DLA SMD-5962-89717 REV A-1992 MICROCIRCUIT DIGITAL 32-BIT CASCADABLE BARREL SHIFTER MONOLITHIC SILICON《硅单片 32位可级联圆筒移位器 数字微型电路》.pdf

1、SMD-5962-897L7 REV A 9959996 0032398 5T8 W NOTICE OF REVISION (NOR) (See MIL-STD-480 for instructions) This revision described below has been authorized for the document listed. Form Approved OMB NO. 0704-0188 DATE (-1 92/10/29 1. ORIGIHATOR Ivu add “A“ Revisions description column: add “Changes in

2、accordance with Revisions date column: add “92-10-29“. Revision level block; add “A“. Revision status of sheet; for sheet 5, add “A“. Table I, Vcc current, quiescent (Iccz) Change the maximm limit from: “1.0 m9“ Revision level block; add “A“. NOR 5962-R008-93“. . Sheet 5: to: “1.5 m9“. 67268 5962-89

3、717 7. REVISIOW LETTER (Current) NEW (New) A 8. ECP 0. 5962-89717ECP-1 11. THIS SECTIOW FOR GoyERmEHT USE ONLY a. CHECK ONE XIEXISTING DOCUMENT SUPPLEMENTED REVISED DOCUMENT MUST BE CUSTODIAN OF MASTER DOCUMENT BY THIS NOR MAY BE USED IN HANUFACTURE. MAY INCORPORATE THIS CHANGE. FURNISH REVISED DOCU

4、MENT TO: RECEIVED BEFORE MANUFACTURER SHALL MAKE ABOVE REVISION AND .- b. ACTIVITY AUTHORIZED TO APPROVE DATE (YYMMD) CHANGE FOR GOVERNMENT 92/10/29 DESC-ECC 12. ACTIVITY ACconLISHIHG REVISION ESC-ECC 92/10/29 b Form 1695, JUL 88 Previous editions are obsolete. DATE (YYHMDD) Provided by IHSNot for R

5、esaleNo reproduction or networking permitted without license from IHS-,-,-L . LTR DESCRIPTION 4 SMD-5762-89737 REV A m 9999996 0032399 434 DATE (YR-W-DA) APPROVED SIZE A REV I I I CAGE CODE 5962-89717 67268 * SHEET - REV STATUS OF SHEETS PMIC NIA STANDARDIZED MILITARY DRAWING s THIS DRAUING IS AVAIL

6、ABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTHENT OF DEFENSE AMSC N/A !ESC FORM 193 JUL 91 + SHEET PREPARED-BY DRAUING APPROVAL DATE 92/03/16 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, 32-BIT CASCADABLE BARREL SHIFTER, MONOLITHIC SILICON I I REVISION LEV

7、EL 5962-E366 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- “SND-59b2-897l17 REV A W 9999996 0032200 T8b M c 1. SCOPE 1.1 Scope. This drawing forms a part of a one pa

8、rt - one part number documentation system (see 6.5 herein). Two product assurance classes consisting of military high reliability (device classes 8, Q, and M) and space application (device classes Siand V), and a choice of case outlines and lead finishes are available and are reflected in the Part o

9、r Identifying Number (PIN). Device class H microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of HIL-STD-883, t8Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of radiation hardness assurance (RHA) levels are refle

10、cted in the PIN. When 1.2 M. The PIN shall be as shown in the following example: 5962 8971 7 o1 M X X I I I I I I I I I I I I Lead Case Devi ce Devi ce stock class designator type class out 1 i ne finish / (See 1.2.3) III Federal RHA designator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2

11、.5) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes M, B, and S RHA nrarked devices shall meet the Device classes Q and V RHA MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. marked devices shall meet the MIL-1-38535 speci

12、fied RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device typeCs) shall identify the circuit function as follows: Device type Generic number Circuit function Nanoseconds o1 o2 LSH32 32-bit cascadable barrel shifte

13、r 50 ns LSH32 32-bit cascadable barrel shifter 40 ns 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN clas

14、s i3 microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Q or V Cert i f i cat ion and qualification to MIL-M-38510 Certification and qualification to MIL-1-38535 1.2.4 Case outline(s). For device classes M, 8, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510

15、and as listed below. MIL-1-38535, appendix C of MIL-M-38510, and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of Outline letter Case outline X Y C-7 (VISION LEVEL SHEET STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC

