DLA SMD-5962-89665-1989 MICROCIRCUIT DIGITAL FAST CMOS 9-BIT WIDE BUFFERED REGISTERS MONOLITHIC SILICON《硅单片 9位宽缓冲寄存器 氧化物半导体高速数字微型电路》.pdf

1、A DESC-DWG-87bb5 57 m 7797775 0036838 T m dlsiribullon IC unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-87bb5 59 7777975 0036837 3 I I2 Part number. The cmplete part rrmrr shall be a show ia the fo31ow)ng exampk: 1 t I i r I a

2、L 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-87bb5 57 m 7777775 00168LiO 8 m 2. APPLICABLE DOCUMENTS 2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard, and bulletin

3、 of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for STANDARD MILITARY MIL-STD-883

4、 - Test Methods and Procedures for Microelectronics BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting

5、activity or as directed by the contracting activity. 1 references cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the 3. REQUIREIENTS 3.1 Item requirements. The individual item requirements shall b

6、e in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and here

7、in. 3.2.1 Terminal connections. 3.2.2 Truth table. The truth table shall be as specified on figure 2. . The terminal connections shall be as specified on figure 1. 3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless othe

8、rwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for eac

9、h subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number may marked with the part number listed in 1.2 herein. also Lie marked as listed in MIL-BUL-103 (see 6.6 herein). SIZE A 5962-8

10、9665 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET STANDARDIZED MILITARY DRAWING DAYTON, OHIO 45444 3 DESC FORM 193A SEP a7 t U. S. GOVERNMENT PRINTING OFFICE 1088-549-904 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-YbbS 57 7777

11、775 001b41 T W t TABLE I. Electrical poriWmance characteristics, .-_ . .- - . . ._._. “ . . L . _. . .-.- . )avicej Group A I Limits lunit type 1 sirbgraups -I I I Min I Max I I- _I I I 1 1 %_ . .- . I . -F All I 1,2,3 1 4.31 I 1 All 1 1,2,3 I 2,41 IV I 1 I I All I 1,2,3 1 0.2 I v I I I I _-_ II - .

12、 II - . I I 1 I I- - -1 All I 1 I-1.2 I Y I 1 I I . j -5.0 I /A Itlo I LIA ,_ , _, I I I= I- I -5.0 I PA I I A11 1. 1,2,3 I 1 1 I t I I 1“ I 1.5 1 mA All I I .I I ,-I, 6 I I I, ,I I I All I 1,2,3 I I 2.0 I mA All i 1,2,3 I 1 I I I ,S SUPPLY CENTER TABLE I. Electrical performance characteristics - Co

13、ntinued. SIZE A 5962-89665 REVISION LEVEL SHEET Total power supply current il Test ISymbol i Conditions (Device) Group A I Limits iUnit I I -55OC 5.3 Y or VIN 0.2 V, IVcc loutputs open, lone bit toggling at fI 5 MHz (50 percent duty cycle, UEr = GND I 5.5 Y, fcp = TO MHz, Functional tests Input capa

14、citance lonebit tggiing at fI :5 MHz 150 percent duty cycle, OE = GND I ISee 4.3.ld I CIN !See 4.3.1 I All i 1,2,3 1 .I 4.0 I mA I I I I I I l l All i 7,8 i I i I All 1 4 I l I I Output capacitance COUT See 4.3. IC I 12 i pF I I l I I I I I Propagation delay itpLH1, RL = 500n, time, CP to Yi ItpHL1

15、Isee figure 3 (u = low) I I Propagation del ay time, ta Yi I tPHL2 i I 1 l t I I Out ut enable time, ItpZH, I all other inputs at Vcc or GND. ?/ This parameter is not directly testable, but is derived for use in total power supply calculations. !/ ICC = ICCQ (AICC X DH X NT) (ICCD(f1 X NI fcp/2) whe

16、re: DH = Duty cycle for TTL inputs high NT = Number of TTL inputs at DH fI = Input frequency in MHz NI = Number of inputs at fi fcp = Clock frequency in MHz ?/ This parameter is guaranteed if not tested, to the limits specified in table I. 3.6 Certificate of compliance. A certificate of compliance s

17、hall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.6 herein). certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-STD-8

18、83 (see 3.1 herein) and the requirements herein. herein) shall be provided with each lot of microcircuits delivered to this drawing. The 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 3.8 Notification of change. Notification of change to DESC-ECS sha

19、ll be required in accordance with MIL-STD-883 ( see 3.1 herein) . 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. shall be made available onshore at the option of the reviewer. Of

20、fshore documentation 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). Provided by IHSNot for ResaleNo reproduction or networking permitted with

21、out license from IHS-,-,-DESC-DWG-7bb5 57 7777795 001bY5 7 = i t F f t r c r f i t E i E t 1. i i f a I L t I t F i I 2 3 B 4 F 5 i 6 t 7 F 8 I 9 t 23 5 24 c 25 L 26 t 22 E 28 f 1 NC u na Dl D2 B3 04 NC o5 06 D7 Il8 m GND NC CP EN Y8 Y6 Y5 NC Y4 Y3 Y2 YI YO - Y7 vcc SIZE : .A 5962-89665 STANDARDCZ E

22、D MIUTARY DRAWING k Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- ? DESC-DWG-7665 57 W 7777775 003b46 7 W ! SIZE A STANDARDIZED 5962-89665 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 9 Provided by IHS

23、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-9665 57 7979795 00Lb117 O Propagatfan delay OESC FORM 193A SE? 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-B7bb5 57 W 7779975 0016848 2 a 3v

