DLA SMD-5962-89733 REV B-1992 MICROCIRCUITS DIGITAL FAST CMOS UP DOWN BINARY COUNTER WITH PRESET AND RIPPLE CLOCK TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 微波计时器及装有预设置的升值 降值二进.pdf

1、DATE (rn) Form Approved 92-09-03 OMB NO. 0704-0188 NOTICE OF REVISION (NOR) (See MIL-S-480 for instructions) This revision described below has been authorized for the document listed. 1. ORI6IHATCR Iwg AH AWRESS 2. CAGEm 3. m NO. Defense Electronics Supply Center Dayton, Ohio 45444-5277 67268 4. CA6

2、EalDE 5962-R272-92 5. WcUIEKrno. 67268 1 ur 7 I (New) B 6. TITLE OF Wcunmr MICROCIRCUITS, DIGITAL, FAST WS, UP/DOWN BINARY COUNTER WITH PRESET AND RIPPLE CLOCK, m COMPATIBLE, MONOLITHIC SILICON 5962-89733 a. ECPHO. I b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERMENT DESC-ECC 12. ACTIVITY Acoo11

3、pLIsHIH6 REVISICM D ESC - E C C I 9. COIIFIGUIATIOII ITEH (OR SYSlH) TO WHICH ECP APPLIES DATE (WMIIDD) 92-09-03 DATE (YYIIMW) 92-09-03 10. DESCRIPTIOII OF REVISIOII Sheet 1: Revisions ltr column; add “B“. Revisions description column: add “Changes in accordance with NOR 5962-R272-92“. Revisions dat

4、e column: add “92-09-03“. Revision level block; change from “A“ to “B“. Rev status of sheets: For sheets 1, 2, 3, 4, and 6 change “A“ to “B“. Sheet 2: Footnote 1, second sentence: change from: “This device type is.“ to: “These device types are.“. Footnote 2: change from: “All voltage are.“ to: “All

5、voltages are.“. Sheet 3: Footnote 5, first sentence: change from: “.device types O1 and 02“ to: “.device types 03 and 04“; Footnote 5, second sentence: change from: *.device type 01“ to: *.device types 03 and 04“. (Continued on page 2.) Licensed by Information Handling Services10. DESCRIPTIOW OF REV

6、ISIW - CONTIHUED Document No. : 5962-89733 Revis ion: Sheet 4: Table I, High level output voltage test; change from: High level output VOH Vcc 4.5 V IOH -300 A Al 1 1,283 4.3 V voltage = 0.8 V to: I/ !ib = 2.0 v IOH -12 nd Al 1 1,283 2.4 Sheet 4: Table I, Low level output voltage test; change from:

7、Low level output VOL Vcc - 4.5 V IoL 300 fl ZJ All 1,203 0.2 V vol tage = 0.8 V to: lJ 2.0 V IoH 32 nd Al 1 1,283 0.5 .ow level output VoL1 300 pA 2J 01,02 10283 0.2 V VOL2 Vcc 4.5 V IOL = 300 pA 2J 03,04 1,283 0.2 V vol tage = 0.8 V 32 nd 01,02 1,2,3 0.5 lJ Y:/ = 3.0 V IOL = 32 m4 03,04 1,2,3 0.5 =

8、 0.8 V Sheet 6: Footnote 1, first sentence; change: “device types O1 and 02“ to: “device types 03 and 04“, and change: “this device Footnote 1, second sentence: change: “device type O1 and 02“ to: “device types 03 and 04“, and change: “this device Footnote 6; change: IfI = Input frequency in MHZ.“ t

9、o: “f1 = Input frequency in MHz.“ Footnote 7, first sentence; change: “device types O1 and 02“ to: “device types 03 and 04“. to: “these devicesn. to: “these devices“. Revision level of sheets 2, 3, 4, and 6; change from “A“ to “E“. Licensed by Information Handling Services4 SMD-5962-89733 REV B m 99

10、99996 0029885 759 m PREPARED BY PMIC NIA Flarcia B Kelleher CHECKED BY STANDARDIZED MILITARY DRAWING l1 i am REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) A Add device types 03 and 04. Technical and 92-04-27 editorial changes throughout. DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUITS

11、, DIGITAL, FAST CMOS, APPROVED REVISION LEVEL A . SIZE CAGE CODE 5962-89733 A 67268 SHEET 1 OF 12 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AHSC N/A UP/DOWN BINARY COUNTER WITH PRESET I AND

12、 RIPPLE CLOCK, TTL COMPATIBLE, APPROVED BY I Michael A Frye MONOLITHIC SILICON DRAWING APPROVAL DATE I 89-09-28 I I I JUL 91 DISTRIBUTION STATEBENT A. Approved for public release; distribution is unlimited. 5962-E304 Licensed by Information Handling ServicesSMD-5962-87733 REV B m 9999996 002988b 695