16、 FORM 193A .TlTT. 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-89717 A REVISION LEVEL SHEET SND-5962-897l17 REV A m 9999996 0032203 795 m - TABLE I. El

17、ectrical performance characteristics. its i Unit I I I IV I Max I Test I Syrnbo 1 I I I I Output high I OH voltage ;roup A Device subgroups I types I Conditions I/ -55OC 5 TA 5 t125OC unless otherwise specified 4.5 v 5 vcc 5 5.5 v - -2.0 mA VIN = 2.0 V, 0.8 V 2/ Li Min 2.4 1, 2, 3 i All I I I I I I

18、I I I output low VOL I IIX voltage Input current IoL = 8.0 mA VIN = 2.0 V, 0.8 V vcc = 4.5 v 2/ I .5 I v 1, 2, 3 I All I I I I IP I I +20 I I I PA I I t20 I I I I I 1, 2, 3 I All I VIN = o v I -20 I IN = CC I , vcc = 5.5 I I I I I 1, 2, 3 I All I I I I Output leakage i IOZ i Ios current Output short

19、 current I -20 I vcc = 5.5 v OUT = CC VOUT = Ground, Vcc = max -1- 3/ 6/ I I 1, 2, 3 I All I I -250 I mA I vcc = 5.5 v VIN = o to 3 v A/ I I 1, 2, 3 I All I 30 IM I I 1.0 I mA I I 7 I PF L I i %Cl V current, these tests shall have been fault graded in accordance with MIL-STD-883, test method 5012 (s

20、ee 1.5 herein). For device classes For device classes Q and V, subgroups 7 and 8 shall include verifying the functionality of the C. Subgroup 4(C and C measurements) shall be measured only for the initial test and after processor design changes whicANmay af?ect capacitance. Sample size is 15 devices

21、 with no failures, and all input and output termi na 1s tested. 4.4.2 Group B inspection. table IIA herein. The group B inspect ion end-point electri cal parameters shall be as specified in 4.4.3 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in tabl

22、e IIA herein. 4.4.3.1 Additional criteria for device classes M, 8, and S. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A. For device class M, the test circuit shall be submitted to DESC-ECC for review with the certificate of compliance. activity. For device classe

23、s B and S, the test circuit shall be submitted to the qualifying b. TA = +125“C, minimum. c. Test duration: 1,ooO hours, except as permitted by method 1005 of HIL-STD-883. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59bZ

24、-897L7 REV A W 994999b 00322bY 570 = 4.4.3.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and :est temperature or approved alternatives shall be as specified in the device manufacturers QM plan In accordance iith MIL-1-38535. :ompliance and shal

25、l be under the control of the device manufacturers TRB in accordance with MIL-1-38535. The steady-state life test circuit shall be submitted to DESC-ECC with the certificate of 4.4.4 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in 4.4.5 Group E ins

26、pection. Group E inspection is required only for parts intended to be marked as radiation iable IIA herein. iardness assured (see 3.5 herein). ievice class M shall be M and D. RHA quality conformance inspection Sample tests shall be perforaied at the RHA level ;pecified in the acquisition document.

27、RHA tests for device classes B and S for levels M, D, R, and H or for device class M for levels M aiid D shall be performed through each level to determine at what levels the devices meet the RHA requirements, These RHA tests shall be performed for initial qualification and after design or process c

28、hanges which may affect the RHA performance of the device. End-point electrical parameters shall be as specified in table IIA herein. Prior to total dose irradiation, each selected sample shall be assenibled in its qualified package. pass the specified group A electrical parameters in table I for su

29、bgroups specified in table IZA herein. For device classes M, 6, and S, the devices shall be subjected to radiation hardness assured tests as specified in MIL-M-38510 for RHA level being tested, and meet the Postirradiation end-point electrical parameter limits as defined in table I at TA +25C I5 per

30、cent, after exposure. Prior to and during total dose irradiation testing, the devices shall be biased to establish a worst case condition as Specified in the radiation exposure circuit. For device classes H, B, and S, subgroups 1 and 2 in table V, method 5M35 of HIL-STD-883 shall be tested as approp

31、riate for devi ce construct ion. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. RHA levels for device classes 8, S, Q, and V shall be M, O, R, and H and for a. b. c. It shall d. e. f. g. 5. PACKAGING 5.1 Packaging requirements. The rquirements for

