DLA SMD-5962-90522 REV B-2002 MICROCIRCUIT LINEAR DUAL PERIPHERAL DRIVER MONOLITHIC SILICON《硅单片 双重外围驱动器 线性微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes made to IOH, VOL, tPHL, and tPLHtests in table I. Deleted VOHtest in table I. Added vendor CAGE 0DKS7. - rrp 02-02-01 R. MONNIN B Add case outline X. - ro 02-08-21 R. MONNIN REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B OF SHEE

2、TS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Rick C. Officer DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT

3、, LINEAR, DUAL PERIPHERAL DRIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-01-16 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90522 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E532-02 DISTRIBUTION STATEMENT A. Approved for public release; distributi

4、on is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing

5、describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90522 01 G X Drawing number Device type (see 1.2.1) Case outlin

6、e (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 DS1632 Dual NAND peripheral driver, CMOS compatible 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and

7、 as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) 16 V dc

8、Input voltage range (VIN) -0.3 V dc to VCC+ 0.3 V dc Output voltage 56 V dc Storage temperature range . -65C to +150C Maximum power dissipation: 1/ Case G 787 mW Cases P and X 1133 mW Lead temperature (soldering, 10 seconds) . +260C Junction temperature (TJ) . +175C Thermal resistance, junction-to-c

9、ase (JC) Cases G and P See MIL-STD-1835 Case X 90C/W 1.4 Recommended operating conditions. Case operating temperature range (TA) . -55C to +125C Operating supply voltage range (VCC) . 4.5 V dc to 15 V dc 1/ For cases P and X, derate 7.6 mW/C above TA= +25C; for case G, derate 5.2 mW/C above TA= +25C

10、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specifica

11、tion, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards

12、 (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electron

13、ic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order D

14、esk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regul

15、ations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified

16、 Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-3

17、8535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in a

18、ccordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be i

19、n accordance with 1.2.2 herein and figure 1 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table. The truth table shall be as specified on figure 3. 3.2.4 Test circuits and switching waveforms. The test circuits and switching waveforms shall be as

20、 specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking

21、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. 1/ Test Symbol Conditions -55C TA +125C unless otherwise spe

22、cified Group A subgroups Device type Limits Unit Min Max VCC= 5 V, see figure 4 3.5 VCC= 10 V, see figure 4 8.0 High-level input voltage VIHVCC= 15 V, see figure 4 1,2,3 01 12.5 V VCC= 5 V, see figure 4 1.5 VCC= 10 V, see figure 4 2.0 Low-level input voltage VILVCC= 15 V, see figure 4 1,2,3 01 2.5 V

23、 High-level output current IOHVIN= 2.5 V (all inputs), VCC= 15 V, VOUT= 54 V, see figure 4 1,2,3 01 250 A VIN= 3.5 V (all inputs), VCC= 4.5 V, IOL= 100 mA, see figure 4 1.1 Low-level output voltage VOLVIN= 3.5 V (all inputs), VCC= 4.5 V, IOL= 300 mA, see figure 4 1,2,3 01 1.4 V High level input curr

24、ent IIHVIN= 15 V, VCC= 15 V, other input of driver = 0.0 V, see figure 4 1,2,3 01 10 A VIN= 0.4 V, VCC= 15 V, other input of driver = 15 V, see figure 4 -360 Low level input current IILVIN= 0.4 V, VCC= 5 V, other input of driver = 5 V, see figure 4 1,2,3 01 -115.5 A Functional tests See 4.3.1c 7,8 0

25、1 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrica

26、l performance characteristics Continued. 1/ Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max VIN= 5 V (all inputs), VCC= 5 V, see figure 4 12 ICCLVIN= 15 V (all inputs), VCC= 15 V, see figure 4 23 VIN= 0 V (all inputs), VCC= 5 V, see f

27、igure 4 3.5 Power supply current ICCHVIN= 0 V (all inputs), VCC= 15 V, see figure 4 1,2,3 01 14 mA 9 0.01 1.20 tPHL10, 11 0.01 1.55 9 0.01 1.20 Propagation delay time tPLHVCC= 5 V, CL= 15 pF, VL= 10 V, RL= 50 or equivalent, see figure 4 10, 11 01 0.01 1.50 s 1/ Power dissipation must be externally c

28、ontrolled at elevated temperatures (TA= +25C and TA= +125C). 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-3853

29、5, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the opti

30、on of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance wi

31、th MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA p

32、rior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

33、 SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Case X FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522

34、DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case X Symbol Dimensions Inches Millimeters Min Max Min Max A .076 .094 1.93 2.39 b .016 .200 0.41 0.51 b2 - .054 - 1.37 c .009 .012 0.23 0.30 D .512 .528 13.0 13.41 E .282 .298 7.16 7.57 E1 .290

35、.310 7.37 7.87 e .100 REF 2.54 REF eA .300 REF 7.62 REF L - .175 - 4.44 Q .025 .045 0.64 1.14 S1 .095 .125 2.41 3.18 S2 .005 - 0.13 - N 8 8 Note 1 NOTE: 1. The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound u

36、nits of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

37、5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines G, P, and X Terminal number Terminal symbol 1 A1 2 B1 3 X1 4 GND 5 X2 6 A2 7 B2 8 VCCFIGURE 2. Terminal connections. Inputs Outputs A B X L L H H L H L H H

38、H H L H = High L = Low FIGURE 3. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 Test

39、 table Output Input under test Other input Apply Measure VIHVILVIHVCCIOLIOHVOLVOHVIH, VILtest FIGURE 4. Test circuits and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUP

40、PLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. The pulse generator has the following characteristics: PRR = 500 kHz, ZOUT= 50 . 2. CLincludes probe and jig capacitance. 3. IIHand IILtest, each input is tested separately. 4. ICCtest, both gates

41、 are tested simultaneously. FIGURE 4. Test circuits and switching waveforms Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90522 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION L

42、EVEL B SHEET 11 DSCC FORM 2234 APR 97 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in a

43、ccordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4.

44、QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance insp

45、ection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon

46、 request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, ex

47、cept interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional

48、 criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under docume