DLA SMD-5962-90562 REV B-2012 MICROCIRCUITS DIGITAL BIPOLAR ADVANCED SCHOTTKY 1 OF 16 DATA GENERATORS MULTIPLEXERS WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 05-03-04 Raymond Monnin B Update drawing as part of 5 year review. -jt 12-06-25 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. R

2、EV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGE

3、NCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Tim H. Noh APPROVED BY William K. Heckman MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY 1 OF 16 DATA GENERATORS/MULTIPLEXERS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 91-02-26 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 596

4、2-90562 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E339-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1.

5、SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90562 01 K X Drawing number Devic

6、e type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 54AS250 1 of 16 data generators/multiplexers with 3-state outputs 1.2.2 Case outline. The case outline are a

7、s designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 flat L GDIP3-T24 or CDIP4-T24 24 dual-in-line 3 CQCC1-N28 28 leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1

8、.3 Absolute maximum ratings. Supply voltage . +7.0 V dc Input voltage range -0.5 V dc minimum to +7.0 V dc maximum Storage temperature range . -65C to +150C Maximum power dissipation (PD) 1/ 275 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) . See MIL-S

9、TD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage (VCC) +4.5 V dc minimum to +5.5 V dc maximum Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc High level output current (IOH) -12 mA Low level output current (

10、IOL) 32 mA Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation is defined as VCCx ICC, and must withstand the added PDdue to short-circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC

11、IRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the ext

12、ent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Metho

13、d Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.mil/q

14、uicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

15、 document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Produ

16、ct built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and q

17、ualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as

18、described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and h

19、erein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test

20、circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test

21、 requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9

22、0562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packa

23、ges where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-385

24、35, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed

25、as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements

26、 herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change

27、that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option o

28、f the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteris

29、tics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V to 5.5 V, VIN= 2.0 V, 0.8 V IOH= -2.0 mA 1, 2, 3 All 2.5 V VCC= 4.5 V, VIN= 2.0 V, 0.8 V IOH= -12 mA 2.4 Low level output voltage VOLIOL= 32

30、 mA 1, 2, 3 All 0.5 V Input clamp voltage VI KVCC= 4.5 V IN= -18 mA 1, 2, 3 All -1.2 V Input current IIVCC= 5.5 V VIN= 7.0 V 1, 2, 3 All 100 A High level input current IIHVIN= 2.7 V 1, 2, 3 All 20 A Low level input current IILVIN= 0.4 V 1, 2, 3 All -500 A Output current 1/ IOSVOUT= 2.25 V 1, 2, 3 Al

31、l -30 -112 mA Off state output current with high level voltage IOZHVOUT= 2.7 V 1, 2, 3 All 50 A Off state output current with low level voltage IOZLVOUT= 0.4 V -50 Supply current ICCVCC= 5.5 V, Outputs high 1, 2, 3 All 42 mA VIN= 0.0 V, 4.5 V Outputs low 50 Outputs disabled 48 Functional tests See 4

32、.3.1c, VCC= 4.5 V to 5.5 V 7, 8 All Propagation delay time, DATA to W tPLH1VCC= 4.5 V and 5.5 V, 9, 10, 11 All 2.0 9.5 ns tPHL1 CL= 50 pF, 2.0 8.5 Propagation delay time, SELECT to W SELECT (A, B, C, D) to W tPLH2R1= 500, 9, 10, 11 All 4.0 15.5 ns tPHL2R2= 500, 4.0 12.0 Output enable time, G to W tP

33、ZHSee figure 3 9, 10, 11 All 2.0 7.5 ns tPZL2.0 10.0 Output disable time, G to W tPHZ9, 10, 11 All 1.5 6.5 ns tPLZ2.0 8.5 1/ The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS. Provided by IHSNot for ResaleNo r

34、eproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines K and L 3 Terminal number Terminal symbol Terminal symbol 1 E7

35、NC 2 E6 E7 3 E5 E6 4 E4 E5 5 E3 E4 6 E2 E3 7 E1 E2 8 E0 NC 9 G E1 10 W E0 11 D G 12 GND W 13 C D 14 B GND 15 A NC 16 E15 C 17 E14 B 18 E13 A 19 E12 E15 20 E11 E14 21 E10 E13 22 E9 NC 23 E8 E12 24 VCCE11 25 - - - E10 26 - - - E9 27 - - - E8 28 - - - VCCNC = No connection FIGURE 1. Terminal connection

36、s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Input Output G A B C D Ei W L L L L L E0 E0 L H L L L E1

37、 E1 L L H L L E2 E2 L H H L L E3 E3 L L L H L E4 E4 L H L H L E5 E5 L L H H L E6 E6 L H H H L E7 E7 L L L L H E8 E8 L H L L H E9 E9 L L H L H E10 E10 L H H L H E11 E11 L L L H H E12 E12 L H L H H E13 E13 L L H H H E14 E14 L H H H H E15 E15 H X X X X X Z H = High voltage level L = Low voltage level X

38、 = Irrelevant Z = High impedence FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 NOT

39、ES: 1. CL includes probe and jig capacitance. 2. When measuring propagation delay times of three-state outputs, switch S1 is open. 3. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal

40、 conditions such that the output is high except when disabled by the output control. 4. All input pulses have the following characteristics: PRR 1 MHz, tr= tf 2 ns, duty cycle = 50%. 5. The outputs are measured one at a time with one input transition per measurement. FIGURE 3. Test circuit and switc

41、hing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection

42、. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a

43、. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, b

44、iases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optiona

45、l at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10 11 Gr

46、oup A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups

47、A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table.

48、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90562 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test conditio