DLA SMD-5962-89718 REV D-2011 MICROCIRCUIT HYBRID LINEAR DIGITAL-TO-ANALOG CONVERTER WITH INPUT REGISTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor cage 33256. Editorial changes throughout. 91-03-13 W. Heckman B Changes made in accordance with NOR 5962-R059-92. 91-11-19 Gregory Lude C Update drawing to the latest requirements. -sld 05-10-24 Raymond Monnin D Updated drawing paragra

2、phs. -sld 11-11-08 Charles F. Saffle The original first page of this drawing has been replaced REV SHEET REV SHEET REV STATUS REV D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ S

3、TANDARD MICROCIRCUIT DRAWING CHECKED BY Donald R. Osborne THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, DIGITAL-TO-ANALOG CONVERTER WITH INPUT REGISTER DRAWING APPROVAL DATE 90-05-10 AMSC N/

4、A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89718 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E052-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION L

5、EVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to processed in accordance with MIL-PRF-38534. 1.2 PIN. The PIN shall be as shown in the following example: 5962-89718 01 X X Drawing number Device type Case outline L

6、ead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MN3020 8-bit D/A converter with input register 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835

7、 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 18 Hybrid package 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) -0.5 V dc to +18 V dc Negative supply voltag

8、e range (VEE) . +0.5 V dc to -18 V dc Logic supply voltage range (VDD) -0.5 V dc to +7 V dc Digital input voltage range -0.5 V dc to +5.5 V dc Register enable voltage range -0.5 V dc to +5.5 V dc Power dissipation (PD) 680 mW Thermal resistance, junction-to-case (JC) . 7C/W Thermal resistance, junct

9、ion-to-ambient (JA) . 39C/W Lead temperature (soldering, 10 seconds) . +300C Storage temperature range . -65C to +150C Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. Positive supply voltage range (VCC) +14.55 V dc to +15.45 V dc Negative supply voltage range (VEE) . -14.55 V

10、 dc to -15.45 V dc Logic supply voltage range (VDD) +4.75 V dc to +5.25 V dc Ambient operating temperature range (TA) . -55C to +125C 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect r

11、eliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification

12、, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534

13、- Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HD

14、BK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict betw

15、een the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance

16、 requirements shall be in accordance with MIL-PRF-38534. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and fig

17、ure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Logic coding. The logic coding shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as spec

18、ified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of d

19、evice(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device descr

20、ibed herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This

21、data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

22、 SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VCC= +15 V dc, VEE= -15 V dc, VDD= +5 V dc unless otherwise specified Group A subgroups Device type Limit

23、s Unit Min Max Digital input logic levels VIHVILFor all digital inputs 1,2,3 01 +2.0 +0.7 V Digital input currents IIHIILVIH= +2.4 V VIL= +0.3 V 1,2,3 01 +30 -0.6 A mA Register enable input currents IIHIILVIH= +2.4 V VIL= +0.3 V 1,2,3 01 +40 -0.8 A mA Power supply drain currents +15 V -15 V +5 V +IC

24、C-IEE IDD 1,2,3 01 +20 -13 +37 mA mA mA Power dissipation PD 1,2,3 01 680 mW Power supply rejection ratio +15 V -15 V PSRR +14.5 V +VCC +15.5 V -15.5 V -VEE -14.5 V 1,2,3 01 0.06 0.02 %FS%Vs %FS%Vs Unipolar +10 V zero +full scale VZV+FSMSB LSB Nominal 0000 0000 ( 0.0000) 1111 1111 (+9.9605) 4,5,6 01

25、 -0.039 +9.921 +0.039 +10.000 V Unipolar -10 V zero -full scale VZV-FSMSB LSB Nominal 0000 0000 ( 0.0000) 1111 1111 (-9.9605) 4,5,6 01 -0.039 -10.000 +0.039 -9.921 V Bipolar 10 V -full scale zero +full scale V-FSVZV+FSMSB LSB Nominal 0000 0000 (-5.0000) 1000 0000 ( 0.0000) 1111 1111 (+4.9605) 4,5,6

26、01 -5.039 -0.039 +4.921 -4.961 +0.039 +5.000 V Bipolar 20 V -full scale zero +full scale V-FSVZV+FSMSB LSB Nominal 0000 0000 (-10.0000) 1000 0000 ( 0.0000) 1111 1111 (+9.9220) 4,5,6 01 -10.078 -0.078 +9.844 -9.922 +0.078 +10.000 V Linearity error LIN VOUT = +full scale 4,5,6 01 -0.5 +0.5 LSB Analog

27、output current IO4,5,6 01 4 mA Settling time tS10-volt step, see figure 4 4,5,6 01 3 s Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5

28、 DSCC FORM 2234 APR 97 Symbol Inches Millimeter Min Max Min Max A .120 .170 3.05 4.32 A1 .015 .035 .38 .89 b .016 .020 .41 .51 c .009 .012 .23 .30 D .977 1.027 24.82 26.09 D1 .795 .805 20.19 20.45 e .095 .105 2.41 2.67 eA .295 .305 7.49 7.75 E .480 .520 12.14 13.21 L .200 .230 5.08 5.84 S .080 .110

29、2.03 2.79 s1 .075 .105 1.91 2.67 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1. C

30、ase outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Termi

31、nal symbol 1 VCC2 BIT 1 (MSB) 3 BIT 2 4 BIT 3 5 BIT 4 6 BIT 5 7 BIT 6 8 BIT 7 9 BIT 8 (LSB) 10 Register enable 11 VDD12 Ground 13 VEE14 Analog output 15 Range select 16 Summing junction 17 Bipolar offset 18 Unipolar offset FIGURE 2. Terminal connections. Input coding and output range selection Digit

32、al input Analog output (dc volts) MSB LSB Unipolar positive Unipolar negative Bipolar 5 Bipolar 10 00000000 00000001 01111111 10000000 11111110 11111111 0.000 +0.039 +4.961 +5.000 +9.922 +9.961 -9.961 -9.922 -5.000 -4.961 -0.039 0.000 -5.000 -4.961 -0.039 -0.000 +4.922 +4.961 -10.000 -9.922 -0.078 0

33、.000 +9.844 +9.922 Connect pin to pin 14 to 15 17 to GND 18 to GND 14 to 15 16 to 18 17 to GND 14 to 15 16 to 17 18 to GND 16 to 17 18 to GND FIGURE 3. Logic coding. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

34、 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 NOTES: 1. Minimum enable pulse width (tMEPW) is 60 ns. 2. Minimum setup time digital input data to enable (tSDE) is 40 ns. 3. Hold time (tH) is defined as the required delay between leading edge of

35、register enable and the end of valid input data. The hold time is 0 ns. 4. Output settling time (tOS) for a 10-volt change to (LSB) is 3 s maximum. FIGURE 4. Timing diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN

36、G SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted t

37、o DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing

38、. TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - - - Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical paramet

39、ers 1, 2, 3 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers

40、Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test cond

41、ition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power diss

42、ipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter te

43、sts prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. Provided by IHSNot for ResaleNo reproduction or networking pe

44、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 89718 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be

45、 as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point e

46、lectrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Ma

47、ritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-88

48、3. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance w