DLA SMD-5962-89804 REV D-2008 MICROCIRCUIT LINEAR HIGH SPEED PRECISION JFET OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to the AVStest subgroup 4 limit as specified under Table I in accordance with N.O.R. 5962-R024-93. 93-02-02 M. A. FRYE B Make changes to VIO, VIO/ T, IIO, IIO/ T, IIB, CMRR, VIO(ADJ), ICC, VOUT, AVS, tests and replace all five footnot

2、es with three in accordance with N.O.R. 5962-R203-93. 93-07-26 M. A. FRYE C Drawing updated to reflect current requirements. Redrawn. - ro 01-03-27 R. MONNIN D Make correction to the VIO, IIO/ T, ICC, and -VOUTtests as specified under Table I. - ro 08-05-02 R. HEBER THE ORIGINAL FIRST SHEET OF THIS

3、DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DR

4、AWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-06-15 MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION, JFET, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89804

5、SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E326-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1

6、. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89804 01 G A Drawing number Dev

7、ice type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OP44A High speed precision operational amplifier 1.2.2 Case outline(s). The case outline(s) are as desi

8、gnated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximu

9、m ratings. Supply voltage (VS) 20 V dc 1/ Input voltage range (VIN) 15 V dc 2/ 3/ Differential input voltage range . 20 V dc 2/ 3/ Storage temperature range . -65C to +125C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +175C Power dissipation (PD) at TA= +25C: Case G 3

10、00 mW Cases P and 2 . 500 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 150C/W Case P 119C/W Case 2 . 120C/W 1.4 Recommended operating conditions. Supply voltage (VS) 15 V dc Ambient operating temperature range (TA) . -55C to +12

11、5C _ 1/ Voltages in excess of these may be applied for short term tests if voltage difference does not exceed 40 volts. 2/ For supply voltages less than 15 V dc, the absolute maximum input voltage is equal to the supply voltage. 3/ For supply voltages less than 20 V, the absolute maximum input volta

12、ge is equal to the supply voltage. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE D

13、OCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF

14、DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 -

15、List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia

16、, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtain

17、ed. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualifie

18、d manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality M

19、anagement (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identi

20、fy when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal con

21、nections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrica

22、l test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein.

23、 In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be

24、 marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networ

25、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VS= 15 V Group A s

26、ubgroups Device type Limits Unit unless otherwise specified Min Max Input offset voltage VIOVCM= 0 V, -10 V, and 1 01 2.5 mV +10 V, RS= 50 2,3 3.5 Input offset voltage temperature sensitivity VIO/ T VCM= 0 V 1,2,3 01 20 V/C Input offset current IIOVCM= 0 V, -10 V, and 1 01 0.15 nA +10 V 2,3 1.0 Inpu

27、t offset current 1/ temperature sensitivity IIO/ T 1,2,3 01 20.0 pA/C Input bias current +IIBVCM= 0 V, -10 V 1 01 0.25 nA 2,3 20.0 VCM= +10 V 1 1.2 2,3 20 -IIBVCM= 0 V, -10 V 1 0.25 2,3 20.0 VCM= +10 V 1 1.2 2,3 20 +PSRR +VS= 10 V, 20 V 1,2,3 01 84 dB Power supply rejection ratio -PSRR -VS= -10 V, -

28、20 V 84 Input voltage common 2/ mode rejection ratio CMRR +VS= 4 V, 26 V; -VS= -26 V, -4 V 1 01 86 dB VCM= IVR = 11 V 2,3 84 +VIORPOT= 10 k 1 01 2.5 mV Input offset voltage 3/ adjustment (ADJ) 2,3 3.0 -VIO1 -2.5 (ADJ) 2,3 -3.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproducti

29、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +1

30、25C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Supply current ICCVS= 15.0 V, VCM= 0 V 1,2,3 01 7.5 mA +VOUTVOUTat -10 mA 1 01 10.0 V Output voltage at minimum rated output current VOUTat -5 mA 2,3 -VOUTVOUTat 10 mA 1 -10.0 VOUTat 5 mA 2,3 Output voltage swi

31、ng +VOPRL= 2 k 4 01 11.5 V 5,6 11.0 -VOP4 -11.5 5,6 -11.0 Open loop voltage gain +AVS, VOUT= 10 V, 0 V, 4 01 150 V/mV -AVSRL= 2 k 5,6 50 Slew rate +SR and AV= 3, RL= 2 k 7 01 100 V/s -SR 8 80 Transient response: TR(tr), AV= 3, see figure 3 9 01 50 ns Rise time and fall time TR(tf) 10,11 55 Transient

32、 response: TR(+OS), AV= 3, see figure 3 9 01 40 ns Overshoot TR(-OS) 10,11 45 Settling time +tSand -tSSee figure 3, TA= +25C 9 01 650 ns 1/ Input offset current temperature sensitivity is guaranteed by IIOend-point limits at TA= -55C and +125C. 2/ IVR is defined as the VCMrange used for the CMRR tes

33、t. 3/ See figure 2 for offset adjustment circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97

34、Device type 01 Case outlines G and P 2 Terminal number Terminal symbol 1 NULL NC 2 -IN NULL 3 +IN NC 4 -VSNC 5 NULL -IN 6 OUT NC 7 +VS+IN 8 NC NC 9 - NC 10 - -VS11 - NC 12 - NULL 13 - NC 14 - NC 15 - OUT 16 - NC 17 - +VS18 - NC 19 - NC 20 - NC NC = No connection FIGURE 1. Terminal connections. Provi

35、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Offset null circuit. Provided by IHSNot for R

36、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Settling time circuits. Provided by IHSNot for ResaleNo reproduc

37、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufa

38、cturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the r

39、equirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that af

40、fects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampl

41、ing and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional crite

42、ria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall speci

43、fy the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests pri

44、or to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspec

45、tion. Group A inspection tests shall be as specified in table II herein. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit

46、 shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

47、 method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89804 DEFENSE SUPPLY CEN

48、TER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*,2,3,4,5,6,7,8 Group A test requirements (method 5005) 1,2,3,4,5,6,7,8,9,10,11 Groups C and D end-point el