DLA SMD-5962-89746 REV B-2011 MICROCIRCUIT DIGITAL HIGH SPEED CMOS 8-INPUT NAND GATE TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add logic diagram. Add footnotes to figure 4, test circuit and switching waveforms. Update boilerplate in accordance with MIL-PRF-38535 requirements. Editorial changes throughout. PHN 05-09-01 Thomas M. Hess B Update test condition VOHand VOLin t

2、able I. Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. - MAA. 11-10-19 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Jame E. Nicklaus DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990

3、 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY William J. Johnson THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A APPROVED BY Michael A Frye MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-INPUT NAND GATE, TTL COMPATIBLE

4、INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-12-14 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89746 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E509-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-897

5、46 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number

6、 (PIN). The complete PIN is as shown in the following example: 5962-89746 01 C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 5

7、4HCT30 8-input NAND gate, TTL compatible inputs 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line package 1.2.3 Lead finish. The lead finish is as specifi

8、ed in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc DC input diode current (IIK) . 20 mA DC output diode current (IOK) .

9、 20 mA DC output drain current (IOUT) 25 mA DC VCCor GND current (ICC, IGND) . 50 mA Storage temperature range (TSTG) -65C to +150C Maximum power dissipation (PD) . 500 mW Lead temperature (soldering, 10 seconds) . +260C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperatu

10、re (TJ) . +175C 2/ 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) . 0.0 V to VCCOutput voltage range (VOUT) 0.0 V to VCCCase operating temperature range (TC) . -55C to +125C Input rise or fall time (tr, tf), VCC= 4.5 V 0 to 500 ns 1/

11、 Unless otherwise specified, all voltages are referenced to ground. 2/ Maximum junction temperature shall not be exceed except for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted

12、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and han

13、dbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT

14、OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these document

15、s are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the

16、text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JA

17、N class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accorda

18、nce with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the de

19、vice. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions sh

20、all be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure

21、 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performa

22、nce characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided b

23、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appen

24、dix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1

25、Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow opti

26、on is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved sou

27、rce of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered

28、to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the ma

29、nufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND

30、 AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Limits Unit Min Max High level output voltage VOHVCC= 4.5 V VIN= VIH=2.0 V or V

31、IL= 0.8 V IOH= -20 A 1, 2, 3 4.4 V IOH= -4.0 mA 1, 2, 3 3.7 V Low level output voltage VOLIOL= +20 A 1, 2, 3 0.1 V IOL= +4.0 mA 1, 2, 3 0.5 V High level input voltage 2/ VIHVCC= 4.5 V 1, 2, 3 2.0 V Low level input voltage 2/ VIL1, 2, 3 0.8 V Input leakage current IIL, IIHVCC= 4.5 V, VIN= VCCor GND 1

32、, 2, 3 1.0 A Quiescent supply current ICCVCC= 5.5 V, VIN= VCCor GND 1, 2, 3 40 A Additional quiescent supply current ICCVIN= 2.4 V, any 1 input VIN= VCCor GND, all other inputs VCC= 5.5 V 1, 2, 3 3.0 mA Input capacitance CINTC= +25C See 4.3.1c 4 10 pF Functional tests VCC= 4.5 V, see 4.3.1d 7, 8 Pro

33、pagation delay time, input to output tPLH, tPHL VCC= 4.5 V, CL= 50 pF See figure 4 9 28 ns 10, 11 42 Output transition time 3/ tTLH, tTHL9 15 ns 10, 11 22 1/ For a power supply of 5.0 V 10%, the worst case output voltage (VOHand VOL) occur for HCT at VCC= 4.5 V. Thus, the 4.5 V values should be used

34、 when designing with this supply. Worst case VIHand VILoccur at VCC= 5.5 V and 4.5 V, respectively. 2/ The VIHand VILtests are not required, and shall be applied as forcing function for VOHor VOLtests. 3/ Transition time (tTLH, tTHL), if not tested, shall be guaranteed to the limits specified in tab

35、le I. Terminal number Terminal symbol Terminal number Terminal symbol 1 A 8 Y 2 B 9 NC 3 C 10 NC 4 D 11 G 5 E 12 H 6 F 13 NC 7 GND 14 VCCNC = No internal connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

36、ARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Inputs Output A B C D E F G H Y L X X X X X X X H X L X X X X X X H X X L X X X X X H X X X L X X X X H X X X X L X X X H X X X X X L X X H X X X X X X L X H X X

37、X X X X X L H H H H H H H H H L H = High voltage level L = Low voltage level X = Immaterial FIGURE 2. Truth table. FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND M

38、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 NOTES: 1. CL = 50 pF minimum or equivalent (includes test jig and probe capacitance). 2. Input signal from pulse generator: VIN= 0.0 V to 3.0 V; PRR 1 MHz; ZOUT= 50 ; tr= 6.0 ns; tf= 6.0 ns; trand tfshall be measured fr

39、om 0.3 V to 2.7 V and from 2.7 V to 0.3 V, respectively; duty cycle = 50 percent. 3. The outputs are measured one at a time with one transition per measurement. FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I

40、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening.

41、Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be mai

42、ntained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015

43、of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test re

44、quirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 4, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameter

45、s (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Test

46、s shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initial test and after process or design changes which may affect input capacitance. Test all applicable pins on fiv

47、e devices with zero failures. d. Subgroup 7 and 8 shall include verification of the truth table as specified on figure 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89746 DLA LAND AND MARITIME COLUMBUS,

48、OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, i