32、 packaging shall be in accordance with MIL-M-38510 for device classes H, B, and S and MIL-1-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (origi na1 equipment), design applications,

33、and logist i cs purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.1.2 Substitutability. 6.2 Confiauration control of SMDIS. All proposed changes to existing SMDs will be coordinated

34、with the users of This coordination will be accomplished in accordance with MIL-STD-481 using DD Device classes B and Q devices will replace device class H devices. record for the individual documents. Form 1693, Engineering Change Proposal (Short Form). application requires configuration control an

35、d which SHDls are applicable to that system. of users and this list will be used for coordination and distribution of changes to the drawings, covering microelectronic devices (FSC 5962) should contact DESC-ECC, telephone (513) 296-6022. 6.3 Record of users. Military and industrial users shall infor

36、m Defense Electronics Supply Center when a system DESC will maintain a record Users of drawings 6.4 Comments. Comments on this drawing should be directed to DESC-ECC, Dayton, Ohio 45444, or telephone (513) 296-8526. STANDARD1 ZED SIZE 5962-89717 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER D

37、AYTON, OHIO 45444 REVISION LEVEL SHEET 16 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SPlD-5962-B97L7 REV A 9999996 0032235 407 REVISION LEVEL 6.5 One part - one part number system. The one part - one part number system described below has been d

38、eveloped to illow for transitions between identical generic devices covered by the four major microcircuit requirements documents :MIL-M-38510, MIL-H-38534, MIL-1-38535, and 1.2.1 of MIL-STD-883) without the necessity for the generation of unique INS. wiufacturer upgraded military product from one c

39、lass level to another, the benefits of the upgraded product were inavailable to the Original Equipment Manufacturer (OEM), that was contractually locked into the original unique PIN. 3y establishing a one part number system covering all four documents, the OEM can acquire to the highest class level

40、available for a given generic device to meet system needs without modifying the original contract parts selection :riteria. The four military requirements documents represent different class levels, and previously when a device SHEET 17 Example PIN Manuf actur i ng Document Military documentation fo

41、rmat under new system source listing 1 i st i ng Jew MIL-M-38510 Mi Litary Detai 1 5962-89717ZZEi or S)W QPL-38510 MIL-BUL-103 jpecifications (in the SMD format) (Part 1 or 2) Jew MIL-H-38534 Standardized Military 5962-89717ZZCH or K)W QML-38534 MIL-BUL-103 )raw i ngs leu MIL-1-38535 Standardized Mi

42、 litary 5962-89717ZZ(Q or V)YY QML-38535 MIL-BUL-103 )ravings Jew 1.2.1 of MIL-STD-883 Standardized 5962-89717ZZ(M)YY MIL-BUL-103 MIL-BUL-1 O3 li litary Drawings 6.6 Sources of supply. 6.6.1 Sources of supply for device classes B and S. Sources of supply for device classes B and S are listed in JPL-

43、38510. 6.6.2 Sources of supply for device classes Q and V. ;VIL-38535. and have agreed to this drawing. Sources of supply for device classes Q and V are listed in The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DESC-ECC 6.6.3 Approved sources of supply

44、for device class M. MIL-BUL-103. herein) has been submitted to and accepted by DESC-ECC. Approved sources of supply for class M are listed in The vendors listed in MIL-BUL-103 have agreed to this drawing and a certificate of compliance (see 3.6 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPL

45、Y CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 91 A I I 5962-89717 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-897L7 REV A 7999996 0032236 343 W 5962-8971702MXX I 5962-8971702MYX I STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN 6

46、5896 I LSH32KMB40 65896 I LSH32GMB40 I I DATE: 92/ 03/ 16 Approved sources of supply for SMD 5962-89717 are listed below for immediate acquisition only and shall be added to MIL-BUL-103 during the next revision. vendors listed below have agreed to this drawing and a certificate of compliance has bee

47、n submitted to and accepted by DESC-ECC. MIL-BUL-103 will be revised to include the addition or deletion of sources. The This bulletin is superceded by the next dated revision of MIL-BUL-103. I I I I number I I I Standardized 1 Vendor I Vendor I I military drawing I CAGE I similar PIN I/ I Vendor CA

48、GE number 65896 Vendor name and address Logic Devices Incorporated 628 E. Evelyn Avenue Sunnyvale, CA 94086 I I assumes no liability whatsoever for any inaccuracies in this information bulletin. I The information contained herein is disseminated for convenience only and the Government I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-