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本文(DLA SMD-5962-89673 REV A-2008 MICROCIRCUITS LINEAR HIGH OUTPUT CURRENT OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf)为本站会员(terrorscript155)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-89673 REV A-2008 MICROCIRCUITS LINEAR HIGH OUTPUT CURRENT OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make correction to the differential input current limit and footnote 2/ as specified under paragraph 1.3. - ro 08-11-14 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A OF SHEET

2、S SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY RICK C. OFFICER CHECKED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY MICHAEL A. FRYE STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE

3、 DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-11-17 MICROCIRCUITS, LINEAR, HIGH OUTPUT CURRENT, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-89673 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E495-08 Provided by IHSNot for ResaleNo reproduction or netw

4、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN clas

5、s level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89673 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device t

6、ype(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OP-50A High output current operational amplifier (AVCL 5) 02 OP-50B High output current operational amplifier (AVCL 5) 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as f

7、ollows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage 18 V 1/ Internal power dissipation . 500 mW Input voltage . Sup

8、ply voltage Differential input voltage . 10 V 2/ Differential input current 20 mA 2/ Output short circuit duration Indefinite Output current . 50 mA Storage temperature range . -65C to +150C Lead temperature (soldering, 60 seconds) . +300C Thermal resistance, junction to case (JC) . See MIL-STD-1835

9、 Thermal resistance, junction to ambient (JA) 91C/W 1.4 Recommended operating conditions. Positive supply voltage (V+) . +VOP= +15 V Negative supply voltage (V-) . -VOP= -15 V No compensation, unless otherwise noted, source resistance (RS) . 50 Ambient operating temperature range (TA) . -55C to +125

10、C _ 1/ Supply voltage rating applies to all power supply pins. No device pins should be connected to a voltage potential lower than the negative supply to V-, pin 5. 2/ The device inputs are protected by 250 series resistors and protection diodes. If the differential input voltage exceeds 10 V, the

11、input current must be limited to 20 mA. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICA

12、BLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMEN

13、T OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-1

14、03 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Or

15、der of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1

16、Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manu

17、facturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may

18、make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow opt

19、ion is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal con

20、nections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The e

21、lectrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufact

22、urers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN dev

23、ices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without lic

24、ense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C RS= 50 , Group A subgroups Device type Limit

25、s Unit V+ = +VOP= +15 V, V- = -VOP= -15 V unless otherwise specified Min Max Input offset voltage VOS1 01 25 mV 2,3 55 1 02 100 2,3 200 Input offset current IOSRS= 50 k 1 01 1 nA 2,3 3 1 02 3 2,3 12 Input bias current IBRS= 50 k 1 01 5 nA 2,3 8 1 02 10 2,3 20 CMRR VCM= 10 V 1 01 126 dB Common mode r

26、ejection ratio 2,3 120 1 02 110 2,3 105 PSRR VS= 5 V to 15 V 1 01 0.5 V/V Power supply rejection ratio 2,3 1.25 1 02 1.0 2,3 1.25 Offset voltage range adjustment VOSadj RP= 100 k 1 All 1 mV Quiescent supply current ISYNo load 1 All 3.3 mA 2,3 4.0 Provided by IHSNot for ResaleNo reproduction or netwo

27、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C RS= 50

28、, Group A subgroups Device type Limits Unit V+ = +VOP= +15 V, V- = -VOP= -15 V unless otherwise specified Min Max Positive current limit +ISCOutput shorted to ground 1 All 60 120 mA Negative current limit -ISCOutput shorted to ground 1 All -120 -60 mA Output voltage swing VORL 500 1 All 13 V 2,3 12

29、RL= 500 , V+ = +VOP= +5 V, V- = -VOP= -5 V 1 3.5 RL= 50 , V+ = +VOP= +5 V, V- = -VOP= -5 V 1 2.5 AVOVO= 10 V, RL= 1 k 1 01 10 V/V Large signal voltage gain 02 7.5 2,3 All 4.0 Noise voltage density enfO= 10 Hz 7 All 12.0 nV/Hz fO =1 kHz 10.0 Slew rate SR RL 2 k, RC= 560 , CC= 4.7 nF 7 All 2.5 V/s Inp

30、ut offset voltage drift TCVOS8 01 0.3 V/C 02 1.0 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 D

31、evice types 01 and 02 Case outline C Terminal number Terminal symbol 1 +INPUT 2 -INPUT3 NC 4 NC 5 V- 6 OUTPUT 7 -VOP8 NC 9 V+ 10 +VOP11 COMPENSATION 12 COMPENSATION 13 NULL 14 NULL FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr

32、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved sou

33、rce of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conforma

34、nce. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review

35、. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection pro

36、cedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 o

37、f MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissi

38、pation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of

39、 the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table I

40、I herein. b. Subgroups 4, 5, 6, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A

41、, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordanc

42、e with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

43、 5962-89673 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Fin

44、al electrical test parameters (method 5004) 1*, 2, 3, 7 Group A test requirements (method 5005) 1, 2, 3, 7, 8 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance wit

45、h MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the

46、 same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering C

47、hange Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of

48、changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. Provided by

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