13、 & STANDARDIZED DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MILITARY DRAWING I. SCOPE 1.1 Scope. This drawing describes device requirements for clslss i3 microcircuits in accordance with 1.2.1 f MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN device

14、s“. 1.2 Part or Identifying Number (PIN). The complete PIN shall be i1s shown in the following example: 5962-89733 O1 E A -i- l I I I 1 I I I I I I Lead finich per Case outline Device type Drawing number (1.2.1) (1.2.2) MfL-H-38510 1.2.1 Device typeCs). The device type(sj shill identify the circit f

15、unction as follows: Device type Generic number Cirtuit function o1 i/ 54FCT191 UP/DOWN binary counte- with preset and ripple clock, TTL compatible 02 I/ 54FCT191A UP/DOWN binary counter with preset and ripple clock, TTL compatible 03 54FCT191 UP/DOWN binary counter with preset and rippk ctock, TTL c

16、ompatible 04 UP/DOUN binary counter with prkset and rippt& ckock, TTL compatible The case outlinek) shall be as designated in appendix C bf MIL-M-38510, and as hlloa5: 54FCT191 A 1.2.2 Case outline(s). SIZE 5962-89733 A REVISION LEVEL- SHEET outiihe letter Cas outtine E F 2 D-2 (l-Lead, .84“ x .310“

17、 x .2W“, dual-in-line package F-5 (16-lead, .440“ x .285“ x .&35“), flat package C-2 (20-termina1, .358“ x .358“ x .IW“), squabe cHip carrier package 1.3 hbsolute Riaximum ratings. 11 supply voltage range (vCc) - - - - - - - - - - - - - - - - DC ihbut di.ode current (ilk) - - - - - - - - - - - - - -

18、 t butput aide chrit (II - - - - - - - - - - - - - - Powr dissipation (P ) s/ - - - - - - - - - - - - - - - - Thermal resistance (8jc) - - - - - - - - - - - - - - - - Storage temperature range - - - - - - - - - - - - - - - Junction temperature (Tj) - - - - - - - - - - - - - - - - Lead temperature (s

19、oldering, IO seconds) - - - - - - - - Input voltage range Output voltage bange - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - DC outyt current -1- - - - - - - - - - - - - - - - -0.5 W dc to +7.0 V dc -0.5 V dc tir Vcc + 0.5 V dc 3/ -20 mq -50 mk *Jb mt 500 mw See MfL-M-38510, appe

20、ndjx C -65OC to +15OoC +IfSOC +3w0t -0.5 Y dc to Vcc + U.5 V dc z/ - I/ ue to internal n se problems! device types 01 and 02 do not meet the minimum V characteristic offhe FCT famity or the limits specified on this drawing. This %vice type is no longer avai table for acqisition. - 2/ All voltage are

21、 referenced to GND. - 3/ For Vcc 6.5 V dc, the upper bound is limited to Vcc. - 4/ Must withstand the added PD due to short circuit test e.g., Ias. threshotd limit DESC FORM 193A JUL 91 Licensed by Information Handling ServicesSMD-5962-9733 REV B m 9999996 0029887 521 m STANDARDIZED MILITARY DRAWING

22、 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1.4 Recommended operating conditions. Supply voltage range (Vcc) - - - - - - - - - - - - - - - t4.5 V dc to t5.5 V dc Maximum logic low voltage (VIL) - - - - - - - - - - - - - 0.8 V dc Minimum logic high voltage (VI,) s/ - - - - - - - - - 2.0 V d

23、c Case operating temperature range (TC) - - - - - - - - - - -55C to +125OC 2. APPLICABLE DOCUMENTS SIZE 5962-89733 A REVISION LEVEL SHEET 2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard, and bulletin of the issue listed in that

24、issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION M IL I TARY MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Proce

25、dures for Microelectronics. BULLETIN HILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDIS). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed

26、 by the contracting activity.) herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited 3. REQUIREMENTS 3.1 Item requireaents. The individual item requirements shall be in accordance with 1.2

27、.1 of MIL-STD-883, “Provisions for the use of HIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Case outline(s

28、). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connection(s). 3.2.3 Truth table and mode select table. The terminal connectiods) shall be as specified on figure 1 herein. The truth table and mode select table shall be as specified on figure 2 herein. 3.2.4 Lwic diagr

29、am. 3.3 E lectri ca 1 performance characteri st i cs. The logic diagram shall be as specified on figure 3 herein. Unless otherwise specified, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. For dynaiaic operation of dev

30、ice types O1 and 02, a VIH level between 2.0 V and 3.0 V may be recognized by this device as a high logic level input. these devices as a high logic level input. system. For static operation of device type 01, a V y 2 2.0 V will be recognized by Users are cautioned to verify that tiis change will no

31、t affect their DESC FORM 193A JUL 91 Licensed by Information Handling ServicesTest High leve4 output voltage Lou level output voltage Input clamp voltage High level input current Low level input current Short circuit output current Quiesecent power supply current (CMOS inputs) Qui esecent puer suppl

