DLA SMD-5962-89855 REV B-2011 MICROCIRCUIT MEMORY DIGITAL CMOS ONE TIME PROGRAMMABLE ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R218-92 92-06-09 William J. JohnsonB Updated boilerplate for 5 year review. - lhl 11-10-31 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV B B B B B B B SHEET 15 16 17

2、 18 19 20 21 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Kenneth Rice, Jr. DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEP

3、ARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Charles Reusing APPROVED BY Michael A. Frye MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE TIME PROGRAMMABLE, ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON DRAWING APPROVAL DATE 90-05-09 AMSC N/A REVISION LEVEL B SIZE A

4、CAGE CODE 67268 5962-89855 SHEET 1 OF 22 DSCC FORM 2233 APR 97 5962-E472-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC

5、FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number

6、 (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 89855 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (se

7、e 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specifie

8、d RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Access time 01 CY7C331-40 Asynchronous Registered PLD 40 ns 02 CY7C33

9、1-30 Asynchronous Registered PLD 30 ns 03 CY7C331-25 Asynchronous Registered PLD 25 ns 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the r

10、equirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive desi

11、gnator Terminals Package style X See Figure 1 28 dual-in-line package Y GDFP2-F28 28 flat package Z See Figure 1 28 J-leaded chip carrier 3 CQCC1-N28 28 square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appen

12、dix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/

13、Supply voltage to ground potential - -0.5 V dc to +7.0 V dc DC voltage applied to outputs in High Z state - -0.5 V dc to +7.0 V dc DC input voltage - -3.0 V dc to +7.0 V dc Maximum power dissipation 2/ - 1.2 W Lead temperature (soldering, 10 seconds) - +260C Thermal resistance, junction-to-case (JC)

14、: Case outlines Y and 3 - See MIL-STD-1835 Case outline X - 26C/W 3/ Case outline Z - 20C/W 3/ Junction temperature (TJ) - +175C Storage temperature range - -65C to +150C Temperature under bias - -55C to +125C 1.4 Recommended operating conditions. Supply voltage (VCC) - +4.5 V dc to +5.5 V dc Ground

15、 voltage (GND) - 0 V dc Input high voltage (VIH) - 2.2 V dc minimum Input low voltage (VIL) - 0.8 V dc maximum Case operating temperature range (TC) - -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks f

16、orm a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFEN

17、SE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are av

18、ailable online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

19、this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade p

20、erformance and affect reliability. 2/ Must withstand the added PDdue to short circuit test (e.g., IOS). 3/ When the thermal resistance for this case is specified in MIL-STD-1835 that value shall supersede the value indicated herein. Provided by IHSNot for ResaleNo reproduction or networking permitte

21、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

22、 MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535,

23、 appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device

24、class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.3.1 Unprogrammed devices.

25、 The truth table for unprogrammed devices for contracts involving no altered item drawing shall be as specified on figure 3. When required in screening (see 4.2 herein) or qualification conformance inspection, groups A, B, or C (see 4.3), the devices shall be programmed by the manufacturer prior to

26、test. A minimum of 50 percent of the total number of cells shall be programmed or at least 25 percent of the total number of cells to any altered item drawing. 3.2.3.2 Programmed devices. The truth table for programmed devices shall be as specified by an attached altered item drawing. 3.3 Electrical

27、 performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requir

28、ements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where mar

29、king of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes N, Q, and V shall be in accordance with MIL-PR

30、F-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in

31、 MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall b

32、e required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product m

33、eets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M i

34、n MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is requ

35、ired for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore do

36、cumentation shall be made available onshore at the option of the reviewer. 3.10 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result in a wide variety of configurations, two processing options are provided for selection in the contract,

37、 using an altered item drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.10.1 Unprogrammed device

38、delivered to the user. All testing shall be verified through group A testing as defined in 3.2.3.1 and table IIA. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration. 3.10.2 Manufacturer-programmed device delivered to the user. All te

39、sting requirements and verification provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

40、E A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Output high

41、voltage VOHVCC= 4.5 V, lOH= -2.0 mA, VIN= VIH, VIL1, 2, 3 All 2.4 V Output low voltage VOLVCC= 4.5 V, IOL= 8.0 mA, VIN= VIH, VIL1, 2, 3 All 0.5 Input high voltage 1/ VIH1, 2, 3 All 2.2 Input low voltage 1/ VIL1, 2, 3 All 0.8 Input leakage current IIXVIN= 5.5 V to GND 1, 2, 3 All -10 10 A Output leak

42、age current IOZ CC= 5.5 V, VOUT= 5.5 V and GND 1, 2, 3 All -40 40 Output short circuit current 2/ 3/ los VCC= 5.5 V, VOUT= 0.5 V 1, 2, 3 All -30 -90 mA Power supply current at frequency 3/ ICC1VCC= 5.5 V, lOUT= 0 mA, VIN= GND, f = fMAX51, 2, 3 All 200 Standby power supply current ICC2VCC= 5.5 V, IOU

43、T= 0 mA, VIN= GND 1, 2, 3 All 150 Input capacitance 3/ CINVCC= 5.0 V, TA= 25C, f = 1 MHz, (see 4.4.1c) 4 All 7 pF Output capacitance 3/ COUTVCC= 5.0 V, TA= 25C, f = 1 MHz (see 4.4.1c) 4 All 8 Functional tests See 4.4.1d 7, 8 All Input to output propagation delay 5/ tPD4/ 9, 10, 11 01 3 40 ns 02 3 30

44、 03 4.6 25 Input register clock to output delay 6/ tICO4/ 9, 10, 11 01 65 02 5003 45 Output data stable time from input clock 6/ tIOH4/ 9, 10, 11 All 5 Input or feedback setup time to input register clock 6/ tIS4/ 9, 10, 11 All 5 Input register hold time from input clock 6/ tIH4/ 9, 10, 11 01 20 02

45、15 03 13 Input to input register asynchronous reset delay 6/ tIAR4/ 9, 10, 11 01 65 02 5003 45 Input register reset width 3/ 6/ tIRW4/ 9, 10, 11 01 65 02 50 03 45 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

46、 MICROCIRCUIT DRAWING SIZE A 5962-89855 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 4/ -55C TC +125C 4.5 V VCC 5.5 V Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Input register reset recovery time 3/ 6/ tIRR9, 10, 11 01 65 ns 02 50 03 45 Input to input register asynchronous set delay