DLA SMD-5962-89896 REV C-2007 MICROCIRCUIT LINEAR PRECISION LOW POWER LOW VOLTAGE OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片 低压低功率准确运算放大器 线性微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R238-93. 93-09-30 M. A. FRYE B Drawing being updated to reflect current requirements. -ro 01-03-15 R. MONNIN C Update drawing as part of 5 year review. -rrp 07-06-20 ROBERT M. HEBER REV SHET REV SHET REV STA

2、TUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY

3、 MICHAEL A. FRYE MICROCIRCUIT, LINEAR, PRECISION, LOW POWER, LOW VOLTAGE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-09-15 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89896 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E354-06 Pro

4、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device req

5、uirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89896 01 P X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead fi

6、nish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OP90A Precision, low power, low voltage operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

7、Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) . 18 V dc Input voltage (

8、-VS) 20 V to (+VS) + 20 V Differential input voltage (-VS) 20 V to (+VS) + 20 V Power dissipation (PD) 500 mW Output short-circuit duration Continuous Storage temperature range . -65C to +150C Lead temperature range (soldering, 60 seconds) +300C Junction temperature (TJ) . -65C to +150C Thermal resi

9、stance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case P . +119C/W Case 2 . +120C/W 1.4 Recommended operating conditions. Supply voltage (VS) . 1.5 V dc to 15 V dc Source resistance (RS) . 50 Ambient operating temperature range (TA) . -55C to +125C Provid

10、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, st

11、andards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Int

12、egrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. M

13、IL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence

14、. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements

15、. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has

16、been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modification

17、s to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2

18、Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be

19、 as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test re

20、quirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may als

21、o be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR

22、CUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min

23、MaxInput offset voltage VOS1 01 150 V 2,3 400 Input offset current IOSVCM= 0 V 1 01 3 nA 2,3 5 Input bias current +IBVCM= 0 V 1 01 15 nA 2,3 20 -IBVCM= 0 V 1 15 2,3 20 Supply current ISYVS= 1.5 V, no load 1 01 15 A 2,3 25 VS= 15 V, no load 1 20 2,3 30 Power supply rejection ratio PSRR VS= 1.5 V, 15

24、V 1 01 5.6 V/V 2,3 10.0 Input noise voltage density en VS= 15 V, fO= 50 Hz 3/ TA= +25C 4 01 4 75 nV / Hz Input voltage range 4/ IVR +VS= +5 V, -VS= 0 V 1 01 0 to +4 V 2,3 0 to +3.5 VS= 15 V 1,2,3 -15 to +13.5 Large-signal voltage gain AVOVS= 15 V, VO= 10 V, 4 01 700 V/mV RL= 100 k 5,6 225 VS= 15 V,

25、VO= 10 V, 4 350 RL= 10 k 5,6 125 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FOR

26、M 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Large-signal voltage gain AVOVS= 15 V, VO= 10 V, 4 01 125 V/mV RL= 2 k 5,6 50 +VS= 5 V, -VS= 0 V, 4 200 VO=

27、 1 V, 4 V, RL= 100 k 5,6 100 +VS= 5 V, -VS= 0 V, 4 100 VO= 1 V, 4 V, RL= 10 k 5,6 50 Output voltage swing VOVS= 15 V, RL= 10 k 1 01 14 V 2,3 13.5 VS= 15 V, RL= 2 k 1 11 2,3 10.5 VOH+VS= +5 V, -VS= 0 V, 1 4.0 RL= 2 k 2,3 3.9 VOL+VS= +5 V, -VS= 0 V, 1,2,3 500 V RL= 10 k Common mode rejection mode CMRR

28、 +VS= +5 V, -VS= 0 V, VCM= 0 V, 4 V 1 01 90 dB +VS= +5 V, -VS= 0 V, VCM= 0 V, 3.5 V 2,3 85 VS= 15 V, 1 100 VCM= -15 V, 13.5 V 2,3 95 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5

29、962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Slew ra

30、te +SR VS= 15 V, rising edge, no load, AV= 1, VOUT= -10 V to +10 V, measured from 5 V to +5 V, TA= +25C 7 01 5 V/ms -SR VS= 15 V, falling edge, no load, AV= 1, VOUT= +10 V to -10 V, measured from +5 V to -5 V, TA= +25C 5 Input offset voltage temperature coefficient TCVOSVS= 15 V, RS= 50 , TA= -55C,

31、+125C 8 01 2.5 V/C 1/ Unless otherwise specified, VS= 1.5 V, 15 V, and RS= 50 . 2/ The limiting terms “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes only. Negative current shall be defined as conventional current flow out of a device terminal. 3/ If not tested, shall

32、be guaranteed to the limits specified in table I herein. 4/ IVR guaranteed by CMRR test. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“

33、or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The cert

34、ificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF

35、-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain t

36、he option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

37、SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines P 2 Terminal number Terminal symbol 1 VOSNULL NC 2 -INPUT VOSNULL 3 +INPUT NC 4 -VSNC 5 VOSNULL -INPUT 6 OUTPUT NC 7 +VS+INPUT 8 NC NC 9 - NC 10 - -V

38、S11 - NC 12 - NC 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - +VS18 - NC 19 - NC 20 - VOSNULL NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPL

39、Y CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-ST

40、D-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level c

41、ontrol and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and fina

42、l electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-

43、883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-po

44、int electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the pr

45、eparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1

46、005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89896 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requ

47、irements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6, 7, 8 Groups C and D end-point elect

48、rical parameters (method 5005) 1 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applicat