32、y current (TTL inputs) Dynamic power supply current Total power supply current 6/ See footnotes at end os CCQ IN CCD cc TABLE I. Electrical performance characteristics. Conditions Vcc = 5.0 V dc tIVX -55OC 5 TC (+12fioC vcc = 4.5 v VIL 0 O.& v VIH - 2.0 v vcc = 4.5 v VIH = 2.0 v VIL = 0.8 V IOH -300

33、 PA IOH = -12 mA IOL - -2, 3CpA - IOH = 32 mA Vcc = 4.5 V, IN = -18 mA Vcc = 5.5 V, VIN = GND vcc = 5.5 v, viy = 3.4 v - Vcc = 5.5 V, VIN 2 5.3 V or VIN : 2.0 V will be Duration of the short circuit test should not exceed NT = Number of TTL inputs at DH. fI = Input frequency in M . NI = Number of in

34、puts at qz. - 7/ Due to internal noise problems, &vice types O1 and 02 cannot meet the threshold limits required in accordance with MIL-STD-883, test method 5004, for the V For device types 03 and 04, use a VI, limit of 3.0 V. de VIL limit (0.8 V) remains unchanged. Users are cautioned to verify tha

35、t this change will not affect their system. - 8/ Minimum limits are guaranteed, if not tested on propagation delays. minimum limit (2.0 V) of this technology family. STANDARDIZED SIZE 5962-89733 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER - DAYTON, OHIO 45444 REVISION LEVEL SHEET DESC FORM

36、193A JUL 91 Licensed by Information Handling ServicesSMD-5762-89733 REV B W 999999b 0029891 T52 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER - RC truth table A I I Device types Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 I 01, 02, 03, and O4 L I 21 I Termin

37、al I I E, F I sym PI QI Qo CE U/D Q2 Q3 GND P3 P2 PL TC RC CP PO - - - - vcc - - - - FIGURE 1. Terminal connections. Mode select table I I I l I I FIGURE 2. Truth table and mode select table. STANDARDIZED I SIZE I I 5962-89733 DAYTON, OHIO 45444 I REVISION LEVEL I SHEET DESC FORM 193A JUL 91 License

38、d by Information Handling Services - - SMD-5962-89733 REV B M 9999996 0029892 999 M STANDARQI ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, DHI 45444 ro U N U SIZE 5962-89739 . A REVISION LEVEL SHEET FIGURE 3. twic diagram. DESC FORM 193A JUL 91 Licensed by Information Handling Serv

39、icesSMD-59b2-89733 REV B m 999999b 0029893 825 m STANDARD1 ZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL A SAME PHASE INPUT TRANSiTION 5962-89733 SHEET 9 -ItPLH t- jtPHLt VOH OUTPUT 1.5 V -I+ +PLH ,tP”L p- OPPOSITE PHASE INPUT TRANSITION Definitions:

40、 RL = Load resistor, (see ac characteristics for value). CL = Load capacitance = 50 pF minimum, includes jig and probe capacitance. RT = Termination should be equal to ZOUT of pulse generator. FIGURE 4. Test circuit and switching waveforms. Licensed by Information Handling ServicesSMD-59b2-9733 REV

41、B 999999b 0029894 761 3v 1.5 V ov INWT TIMING 1.5 V INPUT ov 3v t5 v OV PRESET CLEAR -3v t5 v QV PRESET CLEAR CLOCK ENABLE 3v L5 v ov LOW-HIGH-LOW INPUT PULSE r* t vf HIGH-LDW-HIGH L5 v OV INPUT PULSE FIGURE 4. Test circuit and cwitchinq waveforms - Continued. STANDARDIZED SIZE 5962-89733 MILITARY D

42、EUWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET A 10 DESC FORM 193A JUL 91 Licensed by Information Handling Services3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgro

43、up are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed in 1.2 herein. herein). In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103 (see 6.6 3.6 Certificate of compliance. A ce

44、rtificate of compliance shall be required from a manufacturer in order to be The certificate of compliance submitted to listed as an approved source of supply in MIL-BUL-103 (see 6.6 herein). DESC-ECS prior to listing as an approved source of supply shall affirm that the manufacturers product meets

45、the requirements of HIL-STD-883 (see 3.1 herein) and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of charwe. Notification

46、of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see 3.1 herein). 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the nanufacturers facility and applicable required docuinentation. at the option of the reviewer. Offshore d

47、ocumentation shall be made available onshore STANDARD1 ZED MIL I TARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specif

48、ied in MIL-STD-883 (see 3.1 herein). 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. shall apply: The following additional criteria a. Burn-in test, method 1015 of MIL-STD-883. (1) Test co

49、ndition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). SIZE 5962-89733 A REVISION LEVEL SHEET (2) TA = +125OC, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. I I I Subgroups I I I (per method I I I I I I I interim electrical parameters I I I I I Final electrical test parameters I I*