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本文(DLA SMD-5962-90545 REV A-2009 MICROCIRCUIT LINEAR HEX TRANSLATOR RECEIVER DRIVER MONOLITHIC SILICON.pdf)为本站会员(twoload295)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-90545 REV A-2009 MICROCIRCUIT LINEAR HEX TRANSLATOR RECEIVER DRIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw. Update drawing to current requirements. - drw 09-02-05 Robert M. Heber THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Dan W

2、onnell CHECKED BY Sandra Rooney DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Michael A. Frye STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-07-21 MICR

3、OCIRCUIT, LINEAR, HEX TRANSLATOR/RECEIVER/DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90545 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E137-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

4、WING SIZE A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1

5、.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90545 01 R A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number

6、 Circuit function 01 LTC1045 Programmable micropower hex translator/receiver/driver 1.2.2 Case outline. The case outline are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line 1.2.3 Lead finish. The lead fi

7、nish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage 2/ (V+, VOHto V-, VOL) 18 V Output high voltage (VOH) V+ Input voltage 18 V to V- -0.3 V Output short circuit duration (VOH VOL 10 V) Continuous ESD (MIL-STD-883, method 3015.1). 2000 V Storage tempera

8、ture range -65 to +150C Lead temperature (soldering, 10 seconds) 300C Thermal resistance, junction-to-ambient (JA) 70C/W Power dissipation (PD) . 90 mW 1.4 Recommended operating conditions. Operating ambient temperature range (TA) -55C to +125C Supply voltage . 5 V Trip voltage range (VTRIP). V- to

9、V+ -2 V _ 1/ Absolute maximum ratings are those values beyond which the life of the device may be impaired. 2/ The maximum differential voltage between any two power pins (V+, V-, VOH, and VOL) must not exceed 18 V. The maximum recommended operating differential is 15 V. Provided by IHSNot for Resal

10、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks

11、. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manu

12、facturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard

13、 Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of th

14、is drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in acco

15、rdance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-

16、38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications s

17、hall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The

18、design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performan

19、ce characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in tabl

20、e II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the enti

21、re SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The complianc

22、e indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90545 DE

23、FENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ V+ = VOH= 5 V, V- = VOL= 0 V -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max Input

24、 bias current IBV- VIN V+ 1, 2, 3 01 1.0 A V+ to V- supply current ICCDISABLE = V+, RSET= 10 k 1 01 3.5 mA 2, 3 5.0 V+ to V- supply current in shutdown IOFFDISABLE = ISET= V+ 1, 2, 3 01 5 A Voltage on ISET(pin 12) VREFRSET= 10 k 1, 2, 3 01 0.5 1.4 V TTL output high voltage VOHISOURCE= -360 A, V+ = 4

25、.5 V 1, 2, 3 01 2.4 V TTL output low voltage VOLISINK= 1.6 mA, V+ = 4.5 V 1, 2, 3 01 0.4 V Output short circuit sink current IOS(SINK)VIN= VTRIP 100 mV, VOUT= V+ 1 01 8.5 mA 2, 3 5.5 Output short circuit source current IOS(SOURCE)VIN= VTRIP+ 100 mV, VOUT= V- 1 01 4.5 mA 2, 3 3.2 Three-state leakage

26、current IOZDISABLE = V+, VOL VOUT VOH1, 2, 3 01 1.0 A Output resistance to VOHROH|IOUT| 100 A 1 01 400 2, 3 600 Output resistance to VOLROL|IOUT| 100 A 1 01 150 2, 3 250 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S

27、TANDARD MICROCIRCUIT DRAWING SIZE A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ V+ = VOH= 5 V, V- = VOL= 0 V -55C TA+125C Group A subgroupsDev

28、ice type Limits Unit unless otherwise specified Min Max ISETvoltage for shutdown VSET2/ 1, 2, 3 01 V+ -0.5 V DISABLE input logic level high VIHV+ = 4.5 V, V- = 0 V 2/ 1, 2, 3 01 2.0 V DISABLE input logic level low VILV+ = 5.5 V, V- = 0 V 2/ 1, 2, 3 01 0.8 V Input supply differential (V+ - V-) VID2/

29、1, 2, 3 01 4.5 15 V Output supply differential (VOH VOL) VOD2/ 1, 2, 3 01 3 15 V Response time tdRSET= 10 k, 100 mV drive 9 01 200 ns 10, 11 350 1/ During operation near the maximum supply voltage limit, care should be taken to avoid or suppress power supply turn-on and turn-off transients, power su

30、pply ripple, or ground noise; any of these conditions must not cause a supply differential to exceed the absolute maximum rating. 2/ These parameters are guaranteed by design, characterization, or correlation to other tested parameters. Provided by IHSNot for ResaleNo reproduction or networking perm

31、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outline R Terminal number Terminal symbol 1 VOH2 INPUT 1 3 INPUT 2 4 INPUT 3 5 INPUT 4 6 INPU

32、T 5 7 INPUT 6 8 VTRIP29 VTRIP110 V- 11 VOL12 ISET13 DISABLE 14 OUTPUT 6 15 OUTPUT 5 16 OUTPUT 4 17 OUTPUT 3 18 OUTPUT 2 19 OUTPUT 1 20 V+FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

33、E A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herei

34、n). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as require

35、d in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activ

36、ity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-

37、38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C. The tes

38、t circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spe

39、cified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirement

40、s. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1*, 2, 3 Final electrical test parameters (method 5004) 1*, 2, 3, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 9, 10, 11 Groups C and D end-poin

41、t electrical parameters (method 5005) 1, 9 * PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90545 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8

42、DSCC FORM 2234 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in tabl

43、e II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C.

44、The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the int

45、ent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended

46、 use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepa

47、red specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and

48、industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.6 Approved so

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