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本文(DLA SMD-5962-89731-1989 MICROCIRCUITS DIGITAL FAST CMOS 8-BIT TRANSCEIVER WITH PARITY TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 8位同位锁存收发器 高速氧化物半导体数字微型电路》.pdf)为本站会员(fuellot230)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-89731-1989 MICROCIRCUITS DIGITAL FAST CMOS 8-BIT TRANSCEIVER WITH PARITY TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 8位同位锁存收发器 高速氧化物半导体数字微型电路》.pdf

1、 REV SHEET REV I SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 I PMIC N/A PREPAREDtY I hhhk I DEFENSE ELECTRONICS SUPPLY CENTER STANDARDIZED M I LITA RY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DAYTON, OHIO 45444 M

2、ICROCIRCUITS, DIGITAL, FAST, CMOS, 8-BIT AMSC NIA , I I SHEET 1 OF 14 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SCOPE 1,l SCO e. This drawing describes dev3ce requirements for class B microcircuits ln accordance lth l.he extent specified herein

3、. SPECIFICATION MILITARY SIZE A 5962-89731 REVISION LEVEL SHEET 3 MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MI L I TARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the

4、 specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. 1 eeferences cited herein, the text of this drawing shall take precedence. 2.2 Order of prec

5、edence. 3. REQUIREMENTS 3.1 Item re uirements. The individual item requirements shall be in accordance with 1.2.1 of In the event of a conflict between the text of this drawing and the UIIL-STDZEd, “%ovislons for the use of MIL-STD-883 in conjunction with compliant non-JAN devices” Ind as specified

6、herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensid an erein. 3.2.1 Terminal connections, The terminal connections shall be as specified on figure 1. 3.2.2 Truth tables. The truth tables shall be as specified on figure 2. 3.2.3 Logic diagram. Th

7、e logic diagram shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and apply over the

8、 full case operating temperature range. specified in table II. The electrical tests for each subgroup are described in table I. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall 3.4 Electrical test requirements. 3.5 Markin . The electrical test requirements shall be th

9、e subgroups be marked _it wit the part number listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in MIL-BUL-103 (see 6.6 herein). DESC FORM 193A SEP 87 t U. S. QOVERNMENT PRINTINU OFFCE: 1888-548-801 Provided by IHSNot for ResaleNo reproduction or networkin

10、g permitted without license from IHS-,-,-TABLE I Electrical perfannance characteristics. Conditions I Oevlu I -55C 5.3 Y, Qukcent power suppiylttfc IVcc a 5.5 Y, VIN a 3.4 V z/ I All lynarnic power supply Itcc IVcc 8 5.5 V, outputs open, I A12 I i 1 c lkn I GND, 50% duty-cycle I - IV NZ 5.3 Y or YIN

11、 - ov DATA INPUT 1.5 V - ov -3 v TIMING 1.5 V INPUT -0 v CLEAR -0 v 3v 1.5 V ov - PRESET CLEAR - - t, 4 t-tw + 3v HIGH-LOW-HIGH INPUT PULSE FIGURE 4. Switching waveforms and test circuit - Continued. STANDARDIZED MILITARY DRAWING 5962-89731 DEFENSE ELECTAONICS SUPPLY CENTER REVISION LEVEL . SHEET I

12、DAYTON, OHIO 45444 11 tU.S.GOVEWIMENTPMNnNG OFFICE 1988-549-804 ESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-J 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer In ordex be listed

13、 as an approved source of supply in MIL-BUL-103 (see 6.6 herein). The certiflcate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. 3.7 C

14、ertificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall -be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chap Notification of change to DESC-ECS shall be required in accordance with MIL-STO-883 ( see 3.1 erei

15、n). 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review Rie manufacturers facfli ty and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Samp

16、ling and ins ection. Sampling and inspection procedures shall be in accordance with 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STO-883, and shall be section 4 of MIL-M-38dO to the extent specified in MIL-STD-883 (see 3.1 herein). conducte T-lf on a devices prior to quali

17、ty conformance inspection. The following additional criteria chali apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125*C, minimum, b, Interim and final electrical test para

18、meters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer, 4.3 Quall ty conformance inspection. Quality conformance inspection shall be in accordance with nethod SOOS of MIW-883 including groups A, B

19、, C, and D inspections. The following additional :ri teria shal 1 apply. 4.3.1 Group A Inspection. a. Tests shall be as specified in table II herein. b, Subgroups 5 and 6 in table I, method 5005 af MIL-STD-883 shal ce Subgroup 4 (CI and CWT measurements) shall be measured only process or desygn chan