24、ov 3v DATA I. 5v I NPYT f I MING IFiV 3v CLEAR I. 5 v CLOCK ENAB ov !. 1.5 v NOTES: 1. Diagram shown for input control enable: Low; input; control disable: High. 2. Pulse generator for a11 pulses: tf 5 2.5 ns, tr 5 2.5 ns. FIGURE 3. StJitching times waveforms and test circuit - Continued. DESC FORI4

25、 T93A SEP 87 Cr U. S. GOVERNMENT PRINTING OFFICE: 1988-550-547 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_- _- DESC-DWG-87b65 57 W 7777775 0016847 Lt W 7.0 Y Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

26、rom IHS-,-,-DESC-DWG-87665 57 9 7977775 0036850 O M SIZE A STANDARDIZED 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conductd devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015

27、of MIL-STD-883. Test condition A, B, Cy or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (1) (2) TA = +125C, minimum. except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection

28、. b. Interim and final electrical test parameters shall be as specified in table II herein, Quality conformance inspection shall be in accordance with iethod 5005 of MIL-STD-883 including groups A, By Cy and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. T

29、ests shall be as specified in table II herein. b. c. Subgroups 5 and 6 in table I, method 5005 of MIL-STO-883 shall be omitted. Subgroup 4 (GIN and COUT measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. Test all applicable pin

30、s on five devices with zero failures. Subgroup 7 and 8 tests shall verify the truth table as specified on figure 2 herein. d. 4.3.2 Groups C and D inspections. a. b. End-point electrical parameters shall be as specified in table II herein. Steady-state life test conditions, method 1005 of MIL-STD-88

31、3. (1) (2) TA = +125OC, minimum. (3) Test duration: Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein). 1,000 hours, except as permitted by method 1005 of MIL-STO-883. 5962-89665 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CEMER DAYTON, OHIO

32、45444 REVISION LEVEL SHEET 13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-8966.5 59 m 999999.5 001b51 2 m i 5, PACKAGING TABLE II. Electrical test, requirements. I I Subgroups I I MIL-STD-883 test requirements I (per method I I 5005, tab

33、le I) I I I I r I I i I i Interim electrical parameters I - 1 (method.5004) I -1 I I I Final electrical test parameters I 1*,2,3,7,8,9, I Id (method 50041 I 10,ll I I I I I Group A test requirements I 1,2,3,4,7,8, I 1 .(metbod ,5005) I 9,10,11, . I I I I I Groups C and D end-point I 1,293 l I electr

34、ical parameters I I f JmetJod. 5051, I I * PDA applies to subgroup 1. 51 Pq$ka.g-ng_r,e.qui.rements. The requirements for packaging shall be in accordance with MIL-M-38510, 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military SpecIfications d flot ex

35、ist and qualified military devices that will perform the required function are not available for OEM application. When a military specification exists and the product covered by this drawing has been qualified for listing on QPt-38510, the device specified herein will be fnactvated and will not be u

36、sed for new design. The QPL-38510 product shall be the preferred item for all applications, covered-or-prepared specification or drawing. with the users of record for the indfvidual documents. This coordination will be accomplished in accordance wth MIL-CTD-481 using DD Form 1693, Engineering Change

37、 Proposal (Short Form), center when a .system-plication requires configuratlon control and the applicable SMD. DESC will maintain a record of users and thJs list will be used for coordination and distribution of changes to the drawings, Users of drawings covering microelectronics devices (FSC 5962)

38、should contact DESC-ECS, telephone (513) 2964022. 6.2 Re laceability. Microcircuits cavered by this drawing will replace the same generic device 6-3 onfigu.ratSo.nontro1 .of SMDs. All proposed changes to existing SMDs will be coordlnated 6.4 Record of us3rs. Military and industrial users shall infor

39、m Defense Electronics Supply 6.5 Comnents. Caments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telepho- 296-5375. SIZE A 5962-89665 STAN DARDE ED MILITARY DRAWING REVSIN LEVEL SHEET bEFENJE UEGWNICS SUPPLY CENTER bAYtbN, OHK) 45444 14 - . - t U. 9 GOVERNMENT PRINTHKI MF- 1

40、088-Y%m ESC FORM 193A CEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-87665 57 7777775 0036852 4 STANDARDIZED MILITARY DRAWING DEFENCE ELECTRONICS SUPPLY CENTER DAYTON. OHIO 45444 6-6 Approved source of supply. An approved source of s

41、upply is listed in MIL-BUL-103. The approved source of supply listed below is for 4dditional sources will be added to MIL-BUL-103 as they become available. YIL-BUL-103 has agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-ECS. informat

42、ion purposes only and is current only to the date of the last action of this document. The vendor listed in 5962-89665 SIZE A REVISION LEVEL SHEET 15 I 1 I I I I Vendor I Vendor I I Military drawing I CAGE I similar part I I part number I number I number I.-/ I I I I I I I I I I 5962-8966501KX I 617

43、72 I IDT54FCT824AEB I I I I I I I I 5962-8966501LX I 61772 I IDT54FCT824ADB I ! I I I I I I I I 5962-89665013X I 61772 I IDT54FCT824AL.B I I I I I ll I I I I I 5962-8966502KX I 61772 I IDT54FCT824BEB I I I I l I 5962-8966502LX I 61772 I IDT54FCT824BDB I 1 I I I I 5962-89665023X I 61772 I IDT54FCT824

44、BLB I I l I l 1 1 I - i/ Caution. Do not use this number for item acquisition. Itemccquired by this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 61772 Vendor name and address Integrated Device Technology 1566 Moffett Boulevard Salinas, CA 93905 Point of contact: 3236 Scott Boulevard Santa Clara, CA 95054 I I ir U. S. GOVERNMENT PRINTING OFFICE 1988-550-547 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-