DLA SMD-5962-89787 REV A-2002 MICROCIRCUIT LINEAR DUAL LINE RECEIVER MONOLITHIC SILICON《硅单片 双线路接收器 线性微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - lgt 02-01-08 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PRE

2、PARED BY Sandra Rooney DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, DUAL LINE RECEIVER, MONOLITHIC SILICON A

3、ND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-01-13 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-89787 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E157-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reprod

4、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting

5、 of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1

6、.2 PIN. The PIN is as shown in the following example: 5962 - 89787 01 M E X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q a

7、nd V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

8、 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 9627 Dual line receiver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class De

9、vice requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as design

10、ated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSN

11、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (V+) . 0

12、V to +15 V Negative supply voltage (V-). 0 V to -15 V Input voltage (VIN) . 25 V Strobe voltage. -0.5 V to +5.5 V Applied output voltage -0.5 V to +15 V Storage temperature range. -65C to +150C Lead temperature (soldering, 60 seconds). +300C Junction temperature (TJ) . +150C Power dissipation (PD) 4

13、00 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) +90C/W 1.4 Recommended operating conditions. Positive supply voltage range (V+) . +4.5 V to +5.5 V Negative supply voltage range (V-) -4.5 V to -5.5 V Ambient operating temperature range (

14、TA). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue

15、 of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method

16、 Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, an

17、d handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect r

18、eliability. All voltages are referenced to ground unless otherwise specified. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SH

19、EET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has b

20、een obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect

21、 the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physi

22、cal dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as spec

23、ified on figure 1. 3.2.3 Switching time test circuit and waveform. The switching time test circuit and waveform shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteri

24、stics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are define

25、d in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of

26、 not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/com

27、pliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance

28、 shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 he

29、rein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-3

30、8535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change

31、for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent,

32、and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this

33、 drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL

34、 A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Positive supply current I+ VIN+= -0.6 V 1/ 10.8 V V+ 13.2 V 1, 3 01 18 mA 2 12.4 Negative supply current

35、I- VIN+= 0.6 V 1/ 10.8 V V+ 13.2 V 1, 3 01 -16 mA 2 -11.4 Logical “1” output voltage (IN) VOH(IN)VIN+= 0.6 V, 1/ IOH= -0.5 mA 1, 2, 3 01 2.4 V Logical “0” output voltage (IN) VOL(IN)VIN+= 0.6 V, 1/ IOL= 6.4 mA 1, 2, 3 01 0.4 V Logical “1” output voltage (STB) VOH(STB)VIN+= 0.6 V, 1/ IOH= -0.5 mA, VS

36、TB= 0.8 V 1, 2, 3 01 2.4 V Logical “0” output voltage (STB) VOL(STB)VIN+= 13.2 V, 1/ IOL= 6.4 mA, V- = -10.8 V VIN+= -0.6 V 1, 2, 3 01 0.4 V Logical “1” input voltage (STB) VIH(STB)V+ = 13.2 V, 2/ V- = -10.8 V, VIN+= -0.6 V 1, 2, 3 01 2.0 V Logical “0” input voltage (STB) VIL(STB)VIN+= -0.6 V 2/ 1,

37、2, 3 01 0.8 V Output short circuit current IOSV+ = 13.2 V, V- = -10.8 V, VIN+= 0.6 V, VOUT= 0 V 1/ 1, 2, 3 01 -3.0 mA Logical “1” input current (STB) IIH(STB)VIN+= 0.6 V, 1/ VIH(STB)= 2.4 V 1, 2, 3 01 40 A IIHH(STB)VIN+= 0.6 V, 1/ VIHH(STB)= 5.5 V 1 mA Positive threshold current ITH+VIN-= 0 V, 1/ 3/

38、 VOUT= 2.4 V 10.8 V V 13.2 V 1, 2, 3 01 +100 A Negative threshold current ITH-VIN-= 0 V, 1/ 3/ VOUT= 0.4 V 10.8 V V 13.2 V 1, 2, 3 01 -100 A Input resistance RINV+ = 13.2 V, 1/ 4/ VIN+= 3 V 1, 2, 3 01 6.0 k See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking perm

39、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise

40、 specified Group A subgroups Device type Limits Unit Min Max RS-232C parameters Input resistance RINVSTB= 2 V, 5/ 6/ VIN-= 3 V 1, 2, 3 01 3.0 7.0 k VSTB= 2 V, 5/ 7/ VIN-= 25 V 3.0 7.0 Input voltage VINPin 1 = V-, 5/ 8/ Measure VIN+and VIN-, Pins 3, 5, 6, 7, 10, 11, 12, 14, open 1, 2, 3 01 2.0 V Posi

41、tive threshold voltage VTH+Measure VIN+and VIN-, VOUT= 2.4 V 5/ 9/ 1, 2, 3 01 +3.0 V Negative threshold voltage VTH-Measure VIN+and VIN-, VOUT= 0.4 V 5/ 9/ 1, 2, 3 01 -3.0 V Propagation delay time tPHLtPLH10/ TA= +25C 9 01 250 ns 1/ Pins 1, 5, 6, 11, 12 open, VSTRB= 2.0 V, V+ = 10.8 V, V- = -13.2 V

42、unless otherwise specified. 2/ VIH(STB)and VIL(STB)are guaranteed by VOH(STB)and VOL(STB)as a test condition. VIH(STB)and VIL(STB)are forced 2.0 V and 0.8 V respectively. 3/ ITHtest method: Measure the input threshold voltage (VTH) of VIN+at which value will toggle the output from LOW (2.4 V) for IT

43、H+and from HIGH (2.4 V) to LOW (2.4 V) for VTH+and from HIGH (2.4 V) to LOW (0.4 V) for VTH-; tie the untested VINto 0 V, i.e., when measuring VIN+, tie VIN-to 0 V. 10/ See figure 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

44、IT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline E Terminal number Terminal symbol 1 HYSTERESIS (HYS) 2 OUTPUT A (VO) 3 STROBE A 4 NC 5 -INPUT A (-IN) 6 RA (R) 7 +INPUT A (+IN) 8 GND 9 V-

45、10 +INPUT B (+IN) 11 RB (R) 12 -INPUT B (-IN) 13 NC 14 STROBE B 15 OUTPUT B (V0) 16 V+ NC = no connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY C

46、ENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Switching time test circuit and waveform. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89787 DEFENSE SUPPLY

47、 CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Q

48、uality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For