20、ges which may affect capacitance. Test devices with zero failures. be omitted. initially and after all applicable pins on five d. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. - SIZE A 5962-89731 STANDARDIZED MILITARY DRAWING DEFENSE ELEGTRONICS SUPPLY CENTER SHEET L

21、c DAMON, OHIO 45444 12 iSC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4.3.2 Groups C and D inspections. I a. b. End-point electrical parameters shall be as specified in table II herein. Steady-state 1 ife test conditions, method

22、 1005 of MIL-STD-883. DESC-DWG-8773i.57 7777775 OOLBLi70 O W -_ i x (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compl iance ( see 3.6 herei n) . STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER (2) TA = +125C, minimum. SIZE A 5962-89731 I REVIS

23、ION LEVEL SHEET (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. TABLE II. Electrical test requirements. I I I MIL-STD-883 test requirements I Subgroups I I I (per method I I I 5005. table I) I -. I I I I i interim electrical parameters i - i I I I (method 5004) I I

24、 I 1 I I IFinal electrical test parameters I 1*, 2, 3, 7 I I (method 5004) I 8, 9, 10, 11 I I I I I I I IGroup A test requirements I 1, 2, 3, 4, 7,l I (method 5005) I 8, 9, 10, 11 I I I I I I I I (method 5005) I I IGroups C and D end-point I I I electrical parameters I 1, 2, 3 I I I I * PDA applies

25、to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with IL-M-38910. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military pecifications do not exist and qualified military devices that will pe

26、rform the required function re not available for OEM application. When a mijitary specificationexists and the product covere- y this drawing has been qualified for listing on QPL-38510, the device specified herein will be nactivated and will not be used for new design. The QPL-38510 product shall be

27、 the preferred item or all applications. 6.2 Re laceability. Microcircuits covered by this drawing will replace the same generic device overed -se_ y a contractor-prepared specification or drawing. I I I 13 DAYTON, OHK) 45444 *U. S. QOYERNMENT PRINllNG OFFICE: 1888-549904 1ESC FORM 193A SEP 87 Provi

28、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-8.3 Configurafion control nf SMDs. &All proposed changes to existing ShDs will be coordinafed with the users of record for the indivldual documents. This coordfnatfon will be accomplished in ccordance wlxh k

29、IL-STD-&l using DD Form 1693, Engineering Change Proposal (Short Forni). #hen system application requires configuration control and the applicable SMD. DESC will maintain a record Of users and this list will be used for coordination and distribution bf changes to the drawings. Users of the drawing c

30、overing microelectronics devices (FSC 59621 should contact aESC-ECS, telephone (513)296-60221. 6.4 Record bf users. Mllitary and industry users shall inform Befense Electronics Supply Center - STANDARDIZED MILITARY DRAWING DEFENSE ELECTROPIICS SUPPLY CENTER DAYTON, OHIO 45444 g.5 komnentS. Comnents

31、on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or teTeph6 296-5375. SlZE A 5962-89731 SHEET REVISIN LEVE 14 6.6 AJygved sources hf Su. Approved sources of supply are listed in,MIL-BUL-l3. Additional sources w have aareed to this drawins and a certificate of comDliance (see 3.6 h

32、erein) has been submitted to be added to MIL- 103 as they become alailable. The vendors Tfsted in MIL-BUL-103 and ackpted by DE%-ECS. “An approved source of supply listed below is for informtion purposes only and is current only to the date of the last action of this document. I I Military drawing I

33、 part number I I 5962-8973101KX I I 5962-89731011X + I 5962-89731013X 1 Vendor I Vendor CAGE I similar part number I number L/ 61772 I IDT54FCT833AEB 61772 I IDT54FCT833ADB 61772 I IDT54FCT833ALB I I I I I I I I I 5962-8973102KX I 61772 f IDT54FCT833BEB I I I I I I 5962-8973102LX I 51772 I fDT54FCT8

34、33BDB I I I I I I 5962-89731023X I 61772 I fDT54FCT833BLB I I I I I 1/ Caution. Do not use this number for item - acquiSltion. Items acquired to thfs number may not sati sfy the performance requirements of this drawing. Vehdor CAGE number 61772 Vendor name and address IntegraPed Device Technology 3236 Scott Boulevard Santa Clara, CA 95052 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

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