test maximum (no load on outputs). 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ Full power bandwidth = SR / ( 2 x x VPEAK). 5/ Rise and fall times measured between 10 percent and 90 percent point. 3.5 Marki

34、ng. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the op

35、tion of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance

36、with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA

37、 prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

38、NG SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines C 2 Terminal number Terminal symbol 1 NC NC 2 NC NC 3 NC NC 4 -INPUT NC 5 +INPUT NC 6 V- -INPUT 7 NC NC 8 NC +INPUT 9 NC V- 10 OUTPUT NC 1

39、1 V+ NC 12 NC NC 13 NC NC 14 NC OUTPUT 15 - NC 16 - V+ 17 - NC 18 - NC 19 - NC 20 - NC NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY C

40、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notifi

41、cation of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made availa

42、ble onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices pri

43、or to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the prepar

44、ing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specifi

45、ed in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections.

46、 The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in t

47、able II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test

48、 circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89648 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OH