DLA SMD-5962-89940 REV B-2011 MICROCIRCUIT HYBRID LINEAR SAMPLE AND HOLD HIGH SPEED AMPLIFIER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, Settling error, change test condition of acquisition time = 2.5 s to 3.0 s for device type 02, only. Update drawing boilerplate. 03-10-01 Raymond Monnin B Added footnote 1 to table II, under group C end-point electricals. Updated drawing

2、 paragraphs. -sld 11-11-28 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael

3、C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, SAMPLE AND HOLD, HIGH SPEED AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-22 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89940 SHEE

4、T 1 OF 10 DSCC FORM 2233 APR 97 5962-E049-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 S

5、cope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are

6、reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 89940 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Rad

7、iation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device t

8、ype Generic number Circuit function 01 AD346 Sample and hold, high speed amplifier 02 MN346 Sample and hold, high speed amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements o

9、f MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applica

10、tions. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible lim

11、ited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of

12、 that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manu

13、facturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 14 Dual-in-line Provided by IHSNot for

14、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Abs

15、olute maximum ratings. 1/ Positive supply voltage (+VCC) +18 V dc Negative supply voltage (-VCC) . -18 V dc Digital input voltage 0 to +7 V dc Analog input (overvoltage) 15 V dc Power dissipation (PD) 550 mW Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C T

16、hermal resistance, junction-to-case (JC) 15C/W Junction temperature (TJ) . +175C Thermal resistance, junction-to-ambient (JA) . 60C/W 1.4 Recommended operating conditions. Positive supply voltage range (+VCC) +14.55 V dc to +15.45 V dc Negative supply voltage range (-VCC) . -14.55 V dc to -15.45 V d

17、c Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these

18、 documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Compone

19、nt Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robb

20、ins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

21、 a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

22、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accorda

23、nce with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspect

24、ions herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical d

25、imensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.

26、3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the sub

27、groups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may a

28、lso be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed he

29、rein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon reque

30、st. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements

31、 of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance w

32、ith MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall appl

33、y: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall sp

34、ecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in t

35、able II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUM

36、BUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Digital input current Logic 1 IIHVIN = +5 V 2/ 1,2,3 All +20 A Dig

37、ital input current Logic 0 IILVIL = 0 V 2/ 1,2,3 All -360 A Input offset voltage VIOVIN= 10 V, TA= +25C 3/ 4 All -10 +10 V Offset voltage VOSVIN = 0 V 4/ 1 All -3 +3 mV 2,3 -20 +20 Gain error AE VIN = 10 V 1 All -0.02 +0.02 %FSR 2,3 -0.05 +0.05 Offset step (pedestal) OSVIN = 0 V, f = 10 kHz 4 All -4

38、 +4 mV 5,6 -20 +20 Droop rate TDR VIN = 0 V, f = 500 Hz 1 All -0.5 +0.5 V/s 2,3 -650 +650 Settling error AQT Acquisition time = 2.5 s, 20 V step 5/ 4,5,6 01 -0.01 +0.01 %FSR Acquisition time = 3.0 s, 20 V step 5/ 02 -0.01 +0.01 Settling time sample mode tS110 V step to 1 mV 5/ 4,5,6 All 2.0 s Sample

39、 to hold time tS210 V step to 1 mV 5/ 4,5,6 All 1.0 s Feedthrough (hold mode) FT CL 200 pF, TA= +25C 4 All 0.02 %FSR See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LA

40、ND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply rejection ratio +PSR

41、R +14.55 V +VCC +15.45 V VIN= 0 V 2/ 1 All -300 +300 V/V 2,3 -1 +1 mV/V -PSRR -14.55 V -VCC -15.45 V VIN= 0 V 2/ 1 All -300 +300 V/V 2,3 -1 +1 mV/V Supply currents +ICC +VCC= +15.45 V 1,2,3 01 +20 mA 02 +28 -ICC -VCC= -15.45 V 1,2,3 01 -10 mA 02 -25 1/ +VCC= +15 V and -VCC= -15 V. 2/ Subgroups 2 and

42、 3 shall be tested as part of device initial characterization and after design and process changes that may affect this parameter. Subgroups 2 and 3 shall be guaranteed to the limits specified in table I for all lots not specifically tested. 3/ Maximum output swing is 4 volts less than +VCC. 4/ Volt

43、age offset is externally adjustable to zero. 5/ Subgroups 5 and 6 shall be tested as part of device initial characterization and after design and process changes that affect this parameter. Subgroups 5 and 6 shall be guaranteed to the limits specified in table I for all lots not specifically tested.

44、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbol Inches Millimeters Note Min Max Min

45、 Max A 0.200 5.08 b 0.014 0.023 0.36 0.58 b10.030 0.070 0.76 1.78 c 0.008 0.015 0.20 0.38 D 0.805 20.45 E 0.480 0.505 12.19 12.83 E10.290 0.320 7.37 8.13 2 e 0.100 BSC 2.54 BSC 3,4 L 0.125 0.200 3.18 5.08 L1 0.180 4.57 Q 0.015 0.040 0.38 1.02 5 S 0.098 2.49 6 S1 0.005 0.13 6 NOTES: 1. Index area: a

46、notch or a lead one identification mark is located adjacent to lead one. 2. E1shall be measured at the centerline of the leads. 3. The basic pin spacing is 0.100 inches between centerlines. 4. Twelve spaces. 5. Dimension Q shall be measured from the seating plane to the base plane. 6. Applies to all

47、 four corners. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89940 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device types 01 a

48、nd 02 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Digital input No connection No connection Digital GND No connection Analog GND Offset adjust Analog output Offset adjust No connection +VCC(+15 V) Summing point Analog input -VCC(-15 V) FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,